Residual Stress and Microstructure of CU/W Multilayers

1993 ◽  
Vol 308 ◽  
Author(s):  
Ph. Goudeau ◽  
K.F. Badawi ◽  
A. Naudon ◽  
N. Durand
Keyword(s):  
Solid Solution ◽  
Residual Stress ◽  
Ion Irradiation ◽  
Lattice Parameter ◽  
Free Lattice ◽  
Curvature Radius ◽  
X Ray Diffraction ◽  
X Ray ◽  
Microstructure Modification ◽  
20 Nm

ABSTRACTWe have determined residual stresses and the layer microstructure in as-prepared Cu/W multilayers of different periods ranging from 5.2 to 20 nm by both X-ray diffraction and the curvature radius method. The magnitude of the principal in-plane stress is large in the W layers (around - 6 GPa) and small in the Cu layers (-0.5 - + 0.5 GPa). The stress state is independent of the multilayer period. Under the compressive stress, the W cubic unit cell becomes monoclinic-like. The stress-free lattice parameter is found higher than the bulk one.We also studied the stress relaxation and the layer microstructure modification in W layers induced by Kr ion irradiation., the relaxation is almost achieved after only low fluence irradiations and the decrease of the stress-free lattice parameter in W layers observed for higher fluences is attributed to the formation of a sursaturated solid solution W(Cu).

scholarly journals Residual stress and strain-free lattice-parameter depth profiles in a γ′-Fe4N1-x layer on an α-Fe substrate measured by x-ray diffraction stress analysis at constant information depth

2009 ◽  
Vol 24 (4) ◽  
pp. 1342-1352 ◽  
Author(s):  
M. Wohlschlögel ◽  
U. Welzel ◽  
E.J. Mittemeijer
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
Depth Profile ◽  
Nitrogen Concentration ◽  
Lattice Parameter ◽  
Free Lattice ◽  
X Ray Diffraction ◽  
X Ray ◽  
Depth Profiles ◽  
Grain Interaction

The residual stress and lattice-parameter depth profiles in a γ′-Fe4N1-x layer (6-μm thickness) grown on top of an α-Fe substrate were investigated using x-ray diffraction stress analysis at constant penetration depths. Three different reflections (220, 311, and 222) were recorded at six different penetration depths using three different wavelengths. At each penetration depth, x-ray diffraction stress analysis was performed on the basis of the sin2ψ method. As a result, the residual-stress depth profile was obtained from the measured lattice strains. The lattice spacings measured in the strain-free direction were used to determine the (strain-free) lattice-parameter depth profile. The nitrogen-concentration depth profile in the layer was calculated by applying a relationship between the (strain-free) γ′ lattice parameter and the nitrogen concentration. It was found that the strain-free lattice-parameter depth profile as derived from the 311 reflections is best compatible with nitrogen concentrations at the surface and at the γ′/α interface as predicted on the basis of local thermodynamic equilibrium. It could be shown that the 311 reflection is most suitable for the analysis of lattice-parameter and residual stress depth profiles because the corresponding x-ray elastic constants exhibit the least sensitivity to the type of and changes in grain interaction. The depth-dependence of the grain interaction could be revealed. It was found that the grain interaction changes from Voigt-type near the surface to Reuss-type at the layer/substrate interface.

Problems Associated with Kα Doublet in Residual Stress Measurements

1979 ◽  
Vol 23 ◽  
pp. 333-339
Author(s):  
S. K. Gupta ◽  
B. D. Cullity
Keyword(s):  
Residual Stress ◽  
Silicon Powder ◽  
Lattice Parameter ◽  
Diffraction Peak ◽  
Parameter Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Analysis Techniques ◽  
The Difference ◽  
Similar Accuracy

Since the measurement of residual stress by X-ray diffraction techniques is dependent on the difference in angle of a diffraction peak maximum when the sample is examined consecutively with its surface at two different angles to the diffracting planes, it is important that these diffraction angles be obtained precisely, preferably with an accuracy of ± 0.01 deg. 2θ. Similar accuracy is desired in precise lattice parameter determination. In such measurements, it is imperative that the diffractometer be well-aligned. It is in the context of diffractometer alignment with the aid of a silicon powder standard free of residual stress that the diffraction peak analysis techniques described here have been developed, preparatory to residual stress determinations.

