GMR and Structure in Sputtered Co90Fe10/Ag Multilayers

1995 ◽  
Vol 403 ◽  
Author(s):  
J. D. Jarratt ◽  
J. A. Barnard
Keyword(s):  
Magnetic Properties ◽  
Multilayer Structure ◽  
Giant Magnetoresistance ◽  
Multilayer Films ◽  
X Ray Diffraction ◽  
Individual Layer ◽  
X Ray ◽  
The Individual

AbstractGiant magnetoresistance (GMR), structure, and magnetic properties of sputtered (Co90Fe10 X Å/Ag Y Å) multilayer films have been investigated. Distinct GMR behaviors including granulartype (GGMR) and ‘discontinuous’ (DGMR) are observed which are strongly dependent on the individual CoFe and Ag layer thicknesses; however, standard multilayer GMR and the associated antiferromagnetic (AFM) coupling is absent. The multilayer structure, individual layer thicknesses, and growth texture were investigated using high and low angle x-ray diffraction (HXRD & LXRD).

Self-Assembly of Inorganic/Organic Multilayer Films

1994 ◽  
Vol 351 ◽  
Author(s):  
Astrid C. Zeppenfeld ◽  
Catherine J. Page
Keyword(s):  
Self Assembly ◽  
Grazing Angle ◽  
Multilayer Films ◽  
Silicon Wafers ◽  
Initial Surface ◽  
X Ray Diffraction ◽  
Individual Layer ◽  
X Ray ◽  
Influence Of Substrate ◽  
The Individual

ABSTRACTIn order to investigate the influence of substrate functionalization on the subsequent selfassembly of multilayer films, multilayers composed of alternating hafnium and 1,10-decanediylbis(phosphonic) acid (DBPA) have been grown on three different substrates. Substrates studied include gold wafers functionalized with 4-mercaptobutylphosphonic acid, silicon wafers functionalized using a hafnium oxychloride solution, and silicon wafers coated with an octadecylphosphonate LB-template layer. The nature of these films is probed using ellipsometry and grazing angle x-ray diffraction. These studies indicate that the overall order and the individual layer thickness can vary substantially from sample to sample and depend strongly on the initial surface functionalization prior to multilayer growth.

Stress in Sputtered Co90Fe10/Ag GMR Multilayers

1996 ◽  
Vol 436 ◽  
Author(s):  
J. D. Jarratt ◽  
V. R. Inturi ◽  
J. L. Weston ◽  
J. A. Barnard
Keyword(s):  
Giant Magnetoresistance ◽  
Room Temperature ◽  
Multilayer Films ◽  
Antiferromagnetic Coupling ◽  
High Temperature Annealing ◽  
X Ray Diffraction ◽  
Hexagonal Symmetry ◽  
Individual Layer ◽  
X Ray ◽  
The Difference

AbstractStress, giant magnetoresistance (GMR), structure, and magnetic properties of sputtered (Co90Fe10X Å/Ag Y Å)×20 multilayer films have been investigated at room temperature where X ranges from 7.5 to 25 Å and Y from 10 to 60 Å. These films exhibit distinct GMR behaviors dependent on individual layer thicknesses, including layered granular-type GMR in CoFe 7.5 Å samples and ‘discontinuous’ GMR (DGMR) in CoFe 15 and 25 Å samples with Ag thicknesses over 30 Å. No antiferromagnetic coupling was observed. CoFe 10 Å samples act as a transition between GMR behaviors. Compressive stress decreases with increasing Ag thickness in the CoFe 7.5 Å samples. In the CoFe 15 and 25 Å samples the stress fluctuates similarly depending on Ag thickness. The difference in stress and MR behavior between the CoFe 7.5 Å and the 15 and 25 Å samples is thought to be due to incomplete CoFe layering in the CoFe 7.5 Å samples. In the CoFe 15 Å DGMR samples, high temperature annealing resulted in tensile stresses large enough to cause film detachment. X-ray diffraction reveals a strong (111) growth texture as well as satellite peaks from coherent layering. This (111) texture is also evidenced by patterns with hexagonal symmetry formed by the detached films.

