scholarly journals Off-resonance intermittent contact mode multi-harmonic scanning force microscopy

2018 ◽  
Vol 113 (2) ◽  
pp. 023103 ◽  
Author(s):  
M. Penedo ◽  
H. J. Hug
Keyword(s):  
Scanning Force Microscopy ◽  
Contact Mode ◽  
Force Microscopy ◽  
Scanning Force ◽  
Intermittent Contact

scholarly journals Imaging Mechanisms in Dynamic Force Microscopy of Polymers

1999 ◽  
Vol 7 (5) ◽  
pp. 8-10
Author(s):  
Greg D. Haugstad
Keyword(s):  
Polymer Surface ◽  
Sample Pretreatment ◽  
Scanning Force Microscopy ◽  
Soft Materials ◽  
Dynamic Force ◽  
Force Microscopy ◽  
Mode Of Operation ◽  
Scanning Force ◽  
Intermittent Contact ◽  
Imaging Mechanisms

Applications of scanning force microscopy (SFM) in polymer studies have flourished in this decade, reflecting (a) sensitivity to both structure and properties on the nanometer scale, and (b) ease of operation in ambient environments without sample pretreatment. One drawback in SFM of soft materials has been damage incurred during the imaging process. The problem was alleviated by the development of dynamic force microscopy (DFM) in which the probe spends little or no time in contact with the polymer surface and shear forces are minimized. This mode of operation has been dubbed "tapping", "intermittent contact", "non-contact", "near-contact", etc. As studies proliferated, it became apparent that different researchers were using different terms to refer to the same apparent imaging mechanism, or the same term to refer to different imaging mechanisms.

Intermittent contact scanning force microscopy: The role of the liquid necks

1998 ◽  
Vol 72 (26) ◽  
pp. 3461-3463 ◽  
Author(s):  
M. Luna ◽  
J. Colchero ◽  
A. M. Baró
Keyword(s):  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Intermittent Contact

Scanning Force Microscopy Study of Ultrathin Films of Nickel-Phthalocyanine on Graphite

1998 ◽  
Vol 05 (01) ◽  
pp. 433-436 ◽  
Author(s):  
S. Santucci ◽  
S. Di Nardo ◽  
L. Lozzi ◽  
L. Ottaviano ◽  
M. Passacantando ◽  
...  
Keyword(s):  
Pyrolytic Graphite ◽  
Scanning Force Microscopy ◽  
Microscopy Study ◽  
Ex Situ ◽  
Contact Mode ◽  
Force Microscopy ◽  
Nickel Phthalocyanine ◽  
Atomic Force ◽  
Scanning Force

Small amounts of purified nickel-phthalocyanine (Ni-PC) have been deposited at room temperature in ultrahigh vacuum onto highly oriented pyrolytic graphite, and studied "in situ" and "ex situ" (in air) with two different atomic force microscopes. The measurements have been taken on samples as prepared either subsequently annealed at 300°C. The growth mode is not uniform; the PC molecules coalesce into small submicrometric crystallites in the critical size range where the transition from the α to the β crystalline phase of phthalocyanines takes place. We show images of both α-like and β-like crystallites. A contact mode AFM image of an α-like crystallite showing intramolecular resolution is also presented.

Local Electromechanical Properties and Grain Size Effects in Ferroelectric Relaxors Studied by Scanning Piezoelectric Microscopy

2002 ◽  
Vol 748 ◽  
Author(s):  
A. L. Kholkin ◽  
V. V. Shvartsman ◽  
M. Woitas ◽  
A. Safari
Keyword(s):  
Grain Size ◽  
Hysteresis Loops ◽  
Scanning Force Microscopy ◽  
Bias Field ◽  
Electromechanical Properties ◽  
Contact Mode ◽  
Force Microscopy ◽  
Ferroelectric Relaxors ◽  
Scanning Force ◽  
Pt Films

ABSTRACTThe local electromechanical properties of relaxor 0.9Pb(Mg1/3Nb2/3)O3-0.1PbTiO3 (PMN-PT) films are investigated by Scanning Force Microscopy (SFM) in a piezoelectric contact mode. The domain contrast is observed only in some grains (∼20 % of the entire surface), which showed clear ferroelectric behavior. Thus on the microscopic level the material behaves as a composite with ferroelectric regions embedded in the non-polar matrix. This was attributed to the relaxor-to-ferroelectric phase transition induced by the internal bias field. The local hysteresis loops are found to depend on the size of the grains. A distinct correlation between the values of the effective piezoelectric coefficients, deffi and the size of the respective grains is observed. Small grains exhibit slim piezoelectric hysteresis loops with low remanent deff while relatively strong piezoelectric activity is characteristic of larger grains. In addition, large grains exhibit longer relaxation time after poling with an effective time constant increasing with the grain size. The nature of size effect is discussed taking in terms of dynamics of nanopolar clusters and SFM instrumentation.

Characterization of Pzt Films by Scanning Force Microscopy (SFM)

1996 ◽  
Vol 433 ◽  
Author(s):  
Genaro Zavala ◽  
Susan E. Trolier-McKinstry ◽  
Janos H. Fendler
Keyword(s):  
Dielectric Constant ◽  
Lead Zirconate Titanate ◽  
Second Harmonic ◽  
Polarization State ◽  
Scanning Force Microscopy ◽  
Signal Frequency ◽  
Contact Mode ◽  
Force Microscopy ◽  
Pzt Films ◽  
Scanning Force

AbstractScanning Force Microscopy (SFM) has been used for the determination of friction, phase transformation, piezoelectric behavior (contact mode), polarization state and dielectric constant (non contact mode) in several nanometer regions of Lead Zirconate Titanate (PZT) films. The use of the SFM tip, in the contact mode, to polarize different nanoregions of the film and to apply an oscillating field thereon, led to effective piezoelectric coefficients and piezoelectric loops. In the non-contact mode, application of an ac signal (frequency ω) to the tip-electrode system produced an oscillation of the tip at ω (fundamental or first harmonic) and 2ω (second harmonic). The signals ω and 2ω were related to the state of polarization and the dielectric constant of the film. Analysis of the combined contact, non-contact and friction force microscopic data have provided considerable insight into the piezoelectricity and polarization in the nanodomains.

Imaging Mechanisms in Dynamic Force Microscopy of Polymers

1999 ◽  
Vol 5 (S2) ◽  
pp. 990-991
Author(s):  
Greg D. Haugstad ◽  
Jon A. Hammerschmidt ◽  
Wayne L. Gladfelter
Keyword(s):  
Low Cost ◽  
Polymer Surface ◽  
Scanning Force Microscopy ◽  
Soft Materials ◽  
Sample Surface ◽  
Dynamic Force ◽  
Force Microscopy ◽  
Scanning Force ◽  
Intermittent Contact ◽  
Imaging Mechanisms

Applications of scanning force microscopy (SFM) in polymer studies have flourished in this decade, reflecting (a) the power of SFM to image both structure and propertiesdown to the nanometer scale, and (b) the low cost and ease of getting useful results in ambient environments. One difficulty in SFM of polymers has been damage incurred by soft materials during the imaging process. The problem was alleviated by the development of special dynamic modes of operation, in which the probe spends little or no time in contact with the polymer surface. Such modes were dubbed “tapping”, “intermittent-contact”, “non-contact”, “near-contact”, etc. As studies proliferated, it became apparent that different researchers were using different terms to refer to the same apparent imaging mechanism, or the same term to refer to different imaging mechanisms. This quandary derived from a poor understanding of exactly how the SFM probe interacts with the sample surface.1-3,5

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