Elaboration, Structure and Mössbauer Spectroscopy of Nanostructured Fe100−xSix Powders Elaborated by Mechanical Alloying

SPIN ◽  
2017 ◽  
Vol 07 (02) ◽  
pp. 1750002 ◽  
Author(s):  
M. Hemmous ◽  
A. Guittoum
Keyword(s):  
Magnetic Field ◽  
Solid Solution ◽  
Mechanical Alloying ◽  
Hyperfine Magnetic Field ◽  
Lattice Parameter ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Sizes ◽  
The Mean ◽  
Xrd Studies

We have studied the effect of the silicon concentration on the structural and hyperfine properties of nanostructured Fe[Formula: see text]Six powders ([Formula: see text], 20, 25 and 30[Formula: see text]at.%) prepared by mechanical alloying. The X-ray diffraction (XRD) studies indicated that after 72[Formula: see text]h of milling, the solid solution bcc-[Formula: see text]-Fe(Si) is formed. The grain sizes, [Formula: see text]D[Formula: see text] (nm), decreases with increasing Si concentration and reaches a minimum value of 11[Formula: see text]nm. We have found that the lattice parameter decreases with increasing Si concentration. The changes in values are attributed to the substitutional dissolution of Si in Fe matrix. From the adjustment of Mössbauer spectra, we have shown that the mean hyperfine magnetic field, [Formula: see text]H[Formula: see text] (T), decreases with increasing Si concentration. The substitutional dependence of [Formula: see text]H[Formula: see text] (T) can be attributed to the effect of p electrons Si influencing electrons d of Fe.

Preparation of AlN thin films by means of CVD using iodide source under atmospheric pressure

2007 ◽  
Vol 1040 ◽  
Author(s):  
Hiroki Iwane ◽  
Naoki Wakiya ◽  
Naonori Sakamoto ◽  
Takato Nakamura ◽  
Hisao Suzuki
Keyword(s):  
Thin Films ◽  
Residual Stress ◽  
Sapphire Substrate ◽  
Atmospheric Pressure ◽  
Chemical Vapor ◽  
Lattice Parameter ◽  
X Ray Diffraction ◽  
Cross Sectional ◽  
X Ray ◽  
Aluminum Iodide

AbstractEpitaxial aluminum nitride (AlN) thin films were successfully prepared on the (0001) sapphire substrate by chemical vapor deposition (CVD) using aluminum iodide (AlI3) and ammonia (NH3) under atmospheric pressure at 750 ºC. The crystallographic relationship between AlN thin films and Al2O3 substrate is in the following; AlN(0001)//Al2O3(0001) and AlN[1010]//Al2O3[1120]. Lattice parameters of AlN thin film measured by X-ray diffraction revealed that c=0.498 and a=0.311 nm, respectively. Residual stress estimated by modified sin2ψ method was 0.38 GPa in compressive stress. Cross-sectional TEM observation revealed that an interlayer lies between the AlN films and the sapphire substrate. It was suggested that relaxation of residual stress caused by the mismatching of lattice parameter and thermal expansion coefficient was brought about by the interlayer.

