Aging Characteristics of Ferroelectric Epitaxial BaTiO3/YBa2Cu3O7 Heterostructures

1994 ◽  
Vol 341 ◽  
Author(s):  
Samuel D. Harkness ◽  
J. W Viatella ◽  
V. Nagabushnam ◽  
R. K. Singh
Keyword(s):  
Lattice Strain ◽  
Microstructural Analysis ◽  
Laser Deposition ◽  
Dielectric Measurements ◽  
X Ray Diffraction ◽  
Impedance Analyzer ◽  
Aging Rate ◽  
X Ray ◽  
Aging Rates ◽  
D 02

AbstractThe nature of ferroelectric aging of epitaxial BaTiO3YBa2Cu3O7 heterostructures grown by laser deposition was investigated as a function of rricrostructure in the dielctric layer. Molar amounts of SrTiO3 were then substitutionally added to analyze the effect on the rnicrostructure and electrical properties. Corresponding shifts in c/a ratio and curie temperature were correlated to changes in aging rate (%δC/decade time). Microstructural analysis was provided by high-resolution x-ray diffraction (HRXRD), and Rutherford backscattering spectroscopy (RBS). Results indicate a moderate upward shift in c/a ratios from theoretical values due to increasing lattice strain across the bilayer interface. Minimum channel yields in RBS spectra were maintained between 6–8% for BaTiO3 purities above 60 %. Dielectric measurements were conducted using an impedance analyzer equipped with an isothermal chamber capable of maintaining ±1°C. The dielectric properies were consistent with c-axis oriented BaTiO3 values (k=120, D=.02)Minimum aging rates are observed at the lower c/a ratio compositions to be as low as .07%δC/decade.

scholarly journals Effect of Molybdenum Content on the Corrosion and Microstructure of Low-Ni, Co-Free Maraging Steels

Metals ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 852
Author(s):  
Asiful H. Seikh ◽  
Hossam Halfa ◽  
Mahmoud S. Soliman
Keyword(s):  
Corrosion Resistance ◽  
Electrochemical Impedance ◽  
Microstructural Analysis ◽  
Xrd Analysis ◽  
X Ray Diffraction ◽  
Alloying Element ◽  
X Ray ◽  
Maraging Steels ◽  
Eds Analysis ◽  
Electroslag Refining

Molybdenum (Mo) is an important alloying element in maraging steels. In this study, we altered the Mo concentration during the production of four cobalt-free maraging steels using an electroslag refining process. The microstructure of the four forged maraging steels was evaluated to examine phase contents by optical microscopy, scanning electron microscopy (SEM), and X-ray diffraction (XRD) analysis. Additionally, we assessed the corrosion resistance of the newly developed alloys in 3.5% NaCl solution and 1 M H2SO4 solution through potentiodynamic polarization and electrochemical impedance spectroscopy (EIS) techniques. Furthermore, we performed SEM and energy-dispersive spectroscopy (EDS) analysis after corrosion to assess changes in microstructure and Raman spectroscopy to identify the presence of phases on the electrode surface. The microstructural analysis shows that the formation of retained austenite increases with increasing Mo concentrations. It is found from corrosion study that increasing Mo concentration up to 4.6% increased the corrosion resistance of the steel. However, further increase in Mo concentration reduces the corrosion resistance.

Polydomain Structure of Epitaxial PbTiO3 films on MgO

1997 ◽  
Vol 493 ◽  
Author(s):  
S. P. Alpay ◽  
A. S. Prakash ◽  
S. Aggarwal ◽  
R. Ramesh ◽  
A. L. Roytburd ◽  
...  
Keyword(s):  
Domain Structure ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Theoretical Predictions ◽  
The Stability ◽  
Increasing Temperature ◽  
Stable Domains ◽  
Domain Stability

ABSTRACTA PbTiO3(001) film grown on MgO(001) by pulsed laser deposition is examined as an example to demonstrate the applications of the domain stability map for epitaxial perovskite films which shows regions of stable domains and fractions of domains in a polydomain structure. X-ray diffraction studies indicate that the film has a …c/a/c/a… domain structure in a temperature range of °C to 400°C with the fraction of c-domains decreasing with increasing temperature. These experimental results are in excellent agreement with theoretical predictions based on the stability map.