Thermal Evolution of Magnetic Properties and Crystal Structure in Compositionally Modulated Al/Ni Thin Films

1991 ◽  
Vol 232 ◽  
Author(s):  
A. Waknis ◽  
E. Haftek ◽  
M. Tan ◽  
J. A. Barnard ◽  
E. Tsang
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Magnetic Properties ◽  
Thermal Evolution ◽  
Dead Layer ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Individual ◽  
Deposited Films

ABSTRACTPeriodic multilayer thin films of the form (xAl/yNi)n were grown by alternate deposition of pure Al and Ni using dc-magnetron sputtering. The thicknesses of the individual Al and Ni layers are given by x and y, respectively, and the total number of bilayer units is n. For this set of experiments, x was fixed at 3.5 nm while y was systematically varied from 2.4 to 154 nm. The films were tested in as-deposited and annealed states for magnetic properties using a vibrating sample magnetometer and for crystal structure by x-ray diffraction. In both the as-deposited and annealed samples the magnetization per unit volume of Ni declined as the Ni layer thickness decreased. This result can be interpreted in terms of a magnetically ‘dead’ layer at the Al/Ni interfaces. The width of the dead layer increased from 2.9 nm to 5.8 nm on annealing. Magnetic properties were correlated with crystal structure experiments by x-ray diffraction. As-deposited films yielded a Ni(111) texture. The Ni (111) peak decreased in intensity and broadened as the Ni thickness declined. Annealing produced evidence for the growth of the intermetallic NiAl3.

Microstructure and magnetic properties of NdFeB/Mo multilayered films prepared by magnetron sputtering

2016 ◽  
Vol 30 (08) ◽  
pp. 1650126
Author(s):  
Yudong Fu ◽  
Feng Yan ◽  
Xiaoshuo Zhu ◽  
Xiaoxue Feng ◽  
Zaizai Guo
Keyword(s):  
Magnetic Properties ◽  
Magnetron Sputtering ◽  
Cross Section ◽  
Multilayer Structure ◽  
Remanent Magnetization ◽  
X Ray Diffraction ◽  
Multilayered Films ◽  
X Ray ◽  
Diffraction Patterns ◽  
Microstructure And Magnetic Properties

The paper was presented to study the microstructure and magnetic properties of Mo/[NdFeB/Mo] × 10/Mo multilayered films prepared by magnetron sputtering on Si(100) substrate. The SEM observation of microstructure showed that the specimen had fine multilayer structure and the NdFeB layers were successfully separated by Mo layers on the cross-section. The interface between the NdFeB and Mo layer disappeared after annealing. X-ray diffraction patterns of the annealed films revealed that there are a large amount of Nd2Fe[Formula: see text]B phases. The thickness of Mo layer had obvious effects on magnetic properties of the samples. When it reached 21 nm, the number and the intensity of NdFeB phase increase, and the remanent magnetization ratio Mr/Ms suddenly rise. The influences of annealing on surface morphology and microstructure of NdFeB thin films were also studied.

scholarly journals Studies on Structural and Magnetic Properties in Co/Sm Multilayers

2012 ◽  
Vol 13 (1) ◽  
pp. 13
Author(s):  
Erwin Erwin
Keyword(s):  
Magnetic Properties ◽  
Multilayer Films ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
X Ray ◽  
Crystalline Anisotropy ◽  
Structural And Magnetic Properties ◽  
Sharp Interfaces ◽  
Magneto Crystalline Anisotropy

Co/Sm multilayer films with structure of 20 [Co (x nm)/Sm (1.2 nm)] where x = 1.1, 2.2 and 4.2 nm and 20[Co (4.2nm)/Sm (x nm)] where x=1.2 nm to 7.5 nm were fabricated using dc magnetron sputtering. Each multilayer filmconsisted of 20 bilayers of Co layers with various thicknesses sandwiched with Sm layers. The application of lowangle X-ray diffraction measurements to the characterization of these multilayers is described. The periodiclayered structure with sharp interfaces was observed for all multilayer films. The measured magnetization valuesare lower than the values calculated in terms of the nominal concentration of cobalt in the multilayers. This impliessignificant “mixing” at small film thickness. The formation of a high magneto crystalline anisotropy of CoSm alloyat the interfaces, as a result of interdiffusion between Co and Sm layers was considered to be responsible for theincrease of the coercivity for Co/Sm multilayer.

