Disorder Production at Metal-Silicon Interfaces by MeV/amu Ion
Irradiation
ABSTRACTWe have shown that irradiation of Ag-Si and Au-Si interfaces by 14 MeV 016 ions can produce non-registered silicon at the metal-silicon interface. Evidence that this effect is due to electronic energy loss of the bombarding ion is presented. The possible relationship of this effect to MeV-ion enhanced adhesion is discussed.
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2010 ◽
Vol 268
(19)
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pp. 2933-2936
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2018 ◽
Vol 6
(6)
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pp. 339-344
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2017 ◽
Vol 14
(1)
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pp. 485-489
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