Electronic Defects in Transient, Thermally Processed Semiconductors

1984 ◽  
Vol 35 ◽  
Author(s):  
N.M. Johnson
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Single Crystal Silicon ◽  
Bulk Single Crystal ◽  
Crystal Silicon ◽  
Silicon Thin Films ◽  
Thermally Processed ◽  
Electronic Defect ◽  
Electronic Defects

ABSTRACTThis paper summarizes the general observations that may be drawn from numerous studies of electronic defects in transient thermally annealed bulk single – crystal silicon and discusses the emerging subjects of electronic defect evaluation in beam – crystallized silicon thin films and in epitaxially – grown III – V semiconductors.

Electronic Defects in Beam - Crystallized Silicon

1981 ◽  
Vol 4 ◽  
Author(s):  
N. M. Johnson
Keyword(s):  
Thin Films ◽  
Single Crystal Silicon ◽  
Experimental Investigations ◽  
Bulk Single Crystal ◽  
Bulk Silicon ◽  
Crystal Silicon ◽  
Silicon Thin Films ◽  
Amorphous Substrates ◽  
Directed Energy ◽  
Electronic Defects

ABSTRACTDirected energy sources have been used to recrystallize implanted amorphous layers in bulk single - crystal silicon and to crystallize silicon thin films on insulating amorphous substrates. All investigated forms of beam annealing leave residual electronic defects in and near the recrystallized layer on bulk silicon, with densities in excess of those obtained by conventional furnace annealing. This paper summarizes the general observations that may be drawn from numerous experimental investigations of electronic defects in CW beam - recrystallized bulk silicon and affirms the timeliness of similar comprehensive studies of residual defects in crystallized - silicon thin films.

Low cycle fatigue of single crystal silicon thin films

2007 ◽  
Vol 140 (2) ◽  
pp. 257-265 ◽  
Author(s):  
Hsien-Kuang Liu ◽  
B.J. Lee ◽  
Pang-Ping Liu
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Low Cycle Fatigue ◽  
Single Crystal Silicon ◽  
Cycle Fatigue ◽  
Crystal Silicon ◽  
Silicon Thin Films

Influence of sub-micrometer notches on the fracture of single crystal silicon thin films

2007 ◽  
Vol 30 (12) ◽  
pp. 1172-1181 ◽  
Author(s):  
X. LI ◽  
T. KASAI ◽  
S. NAKAO ◽  
T. ANDO ◽  
M. SHIKIDA ◽  
...  
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Single Crystal Silicon ◽  
Crystal Silicon ◽  
Silicon Thin Films

Temperature dependent evolution of wrinkled single-crystal silicon ribbons on shape memory polymers

Soft Matter ◽  
2017 ◽  
Vol 13 (41) ◽  
pp. 7625-7632 ◽  
Author(s):  
Yu Wang ◽  
Kai Yu ◽  
H. Jerry Qi ◽  
Jianliang Xiao
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Shape Memory ◽  
Single Crystal Silicon ◽  
Shape Memory Polymers ◽  
Temperature Dependent ◽  
Crystal Silicon ◽  
Silicon Thin Films

Enabled by shape memory polymers (SMPs), time and temperature dependent wrinkling of single-crystal silicon thin films is demonstrated.

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