Formalism for the determination of intermediate stress gradients using X-ray diffraction

2009 ◽  
Vol 42 (2) ◽  
pp. 192-197 ◽  
Author(s):  
Thomas Gnäupel-Herold
Keyword(s):  
Lattice Strain ◽  
Narrow Line ◽  
X Ray Diffraction ◽  
Beam Spot ◽  
Strain Measurements ◽  
One Dimensional ◽  
X Ray ◽  
Stress Gradients ◽  
Shaped Beam

A method is outlined that allows the determination of one-dimensional stress gradients at length scales greater than 0.2 mm. By using standard four-circle X-ray diffractometer equipment and simple aperture components, length resolutions down to 0.05 mm in one direction can be achieved through constant orientation of a narrow, line-shaped beam spot. Angle calculations are given for the adjustment of goniometer angles, and for the effective azimuth and tilt of the scattering vector for general angle settings in a four-circle goniometer. The latter is necessary for the computation of stresses from lattice strain measurements.

Frequency and Temperature Dependence of Dielectric Properties of Orthorhombic HoMnO3 Thin Films

2014 ◽  
Vol 1025-1026 ◽  
pp. 427-431
Author(s):  
Ping Gao ◽  
Wei Zhang ◽  
Wei Tian Wang
Keyword(s):  
Dielectric Properties ◽  
Pulsed Laser ◽  
Signal Amplitude ◽  
Debye Model ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Cole Diagram

Orthorhombic HoMnO3 films were prepared epitaxially on Nb-doped SrTiO3 single crystal substrates by using pulsed laser deposition technique. The films showed perfectly a-axis crystallographic orientations. X-ray diffraction and atomic force microscopy were used to characterize the films. The complex dielectric properties were measured as functions of frequency (40 Hz~1 MHz) and temperature (80 K~300 K) with a signal amplitude of 50 mv. The respective dielectric relaxation peaks shifted to higher frequency as the measuring temperature increased, with the same development of real part of the complex permittivity. The cole-cole diagram was obtained according to the Debye model, and the effects of relaxation process were discussed.

Colossal Magnetoresistance in Thick La0.7Ca0.3MnO3 Films

1995 ◽  
Vol 384 ◽  
Author(s):  
Randolph E. Treece ◽  
P. Dorsey ◽  
M. Rubinstein ◽  
J. M. Byers ◽  
J. S. Horwitz ◽  
...  
Keyword(s):  
Colossal Magnetoresistance ◽  
Single Phase ◽  
Laser Deposition ◽  
Orthorhombic Structure ◽  
X Ray Diffraction ◽  
Post Deposition Annealing ◽  
X Ray ◽  
Mr Effect ◽  
Deposited Films ◽  
Post Deposition

ABSTRACTThick films (0.6 and 2.0 μm) of the colossal magnetoresistance (CMR) material, La0.7Ca0.3MnO3 (LCMO), have been grown by pulsed laser deposition (PLD). The films were grown from single-phase LCMO targets in 100 mTorr 02 pressures and the material deposited on (100) LaAlO3 substrates at deposition temperatures of 800°C. The deposited films were characterized by X-ray diffraction (XRD), magnetic field-dependent resistivity, and Rutherford backscattering spectroscopy (RBS). The LCMO films were shown by XRD to adopt an orthorhombic structure. Brief post-deposition annealing led to ~50,000% and ~12,000% MR effect in the 0.6 μm and 2.0 μm films, respectively.

