scholarly journals Empirical Results Establishing the Thermal Independence of the Grain-Boundary Reflection Coefficient

1981 ◽  
Vol 7 (4) ◽  
pp. 217-220 ◽  
Author(s):  
C. R. Pichard ◽  
A. J. Tosser ◽  
C. R. Tellier
Keyword(s):  
Reflection Coefficient ◽  
Grain Boundary ◽  
Electronic Conduction ◽  
Polycrystalline Films ◽  
Empirical Results ◽  
Asymptotic Expressions ◽  
Thin Polycrystalline

Starting from the effective Fuchs–Sondheimer model of electronic conduction in thin polycrystalline films and implementing the asymptotic expressions of conductivity it is shown that the hypothesis of temperature independence of the grain boundary reflection coefficient agrees with previously published results.

Capillary Instabilities in Thin, Polycrystalline Films

1985 ◽  
Vol 47 ◽  
Author(s):  
David J. Srolovitz ◽  
S. A. Safran
Keyword(s):  
Thin Films ◽  
Contact Angle ◽  
Grain Boundary ◽  
Film Thickness ◽  
Critical Size ◽  
Equilibrium Contact Angle ◽  
Polycrystalline Films ◽  
Capillary Instabilities ◽  
Thin Polycrystalline ◽  
Grain Boundary Grooves

ABSTRACTThin films can break up into islands only if they are perturbed by substrate-intersecting perturbations. Grain boundary grooves and vertex pits are typical defects which nucleate holes in these films. Holes which exceed a critical size - proportional to the ratio of the film thickness to the equilibrium contact angle - grow, eventually disconnecting the film.

Structural features of Sm1–x Eu x S thin polycrystalline films

2017 ◽  
Vol 51 (6) ◽  
pp. 828-830 ◽  
Author(s):  
V. V. Kaminskii ◽  
S. M. Solov’ev ◽  
G. D. Khavrov ◽  
N. V. Sharenkova ◽  
Shinji Hirai
Keyword(s):  
Structural Features ◽  
Polycrystalline Films ◽  
Thin Polycrystalline

scholarly journals A New Analytical Expression for the T.C.R. of Thin Monocrystalline Metal Films

1979 ◽  
Vol 5 (4) ◽  
pp. 209-213 ◽  
Author(s):  
C. R. Tellier
Keyword(s):  
Electrical Conductivity ◽  
Relaxation Time ◽  
Reflection Coefficient ◽  
Grain Boundary ◽  
Metal Film ◽  
Approximate Equation ◽  
Metal Films ◽  
Exact Equation ◽  
Temperature Coefficient Of Resistivity ◽  
Comparison Of The Results

The analysis of electrical conductivity of continuous thin monocrystalline metal film has been treated by assuming that the scattering from other sources than grain-boundaries can be described by an effective relaxation time. This relaxation time method is applied to the temperature coefficient of resistivity and leads to an analytical approximate equation in terms of the grain-boundary reflection coefficientrand the reduced thicknessk.Comparison of the results with those deduced from the exact equation (derived from the Mayadas and Shatzkes theory) shows that they deviate by less than 5% in largek–,p–, andr– ranges.

Engineering Mixed Ionic Electronic Conduction in La0.8Sr0.2MnO3+δNanostructures through Fast Grain Boundary Oxygen Diffusivity

2015 ◽  
Vol 5 (11) ◽  
pp. 1500377 ◽  
Author(s):  
Aruppukottai M. Saranya ◽  
Dolors Pla ◽  
Alex Morata ◽  
Andrea Cavallaro ◽  
Jesús Canales-Vázquez ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Electronic Conduction ◽  
Oxygen Diffusivity
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