Very High-Gap Tetrahedrally Coordinated Amorphous Silicon-Carbon Alloys

1994 ◽  
Vol 336 ◽  
Author(s):  
Ionel Solomon ◽  
Leandro R. Tessler

ABSTRACTWe have prepared a series of hydrogenated Amorphous silicon-carbon alloys a-Si1-xCx:H in conditions where the power delivered to the plasma is below the threshold of primary decomposition of CH4 (“low-power regime”). Carbon is therefore incorporated into the growing film in the form of methyl groups -CH3, thus preserving the sp3 hybridization in the solid. Since the carbon is deposited only by chemical reaction with the radicals produced by the decomposition of SiH4, its concentration in the alloys cannot exceed the value x=0.5.The variations of the optical gap and of the “average gap” with x, as measured by optical transmission, indicate as expected the predominantly tetrahedral coordination of the carbon, with a record value of EQ4=3.6 eV for x=0.42 (3.95 eV if corrected for the Urbach-tail absorption). Since the Si-C network does not relax to a more stable lower sp2 coordination, the material is highly strained, with an Urbach tail larger than that of the standard Material.

1995 ◽  
Vol 377 ◽  
Author(s):  
H. M. Dyalsingh ◽  
G. M. Khera ◽  
J. Kakalios

ABSTRACTThermopower, conductivity and 1/f noise measurements have been performed on a series of n-type doped hydrogenated amorphous silicon carbon films that are prepared with varying gas phase concentrations of CH4. The increased disorder at the mobility edge associated with alloying is characterized by the Q-function, which is obtained by combining thermopower and conductivity measurements, and is also reflected in the noise power spectra and noise statistics.


2010 ◽  
Vol 81 (15) ◽  
Author(s):  
E. N. Kalabukhova ◽  
S. N. Lukin ◽  
D. V. Savchenko ◽  
B. D. Shanina ◽  
A. V. Vasin ◽  
...  

2002 ◽  
Vol 403-404 ◽  
pp. 349-353 ◽  
Author(s):  
Giuseppina Ambrosone ◽  
Ubaldo Coscia ◽  
Stefano Lettieri ◽  
Pasqualino Maddalena ◽  
Carlo Privato ◽  
...  

1996 ◽  
Vol 420 ◽  
Author(s):  
C. E. Nebel ◽  
M. Rother ◽  
C. Summonte ◽  
M. Heintze ◽  
M. Stutzmann

AbstractHall experiments on a series of microcrystalline, microcrystalline-amorphous, amorphous and crystalline silicon samples with varying defect densities are presented and discussed. Normal Hall effect signatures on boron and phosphorus doped hydrogenated amorphous silicon are detected. We interpret these results to be due to a small volume fraction of nanocrystalline Si, which falls below the detection limits of Raman experiments. Hydrogenated amorphous silicon, prepared under conditions far away from microcrystalline growth, shows the known double sign anomaly, Sign reversals in c-Si, where the disorder is increased by Si implantation up to very high levels, could not be detected.


1983 ◽  
Vol 59-60 ◽  
pp. 561-564 ◽  
Author(s):  
Yoshifumi Katayama ◽  
Toshikazu Shimada ◽  
Tsuyoshi Uda ◽  
Keisuke L.I. Kobayashi ◽  
Chang-gen Jiang ◽  
...  

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