Long-term reliability of single-crystal silicon thin films: the influence of environment on the fatigue damage accumulation rate

2005 ◽  
Author(s):  
Olivier N. Pierron ◽  
Christopher L. Muhlstein
2007 ◽  
Vol 140 (2) ◽  
pp. 257-265 ◽  
Author(s):  
Hsien-Kuang Liu ◽  
B.J. Lee ◽  
Pang-Ping Liu

2007 ◽  
Vol 30 (12) ◽  
pp. 1172-1181 ◽  
Author(s):  
X. LI ◽  
T. KASAI ◽  
S. NAKAO ◽  
T. ANDO ◽  
M. SHIKIDA ◽  
...  

Soft Matter ◽  
2017 ◽  
Vol 13 (41) ◽  
pp. 7625-7632 ◽  
Author(s):  
Yu Wang ◽  
Kai Yu ◽  
H. Jerry Qi ◽  
Jianliang Xiao

Enabled by shape memory polymers (SMPs), time and temperature dependent wrinkling of single-crystal silicon thin films is demonstrated.


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