Nanoporous Ni and Ni-Cu Fabricated by Dealloying

2009 ◽  
Vol 1228 ◽  
Author(s):  
Masataka Hakamada ◽  
Yasumasa Chino ◽  
Mamoru Mabuchi
Keyword(s):  
Electron Microscopy ◽  
Solid Solution ◽  
Noble Metals ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
The Difference ◽  
20 Nm ◽  
Good Workability ◽  
Scanning Electron

AbstractMetallic nanoporous architecture can be spontaneously attained by dealloying of a binary alloy. The nanoporous architecture can be often fabricated in noble metals such as Au and Pt. In this study, nanoporous Ni, Ni-Cu are fabricated by dealloying rolled Ni-Mn and Cu-Ni-Mn alloys, respectively. Unlike conventional Raney nickel composed of brittle Ni-Al or Cu-Al intermetallic compounds, the initial alloys had good workability probably because of their fcc crystal structures. After the electrolysis of the alloys in (NH4)2SO4 aqueous solution, nanoporous architectures of Ni and Ni-Cu with pore and ligament sizes of 10–20 nm were confirmed by scanning electron microscopy and transmission electron microscopy. X-ray diffraction analyses suggested that Ni and Cu atoms form a homogeneous solid solution in the Ni-Cu nanoporous architecture. The ligament sizes of nanoporous Ni and Ni-Cu were smaller than that of nanoporous Cu, reflecting the difference between diffusivities of Ni and Cu at solid/electrolyte interface. Ni can reduce the pore and ligament sizes of resulting nanoporous architecture when added to initial Cu-Mn alloys.

Structural Behaviour of Solid Solution in the SmAlO3−TbAlO3 System

2015 ◽  
Vol 230 ◽  
pp. 39-44 ◽  
Author(s):  
Natalja Ohon ◽  
Leonid Vasylechko ◽  
Yurii Prots ◽  
Marcus Schmidt ◽  
I.I. Syvorotka
Keyword(s):  
Thermal Analysis ◽  
Solid Solution ◽  
Continuous Solid Solution ◽  
Lattice Parameter ◽  
X Ray Diffraction ◽  
Structural Behaviour ◽  
X Ray ◽  
Synchrotron Powder Diffraction ◽  
Orthorhombic Perovskite

Phase and structural behaviour in the SmAlO3–TbAlO3system has been studied in a whole concentration range by means of laboratory X-ray diffraction,in situhigh temperature synchrotron powder diffraction and differential thermal analysis. Formation of the continuous solid solution Sm1−xTbxAlO3with the orthorhombic perovskite structure (space groupPbnm) has been established. Peculiarity of the investigated system is lattice parameter crossovers resulted in the existence of three regions with different relations of the lattice parameters. Based on the results obtained, as well as an available literature data for the “pure” SmAlO3and TbAlO3, a phase diagram of the pseudo-binary SmAlO3–TbAlO3system has been constructed.

scholarly journals Evaluation of Weld Filler Alloying Concepts for Residual Stress Engineering by Means of Neutron and X-Ray Diffraction

2014 ◽  
Vol 996 ◽  
pp. 469-474 ◽  
Author(s):  
Arne Kromm
Keyword(s):  
Residual Stress ◽  
Residual Stresses ◽  
Stress Reduction ◽  
Maximum Stress ◽  
Lattice Parameter ◽  
Filler Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Stress Control ◽  
Surface Areas

Novel Low Transformation Temperature (LTT-) filler materials are specially designed for controlling residual stresses by means of adjusted martensite formation already during welding. Different alloying concepts compete for maximum stress reduction. Two newly developed LTT-alloys were evaluated concerning their potential for residual stress control. For this purpose residual stresses were determined in the surface and also in sub-surface areas of welded joints using X-ray diffraction and Neutron diffraction taking into account local variations of the unstrained lattice parameter.

Internal Stress In Sputtered Silver Nickel Thin Films And Multilayers: Sputtering Pressure And Thickness Effects

1999 ◽  
Vol 562 ◽  
Author(s):  
P. Gergaud ◽  
H. Yang ◽  
C. PéLissonnier-Grosjean ◽  
A. J. Bottger ◽  
P. Sandström ◽  
...  
Keyword(s):  
Thin Films ◽  
Internal Stress ◽  
Layer Thickness ◽  
Lattice Parameter ◽  
Free Lattice ◽  
Silicon Substrates ◽  
X Ray Diffraction ◽  
Nickel Thin Films ◽  
The Individual ◽  
20 Nm

