Characterization of Pzt Films by Scanning Force Microscopy (SFM)

1996 ◽  
Vol 433 ◽  
Author(s):  
Genaro Zavala ◽  
Susan E. Trolier-McKinstry ◽  
Janos H. Fendler
Keyword(s):  
Dielectric Constant ◽  
Lead Zirconate Titanate ◽  
Second Harmonic ◽  
Polarization State ◽  
Scanning Force Microscopy ◽  
Signal Frequency ◽  
Contact Mode ◽  
Force Microscopy ◽  
Pzt Films ◽  
Scanning Force

AbstractScanning Force Microscopy (SFM) has been used for the determination of friction, phase transformation, piezoelectric behavior (contact mode), polarization state and dielectric constant (non contact mode) in several nanometer regions of Lead Zirconate Titanate (PZT) films. The use of the SFM tip, in the contact mode, to polarize different nanoregions of the film and to apply an oscillating field thereon, led to effective piezoelectric coefficients and piezoelectric loops. In the non-contact mode, application of an ac signal (frequency ω) to the tip-electrode system produced an oscillation of the tip at ω (fundamental or first harmonic) and 2ω (second harmonic). The signals ω and 2ω were related to the state of polarization and the dielectric constant of the film. Analysis of the combined contact, non-contact and friction force microscopic data have provided considerable insight into the piezoelectricity and polarization in the nanodomains.

Scanning Force Microscopy Study of Ultrathin Films of Nickel-Phthalocyanine on Graphite

1998 ◽  
Vol 05 (01) ◽  
pp. 433-436 ◽  
Author(s):  
S. Santucci ◽  
S. Di Nardo ◽  
L. Lozzi ◽  
L. Ottaviano ◽  
M. Passacantando ◽  
...  
Keyword(s):  
Pyrolytic Graphite ◽  
Scanning Force Microscopy ◽  
Microscopy Study ◽  
Ex Situ ◽  
Contact Mode ◽  
Force Microscopy ◽  
Nickel Phthalocyanine ◽  
Atomic Force ◽  
Scanning Force

Small amounts of purified nickel-phthalocyanine (Ni-PC) have been deposited at room temperature in ultrahigh vacuum onto highly oriented pyrolytic graphite, and studied "in situ" and "ex situ" (in air) with two different atomic force microscopes. The measurements have been taken on samples as prepared either subsequently annealed at 300°C. The growth mode is not uniform; the PC molecules coalesce into small submicrometric crystallites in the critical size range where the transition from the α to the β crystalline phase of phthalocyanines takes place. We show images of both α-like and β-like crystallites. A contact mode AFM image of an α-like crystallite showing intramolecular resolution is also presented.

Local Electromechanical Properties and Grain Size Effects in Ferroelectric Relaxors Studied by Scanning Piezoelectric Microscopy

2002 ◽  
Vol 748 ◽  
Author(s):  
A. L. Kholkin ◽  
V. V. Shvartsman ◽  
M. Woitas ◽  
A. Safari
Keyword(s):  
Grain Size ◽  
Hysteresis Loops ◽  
Scanning Force Microscopy ◽  
Bias Field ◽  
Electromechanical Properties ◽  
Contact Mode ◽  
Force Microscopy ◽  
Ferroelectric Relaxors ◽  
Scanning Force ◽  
Pt Films

ABSTRACTThe local electromechanical properties of relaxor 0.9Pb(Mg1/3Nb2/3)O3-0.1PbTiO3 (PMN-PT) films are investigated by Scanning Force Microscopy (SFM) in a piezoelectric contact mode. The domain contrast is observed only in some grains (∼20 % of the entire surface), which showed clear ferroelectric behavior. Thus on the microscopic level the material behaves as a composite with ferroelectric regions embedded in the non-polar matrix. This was attributed to the relaxor-to-ferroelectric phase transition induced by the internal bias field. The local hysteresis loops are found to depend on the size of the grains. A distinct correlation between the values of the effective piezoelectric coefficients, deffi and the size of the respective grains is observed. Small grains exhibit slim piezoelectric hysteresis loops with low remanent deff while relatively strong piezoelectric activity is characteristic of larger grains. In addition, large grains exhibit longer relaxation time after poling with an effective time constant increasing with the grain size. The nature of size effect is discussed taking in terms of dynamics of nanopolar clusters and SFM instrumentation.

Ferroelectric domains in coarse-grained lead zirconate titanate ceramics characterized by scanning force microscopy

2003 ◽  
Vol 18 (8) ◽  
pp. 1777-1786 ◽  
Author(s):  
J. Muñoz-Saldaña ◽  
M. J. Hoffmann ◽  
G. A. Schneider
Keyword(s):  
Lead Zirconate Titanate ◽  
Domain Walls ◽  
Scanning Force Microscopy ◽  
Lead Zirconate ◽  
Piezoelectric Response ◽  
Pzt Ceramics ◽  
Force Microscopy ◽  
Zirconate Titanate ◽  
Domain Configuration ◽  
Scanning Force

Ferroelectric domain configurations in silver- and lanthanum-doped lead zirconate titanate (PZT) ceramics were characterized by scanning force microscopy using contact as well as piezoelectric response force [i.e., piezoelectric force microscopy (PFM)] modes. Coarse crystallites of hard and soft PZT ceramics (12 μm in Ag-PZT and 30 μm in La-PZT average grain size, respectively) with surface oriented in the {001} planes were chosen to characterize the domain configuration. Results show the conventional right-angled domain structures, which correspond to the {110} twin-related 90° and 180° domains of homogeneous width from 50 to 150 nm. The ability of PFM to image the orientation of pure in-plane arrays of domains (containing 90°-aa- and 180°-aa-types of domain boundaries) is highlighted, and a more detailed notation for in-plane domains is proposed. In addition to such periodical domain arrays, other ordered domains were found, having a misfit of 26° with respect to the{110} domain walls and the {100} surface. This array of domain walls could not be predicted with a geometrical analysis of the intersection of domain walls at the surface according to the conventional spatial array of {110} crystallographic planes. It could be explained only with {210} planes being the domain walls. The reason for this unconventional domain configuration is explained with the clamped conditions of the investigated crystallites in the polycrystalline material.

Modification and detection of domains on ferroelectric PZT films by scanning force microscopy

1994 ◽  
Vol 302 (1-2) ◽  
pp. L283-L288 ◽  
Author(s):  
K. Franke ◽  
J. Besold ◽  
W. Haessler ◽  
C. Seegebarth
Keyword(s):  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Pzt Films ◽  
Scanning Force
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