Structure and Magnetic Properties of FE/ZR Multilayer Films

1993 ◽  
Vol 313 ◽  
Author(s):  
Toyohiko J. Konno ◽  
Takenori Nakayama ◽  
Bruce M. Clemens ◽  
Robert Sinclair
Keyword(s):  
Magnetic Properties ◽  
Amorphous Layer ◽  
Multilayer Films ◽  
Amorphous Structure ◽  
Asymptotic Model ◽  
Vibrating Sample Magnetometry ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
The One

ABSTRACTWe investigated structural and magnetic properties of Fe/Zr Multilayer films using high-resolution transmission electron Microscopy, X-ray diffraction and vibrating sample Magnetometry. For films with wavelength (Λ) ≥ 80Å, the interface region between the Fe and Zr layers exhibits a 15–20Å thick amorphous structure. The Magnetization curves of these films showed a monotonous decrease in the saturation magnetizations with Λ, whose trend is well explained by a simple asymptotic model that assumes the interface amorphous layer to be non-ferromagnetic. Films with Λ≤40Å exhibit a compositionally-Modulated amorphous structure. The latter films are paramagnetic except for the one with Λ=40Å, which showed a superparamagnetic behavior.

Magnetic and Magnetoresonance Studies of Composite Multilayer Films with Different Kinds of Interlayers

2015 ◽  
Vol 233-234 ◽  
pp. 633-636
Author(s):  
Irina Shipkova ◽  
Juliya Chekrygina ◽  
Aleksandr Devizenko ◽  
Evgeniya Lebedeva ◽  
Nikolay Syr'ev ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Ferromagnetic Resonance ◽  
Magnetization Curve ◽  
Multilayer Films ◽  
Curve Shape ◽  
X Ray Diffraction ◽  
X Ray ◽  
Magnetic Layers ◽  
Glancing Angle

Static magnetic properties, ferromagnetic resonance (FMR) and glancing angle X-ray diffraction spectra (GAXRD) of (CoFeB)/(nonmagnetic interlayer) nanosystems have been studied for three kinds of interlayers: dielectric (SiO2) and semiconductors (Si and SiC). Matter of discussion is the role of the interlayer material in forming of inner structure of magnetic layers and magnetization curve shape.

In Situ X-Ray Diffraction Investigations during Diffusion Anneals of Ni-Cu Thin Film Diffusion Couples

2010 ◽  
Vol 89-91 ◽  
pp. 503-508 ◽  
Author(s):  
J. Sheng ◽  
U. Welzel ◽  
Eric J. Mittemeijer
Keyword(s):  
Thermal Stresses ◽  
Stress Generation ◽  
Ex Situ ◽  
Diffusion Annealing ◽  
X Ray Diffraction ◽  
Individual Layer ◽  
X Ray ◽  
Bilayer System ◽  
Stress Changes

The stress evolution during diffusion annealing of Ni-Cu bilayers (individual layer thicknesses of 50 nm) was investigated employing ex-situ and in-situ X-ray diffraction measurements. Annealing at relatively low homologous temperatures (about 0.3 - 0.4 Tm) for durations up to about 100 hours results in considerable diffusional intermixing, as demonstrated by Auger-electron spectroscopy investigations (in combination with sputter-depth profiling). In addition to thermal stresses due to differences of the coefficients of thermal expansion of layers and substrate, tensile stress con-tributions in the sublayers arise during the diffusion anneals. The obtained stress data have been discussed in terms of possible mechanisms of stress generation. The influence of diffusion on stress development in the sublayers of the diffusion couple during heating and isothermal annealing was investigated by comparing stress changes in the bilayer system with corresponding results obtained under identical conditions for single layers of the components in the bilayer system. The specific residual stresses that emerge due to diffusion between the (sub)layers in the bilayer could thereby be identified.

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