An X-ray scattering study on inverted Ge–Si huts grown at low temperatures

2004 ◽  
Vol 19 (4) ◽  
pp. 347-351
Author(s):  
J. Xu ◽  
X. S. Wu ◽  
B. Qian ◽  
J. F. Feng ◽  
S. S. Jiang ◽  
...  
Keyword(s):  
Low Temperatures ◽  
Lattice Strain ◽  
Lattice Mismatch ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Transmission Electron ◽  
Large Lattice ◽  
Scattering Study

Ge–Si inverted huts, which formed at the Si∕Ge interface of Si∕Ge superlattice grown at low temperatures, have been measured by X-ray diffraction, grazing incidence X-ray specular and off-specular reflectivities, and transmission electron microscopy (TEM). The surface of the Si∕Ge superlattice is smooth, and there are no Ge–Si huts appearing on the surface. The roughness of the surfaces is less than 3 Å. Large lattice strain induced by lattice mismatch between Si and Ge is found to be relaxed because of the intermixing of Ge and Si at the Si∕Ge interface.

Influence of LaNiO3 as an Electrode on the Properties of Ferroelectric Oxides

2000 ◽  
Vol 623 ◽  
Author(s):  
R. Kalare ◽  
M. Vedawyas ◽  
A. Kumar
Keyword(s):  
Ferroelectric Properties ◽  
Ferroelectric Thin Film ◽  
Memory Device ◽  
Epitaxial Films ◽  
Laser Deposition ◽  
Oxide Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Potential Electrode ◽  
Ferroelectric Oxides

AbstractAn electrode plays an important role in realising a ferroelectric thin film as a potential memory device. We have investigated LaNiO3 (LNO) as a potential electrode material and evaluated the ferroelectric properties of oxide materials like strontium bismuth tantalate (SBT) and barium titanate(BT). We have successfully deposited epitaxial films of LNO on Pt coated Si(100) and LaAlO3 (LAO) substrates using the pulsed excimer laser deposition technique. We are able to grow high quality SBT and BT films on top of this LNO layer. The X-ray diffraction revealed the epitaxy of the LNO, SBT and BT films. The ferroelectric properties of SBTand BT were investigated using the RT66A ferroelectric tester.

Synthesis and Characterization of New Refractory Coatings Based on Talc, Cordierite, Zircon and Mullite Fillers for Lost Foam Casting Process

2014 ◽  
Vol 59 (1) ◽  
pp. 89-95 ◽  
Author(s):  
A. Prstić ◽  
Z. Aćimović-Pavlović ◽  
A. Terzić ◽  
L. Pavlović
Keyword(s):  
Microstructural Analysis ◽  
Casting Process ◽  
Lost Foam Casting ◽  
X Ray Diffraction ◽  
X Ray ◽  
Software Application ◽  
Design And Optimization ◽  
Refractory Coatings ◽  
Particle Size And Shape ◽  
Lost Foam

Abstract Refractory coatings based on different refractory fillers (talc, cordierite, zircon and mullite) for application in Lost Foam casting process were investigated. Design and optimization of the coatings composition with controlled, rheological properties included, and consequently synthesis were achieved by application of different coating components, namely different suspension agents and fillers and by alteration of the coating production procedure. Morphologic and microstructural analysis of fillers was carried out by means of scanning electronic microscope. X-ray diffraction analysis by means of X-ray diffractometer was applied in determination and monitoring the phase composition changes of the refractory fillers. An analysis of the particle size and shape was carried out by means of the PC software application package OZARIA 2.5. To assess the effects of application of individual refractory coatings, a detailed investigation of structural and mechanical properties of the moldings obtained was performed. Highlight was placed on revealing and analyzing surface and volume defects present on moldings. Radiographic molding tests were carried out by means of the X-ray device SAIFORT type-S200. Attained results are essential for the synthesis of refractory coatings based on high-temperature fillers and their applications in Lost Foam casting process for manufacturing of moldings with in-advance-set properties.

Sign in / Sign up

Export Citation Format

Share Document