Interfacial Defect Control for Infrared Conversion Widening of Silicon Single-Crystal Solar Cells

1995 ◽  
Vol 405 ◽  
Author(s):  
Z. T. Kuznicki

AbstractA multi-interface solar cell design exploiting the parts of solar spectrum heretofore never converted by single-crystal silicon devices seems to be possible with local material modifications combined with a superimposition of hetero-interface transition zones. Possible structural modifications by implantation of a silicon single-crystal target causes a series of “secondary” effects of basic importance from the photovoltaic conversion point of view. The 1800 nm divacancy infrared band activity has revealed totally unknown behavior in the built-in strain field of the inserted α-Si/c-Si hetero-interface. First, even an annealing temperature of 770 K is not enough to quench the divacancy absorption. Next, the elimination of useful band-tail and useless divacancy activities is not coincident, i.e. divacancy absorption can be quenched without too much reduction of the band-tail activity. A relatively important infrared current could be observed experimentally up to 2500 nm and by extrapolation up to about 3500 nm.

1989 ◽  
Vol 158 ◽  
Author(s):  
Gary B. Bronner

ABSTRACTIn silicon microelectronics, memory cells and chips are used to develop the most advanced technology. In the future these chips will require three dimensional structures to achieve the needed density. This paper describes the use of selective silicon epitaxy to build truly three dimensional DRAM cells. The cell consists of a trench capacitor which is overgrown with single crystal silicon. A transistor and isolation are then built above the trench capacitor resulting in a cell that occupies the same area as the transistor alone. Fully functional memory cells have been built. The results show that selective silicon epitaxy is a realistic candidate for building three dimensional silicon devices.


2014 ◽  
Vol 115 (12) ◽  
pp. 124508 ◽  
Author(s):  
K. Rostem ◽  
D. T. Chuss ◽  
F. A. Colazo ◽  
E. J. Crowe ◽  
K. L. Denis ◽  
...  

Author(s):  
М.У. Каланов ◽  
А.В. Хугаев

Thermal oxidation of a silicon single crystal in the temperature range of 293 – 1293 K was studied using high – temperature X – ray diffraction directly on the beam. An anomaly in the intensity and angular position of diffuse scattering from the surface of the single crystal was found. The anomaly is explained by the oxidation of the silicon surface according to the Dill Grove model, including the process of thermal oxidation and sublimation of the oxide layer depending on temperature. It was found that in the bulk of a single crystal (silicon medium) in this temperature range, there is a - b phase transition in the crystalline phase of silicon dioxide, similar to the a - b transition of quartz in the atmosphere.


Author(s):  
N. Lewis ◽  
E. L. Hall ◽  
A. Mogro-Campero ◽  
R. P. Love

The formation of buried oxide structures in single crystal silicon by high-dose oxygen ion implantation has received considerable attention recently for applications in advanced electronic device fabrication. This process is performed in a vacuum, and under the proper implantation conditions results in a silicon-on-insulator (SOI) structure with a top single crystal silicon layer on an amorphous silicon dioxide layer. The top Si layer has the same orientation as the silicon substrate. The quality of the outermost portion of the Si top layer is important in device fabrication since it either can be used directly to build devices, or epitaxial Si may be grown on this layer. Therefore, careful characterization of the results of the ion implantation process is essential.


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