The use of Rheed Intensities for the Quantitative Characterization of Surfaces

1995 ◽  
Vol 399 ◽  
Author(s):  
Y. Ma ◽  
S. Lordi ◽  
J. A. Eades
Keyword(s):  
Quantitative Characterization ◽  
Important Method ◽  
Stepped Surfaces ◽  
Methods Of Calculation ◽  
Improved Methods

ABSTRACTRHEED is an important method for the in situ characterization of surfaces. Until recently, this characterization has not used the intensities of RHEED reflections. Improved methods of calculation have made it possible to simulate RHEED patterns from bulk-terminated, reconstructed and stepped surfaces. From the comparison between simulated and experimental patterns, it is now possible to refine the positions of atoms in surfaces and to determine the density of steps on surfaces (well almost).

Quantitative Characterization of Dislocation Structure coupled with Electromigration in a Passivated Al (0.5wt%Cu) Interconnects

2003 ◽  
Vol 766 ◽  
Author(s):  
R.I. Barabash ◽  
N. Tamura ◽  
B.C. Valek ◽  
R. Spolenak ◽  
J.C. Bravman ◽  
...  
Keyword(s):  
Plastic Deformation ◽  
Dislocation Structure ◽  
Rotation Axis ◽  
Early Stage ◽  
Middle Region ◽  
Quantitative Characterization ◽  
X Ray ◽  
Interconnect Lines

AbstractNew synchrotron x-ray microbeam methodology is used to analyze and test the reliability of interconnects. The early stage of plastic deformation induced by electromigration before any damages become visible has been recently revealed by white beam scanning X-ray microdiffraction during an accelerated test on Al interconnect lines. In the present paper, we provide a quantitative analysis of the dislocation structure generated in several micron-sized Al grains in both the middle region and ends of the interconnect line during anin-situelectromigration experiment. We demonstrate that the evolution of the dislocation structure during electromigration is highly inhomogeneous and results in the formation of randomly distributed geometrically necessary dislocations as well as geometrically necessary boundaries. The orientation of the activated slip systems and rotation axis depends on the position of the grain in the interconnect line. The origin of the observed plastic deformation is considered in view of constraints for dislocation arrangements under applied electric field during electromigration. The coupling between plastic deformation and precipitation in the Al (0.5% wt. Cu) is observed for the grains close to the anode/cathode end of the line.

A practical guide to pharmaceutical analyses using X-ray powder diffraction

2019 ◽  
Vol 34 (2) ◽  
pp. 164-183 ◽  
Author(s):  
T. G. Fawcett ◽  
S. Gates-Rector ◽  
A. M. Gindhart ◽  
M. Rost ◽  
S. N. Kabekkodu ◽  
...  
Keyword(s):  
Powder Diffraction ◽  
Amorphous Materials ◽  
X Ray ◽  
Software Applications ◽  
General Chapter ◽  
Database Content ◽  
Improved Methods ◽  
States Pharmacopeia

Advances in instrumentation, software applications, and database content have all contributed to improvements in pharmaceutical analyses by powder diffraction methods in the 21stcentury. When compared to the globally harmonized United States Pharmacopeia General Chapter <941>, “Characterization of Crystalline and Partially Crystalline Solids by X-ray Powder Diffraction”, many historic problems in pharmaceutical analysis have been addressed by combinations of improved methods and instrumentation. Major changes in the last 20 years include (i) a dramatic lowering in detection capability and detection limits, (ii) enhanced capabilities for dynamic measurements such asin situanalyses under a variety of conditions, and (iii) the ability to identify and characterize nanomaterials, non-crystalline, and amorphous materials by both coherent and incoherent scattering profiles.

In Situ and Quantitative Characterization of Solid Electrolyte Interphases

Nano Letters ◽  
2014 ◽  
Vol 14 (3) ◽  
pp. 1405-1412 ◽  
Author(s):  
Arthur v. Cresce ◽  
Selena M. Russell ◽  
David R. Baker ◽  
Karen J. Gaskell ◽  
Kang Xu
Keyword(s):  
Solid Electrolyte ◽  
Quantitative Characterization

Isatin binding proteins in rat brain: In situ imaging, quantitative characterization of specific [3H]isatin binding, and proteomic profiling

2009 ◽  
Vol 87 (12) ◽  
pp. 2763-2772 ◽  
Author(s):  
Michele Crumeyrolle-Arias ◽  
Olga Buneeva ◽  
Victor Zgoda ◽  
Arthur Kopylov ◽  
Ana Cardona ◽  
...  
Keyword(s):  
Rat Brain ◽  
Binding Proteins ◽  
Proteomic Profiling ◽  
Quantitative Characterization ◽  
In Situ Imaging

Quantitative characterization of surface adsorption sites of carbon nanofibers by in-situ fluorescence measurement using 1-naphthol

2005 ◽  
Vol 412 (1-3) ◽  
pp. 223-227 ◽  
Author(s):  
Satoshi Kubota ◽  
Hiromasa Nishikiori ◽  
Nobuaki Tanaka ◽  
Morinobu Endo ◽  
Tsuneo Fujii
Keyword(s):  
Carbon Nanofibers ◽  
Surface Adsorption ◽  
Fluorescence Measurement ◽  
Quantitative Characterization ◽  
Adsorption Sites

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

Sign in / Sign up

Export Citation Format

Share Document