A Study of Free- and Bound-Exciton Recombination in Device Quality Diamond
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ABSTRACTA cathodoluminescence (CL) study of free- and bound-exciton recombination in high purity high pressure high temperature (HPHT) synthetic diamond is presented, including temperature dependence measurements of the free-exciton intensity and luminescence decaytime. The results are compared with those from device quality diamond produced using the chemical vapour deposition (CVD) process.
2014 ◽
Vol 70
(a1)
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pp. C751-C751
2006 ◽
Vol 61
(12)
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pp. 1541-1546
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2013 ◽
Vol 797
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pp. 495-499
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2017 ◽
Vol 75
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pp. 131-139
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