Compound Semiconductor Surfaces and Interfaces: Whence Fermi Level Pinning?

1984 ◽  
Vol 37 ◽  
Author(s):  
Jerry M. Woodall

AbstractExcept for a few special cases, the electrical and optical properties of most III-V semiconductor surfaces and interfaces can be explained in terms of surface Fermi level pinning. However, despite years of research there is no universal agreement on the origin of this pinning. This problem is of more than just academic interest since pinning affects optoelectronic device performance via surface recombination losses, and high speed device performance through uncontrollable ohmic and Schottky contact properties for MESFETs and through a high interface trap density for MISFETs.This talk reviews some of the approaches to the pinning problem and presents some recent results on the role of misfit dislocations in pinning. In particular it will be shown that there are are several models which can explain the usually observed pinning positions. However, we have developed a modified work function model capable of explaining both the usual pinning positions and the experimentally observed exceptions in Schottky barrier height for some metal/semiconductor interfaces. The electrical properties of lattice mismatched GaInAs/GaAs heterojunctions suggest that Fermi level pinning occurs at misfit dislocations.

1983 ◽  
Vol 51 (19) ◽  
pp. 1783-1786 ◽  
Author(s):  
J. M. Woodall ◽  
G. D. Pettit ◽  
T. N. Jackson ◽  
C. Lanza ◽  
K. L. Kavanagh ◽  
...  

1993 ◽  
Vol 324 ◽  
Author(s):  
J.M. Woodall

AbstractThis paper will review the use of contactless electromodulation methods, such as photoreflectance (PR) and contactless electroreflectance (CER), to characterize the electronic properties of compound semiconductor surfaces exposed to different growth and post-growth conditions. Also the characterization of properties critical to device performance can be evaluated. For example, using PR and CER it has been found that there is a lower density of surface hole traps than electron traps in certain as-grown MBE (001) GaAs samples and that this condition persists even after air exposure. This behaviour is in contrast to other samples, including both bulk and MBE grown (001) surfaces in which the Fermi level is pinned mid-gap for both n- and p-type structures. We also have observed that Ar+ bombardment under UHV conditions results in Fermi level pinning close to the conduction band edge and that thermal annealing restores mid-gap pinning. Finally, using PR we are able to characterize the electric fields and associated doping levels in the emitter and collector regions of heterojunction bipolar transistor structures (fabricated from III-V materials), thus demonstrating the ability to perform inprocess evaluation of important device parameters.


2014 ◽  
Vol 26 (49) ◽  
pp. 492202 ◽  
Author(s):  
Davide Colleoni ◽  
Giacomo Miceli ◽  
Alfredo Pasquarello

2013 ◽  
Vol 103 (26) ◽  
pp. 264104 ◽  
Author(s):  
D. Wolf ◽  
A. Lubk ◽  
A. Lenk ◽  
S. Sturm ◽  
H. Lichte

Crystals ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 259
Author(s):  
Pei-Te Lin ◽  
Jia-Wei Chang ◽  
Syuan-Ruei Chang ◽  
Zhong-Kai Li ◽  
Wei-Zhi Chen ◽  
...  

Ge-based Schottky diodes find applications in high-speed devices. However, Fermi-level pinning is a major issue for the development of Ge-based diodes. This study fabricates a Pt/carbon paste (CP)/Ge Schottky diode using low-cost CP as an interlayer. The Schottky barrier height (ΦB) is 0.65 eV for Pt/CP/n-Ge, which is a higher value than the value of 0.57 eV for conventional Pt/n-Ge. This demonstrates that the CP interlayer has a significant effect. The relevant junction mechanisms are illustrated using feasible energy level band diagrams. This strategy results in greater stability and enables a device to operate for more than 500 h under ambient conditions. This method realizes a highly stable Schottky contact for n-type Ge, which is an essential element of Ge-based high-speed electronics.


Nano Letters ◽  
2016 ◽  
Vol 17 (1) ◽  
pp. 44-49 ◽  
Author(s):  
Hoon Hahn Yoon ◽  
Sungchul Jung ◽  
Gahyun Choi ◽  
Junhyung Kim ◽  
Youngeun Jeon ◽  
...  

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