ABSTRACTNanometer thick films are often in a state of high residual stress. This may strongly influence physical properties such as magnetic anisotropy. The aim of our study is to investigate whether the overall stress in multilayers may be tailored via the control of the sputtering parameters or of the individual thicknesses. The coatings investigated were deposited at room temperature by magnetron sputtering on oxidised silicon substrates. Ag/Ni multilayers of superperiod between 4 to 20 nm and thin films (Ag or Ni) 200 nm thick have been deposited under a krypton partial pressure varying between 1 and 8 mTorr. Internal stress measurements were performed by curvature method and x-ray diffraction sin2ψ method. The latter one allows the determination of the stress and of the stress-free lattice parameter in the Ag or the Ni layers whereas the first one gives rise to a measure of the average stress in the coating. The main results are the followings: (i) The stress in Ni thin films changes from compressive to tensile at a pressure between 2 and 5 mTorr whereas Ag thin films are sligthly tensile whatever the pressure; (ii) The stress in multilayers is tensile in Ag and Ni and decreases with sublayer thickness; (iii) The stress free lattice parameter of Ag in thin films or multilayers is independent of the Kr pressure and of the layer thickness and is equal to the bulk value; (iv) On the opposite, the stress-free lattice parameter of nickel decreases with the layer thickness in multilayers and is equal to the bulk value in thin films. These results are discussed in terms of the respective influence of interfacial intermixing and atomic peening mechanism.

AlGaN Solid Solution Grown on 3C-SiC(111)/Si(111) Pseudosubstrates

2013 ◽  
Vol 740-742 ◽  
pp. 103-106
Author(s):  
Katja Tonisch ◽  
Robert Benzig ◽  
Gernot Ecke ◽  
Jörg Pezoldt
Keyword(s):  
Solid Solution ◽  
Residual Stress ◽  
Hydrostatic Pressure ◽  
Lattice Distortion ◽  
Biaxial Tension ◽  
X Ray Diffraction ◽  
Grown Layer ◽  
X Ray ◽  
Infrared Ellipsometry ◽  
Layer Composition

The growth of AlGaN solid solutions on 3C-SiC(111)/Si(111) is demonstrated. The residual stress of the grown layer was investigated by high resolution X-ray diffraction (HRXRD) and infrared ellipsometry. Analysis of the HRXRD data showed that the observed lattice distortion was caused partially by hydrostatic pressure and partially by biaxial tension. The residual stress depends on the layer composition and weakly on the growth temperature.

Study of Aluminium-Titanate Based Ceramics in Fe2O3-Al2O3-TiO2 System

2010 ◽  
Vol 659 ◽  
pp. 31-36
Author(s):  
Támas Korim
Keyword(s):  
Heat Treatment ◽  
Solid Solution ◽  
Lattice Parameter ◽  
Self Healing ◽  
X Ray Diffraction ◽  
Repeated Heating ◽  
X Ray ◽  
Aluminium Titanate ◽  
Complete Solid Solution ◽  
Constructed Self

Solid solutions formed within the Al2O3-TiO2-Fe2O3 (Fe2xAl2(1-x)TiO5) system upon heat treatment were investigated by adjusting the substituting Fe3+ content in the range of x=0.0 to 1.0. X-ray diffraction phase analyses and lattice parameter determinations confirmed that substitution of Fe3+ ions within the aluminium titanate lattice was complete. For this complete solid solution, however, the trends observed for changes in d-spacing values indicated that there were certain discrete compositions to identify with Fe3+ substitution. Within these, Fe0.4Al1.6TiO5 and Fe1.6Al0.4TiO5 crystalline phases were investigated in detail and their X-ray diffraction cards were constructed. Self-healing effect occurring in repeated heating-cooling cycles in Fe3+ doped AT ceramics were proved; it was demonstrated that Fe3+ doped AT ceramics do not decompose even if exposed to repeated thermal shock.

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