Capillary Instabilities in Thin, Polycrystalline Films

1985 ◽  
Vol 47 ◽  
Author(s):  
David J. Srolovitz ◽  
S. A. Safran
Keyword(s):  
Thin Films ◽  
Contact Angle ◽  
Grain Boundary ◽  
Film Thickness ◽  
Critical Size ◽  
Equilibrium Contact Angle ◽  
Polycrystalline Films ◽  
Capillary Instabilities ◽  
Thin Polycrystalline ◽  
Grain Boundary Grooves

ABSTRACTThin films can break up into islands only if they are perturbed by substrate-intersecting perturbations. Grain boundary grooves and vertex pits are typical defects which nucleate holes in these films. Holes which exceed a critical size - proportional to the ratio of the film thickness to the equilibrium contact angle - grow, eventually disconnecting the film.

Grain Boundary Curvature in Polycrystalline Metallic Thin Films

2000 ◽  
Vol 615 ◽  
Author(s):  
Alexander H. King ◽  
Rakesh Mangat ◽  
Kwame Owusu-Boahen
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Film Thickness ◽  
Sheet Thickness ◽  
Film Plane ◽  
Thickness Effect ◽  
Metallic Thin Films ◽  
Boundary Curvature ◽  
Grain Boundary Grooves

ABSTRACTWell-annealed thin films are typically observed to exhibit mean grain diameters that are approximately equal to the film thickness. The standard explanation of this “sheet thickness effect” is that it results from a balance of grain boundary curvature in two different directions which, in turn, results from pinning at grain boundary grooves. TEM experiments have been performed to assess this model, and it is found that the predicted curvature about axes in the film plane is absent. Alternate explanations of the sheet thickness effect are considered.

Modified Young's equation for equilibrium dihedral angles of grain boundary grooves in thin films at the nanoscale

2016 ◽  
Vol 102 ◽  
pp. 364-372 ◽  
Author(s):  
Shang-Chun Lin ◽  
Ming-Wei Liu ◽  
Mogadalai P. Gururajan ◽  
Kuo-An Wu
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Dihedral Angles ◽  
Grain Boundary Grooves ◽  
Young's Equation

Dependence on film thickness of grain boundary low-field magnetoresistance in thin films of La0.7Ca0.3MnO3

2001 ◽  
Vol 89 (11) ◽  
pp. 6970-6972 ◽  
Author(s):  
N. K. Todd ◽  
N. D. Mathur ◽  
M. G. Blamire
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Film Thickness ◽  
Low Field

scholarly journals Empirical Results Establishing the Thermal Independence of the Grain-Boundary Reflection Coefficient

1981 ◽  
Vol 7 (4) ◽  
pp. 217-220 ◽  
Author(s):  
C. R. Pichard ◽  
A. J. Tosser ◽  
C. R. Tellier
Keyword(s):  
Reflection Coefficient ◽  
Grain Boundary ◽  
Electronic Conduction ◽  
Polycrystalline Films ◽  
Empirical Results ◽  
Asymptotic Expressions ◽  
Thin Polycrystalline

Starting from the effective Fuchs–Sondheimer model of electronic conduction in thin polycrystalline films and implementing the asymptotic expressions of conductivity it is shown that the hypothesis of temperature independence of the grain boundary reflection coefficient agrees with previously published results.

Thermal Grooving in Single versus Multilayer Thin Films

2004 ◽  
Vol 854 ◽  
Author(s):  
Peter M. Anderson ◽  
Jue Wang ◽  
Sridhar Narayanaswamy
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Grain Boundary ◽  
Multilayer Thin Films ◽  
Multilayer Thin Film ◽  
Penetration Distance ◽  
Grain Boundary Grooves ◽  
Single Versus

ABSTRACTA 2D analytic result is presented for the penetration distance P of grain boundary grooves as a function of time t during heating and straining of polycrystalline multilayer thin films with immiscible phases. These grooves can ultimately pinch off individual layers. The result shows that P ∼ t0.25 initially and P ∼ t at longer time. This new analysis contrasts single- versus multilayer thin film response.

Contact Angle of Water on Polystyrene Thin Films:  Effects of CO2Environment and Film Thickness

Langmuir ◽  
2007 ◽  
Vol 23 (19) ◽  
pp. 9785-9793 ◽  
Author(s):  
Yuan Li ◽  
Joseph Q. Pham ◽  
Keith P. Johnston ◽  
Peter F. Green
Keyword(s):  
Thin Films ◽  
Contact Angle ◽  
Film Thickness

The Geometry of Grain Disappearance in Thin Polycrystalline Films

1994 ◽  
Vol 343 ◽  
Author(s):  
S. J. Townsend ◽  
C. S. Nichols
Keyword(s):  
Thin Film ◽  
Film Thickness ◽  
Grain Boundaries ◽  
Grain Growth ◽  
Polycrystalline Films ◽  
Surface Drag ◽  
Columnar Grains ◽  
Simulation Results ◽  
Thin Polycrystalline

ABSTRACTDuring grain growth, shrinking columnar grains in thin-film polycrystalline microstructures eventually reach sizes comparable to the film thickness. Due to surface drag, the sides of such grains may bow inward rather than remaining fiat through the bulk of the film. The grain boundaries delimiting such small shrinking grains may become unstable long before the surface of the shrinking grain reaches zero area. We report simulation results demonstrating such an instability in the limit of infinite surface drag. This may lead to extremely rapid disappearance of 4- or 5- sided grains, such as have been recently observed in in situ hot-stage TEM experiments on aluminum thin film polycrystals.

scholarly journals Temperature Dependencies of Electrical Properties of Thin Films Based on PbSnAgTe Solid Solutions

2020 ◽  
Vol 21 (4) ◽  
pp. 640-644
Author(s):  
R.O. Dzumedzey ◽  
Ya.P. Saliy ◽  
I.V. Horichok
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
High Temperatures ◽  
Solid Solutions ◽  
Charge Carriers ◽  
Polycrystalline Films ◽  
Acoustic Phonons ◽  
Scattering Mechanisms ◽  
Mobility Of Charge Carriers ◽  
Thin Polycrystalline

The electrical properties of thin polycrystalline films of solid solutions Pb18Ag2Te20, Pb16Sn2Ag2Te20, and Pb14Sn4Ag2Te20 (LATT) on mica-muscovite substrates have been investigated. The temperature dependencies of concentration and mobility of charge carriers for these condensates are researched. Predominant scattering mechanisms are established. These are scattering on ionized impurities and acoustic phonons at low and high temperatures respectively.

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