Atomic Defects in Transition Metal Carbides and SiC Studied by Positron Annihilation

1993 ◽  
Vol 327 ◽  
Author(s):  
A. A. Rempel ◽  
H. -E. Schaefer ◽  
M. Forster ◽  
A.I. Girka

AbstractNonstoichiometric defects in carbides of the Group IV and V transition metals and radiation-induced atomic defects in SiC were studied by positron lifetime measurements before and after low-temperature (80 K) electron irradiation and subsequent thermal annealing up to 1900 K. Agglomeration of radiation-induced atomic defects which strongly depends on the energy of the irradiation electrons and subsequent decay of the agglomerates in SiC is observed.

1965 ◽  
Vol 9 ◽  
pp. 365-375 ◽  
Author(s):  
J. E. Holliday

AbstractFrom measurements of the shift in wavelength with chemical combination, it appears there is very little transfer of charge between the metal and nonmetal atoms for the Group-IV transition-metal carbides and diborides. For Group-VI transition-metal carbides and beyond, there appears to be a definite transfer of charge from the carbon to the metal atom. The bonding in the Group-IV transitionmetal carbides is largely co valent, and metallic for the Group-IV transition-metal diborides. A comparison of shapes of emission bands with crystal structure indicates that, in general, NaCl-type structures have symmetrical peaks with narrow bandwidths compared to hexagonal structure, which have asymmetrical peaks, broad bandwidths, and long tails to the bottom of the bands.


2019 ◽  
Vol 6 (8) ◽  
pp. 2024-2034 ◽  
Author(s):  
Muthaiah Annalakshmi ◽  
Paramasivam Balasubramanian ◽  
Shen-Ming Chen ◽  
Tse-Wei Chen ◽  
Pei-Hung Lin

Transition metal carbides have shown potential for use in electrochemical applications due to their excellent electronic conductivity, stability and electrocatalysis.


2008 ◽  
Vol 607 ◽  
pp. 140-142
Author(s):  
H. Li ◽  
J.Y. Ke ◽  
J.B. Pang ◽  
Bo Wang ◽  
Z. Wang

Defects induced by electron irradiation in Te-doped liquid-encapsulated Czochralski–grown GaSb were studied by the positron lifetime spectroscopy. The lifetime measurements under room temperature indicated there were VGa-related defects with a characteristic lifetime of 298 ps in the heavily Te-doped as-grown GaSb samples. The average lifetime increased with the increase of irradiation dose in lightly Te-doped GaSb,but the behavior was opposite in the heavily Te-doped samples. It should be due to the shift of Fermi level in heavily Te-doped GaSb and the occurrence of gallium vacancies in different charge states. In the temperature dependence measurements carried out on heavily Te-doped samples, we observed positron shallow trap, and this shallow trap should be attributed to positrons forming hyrogenlike Rydberg states with GaSb antisite defects.


Sign in / Sign up

Export Citation Format

Share Document