Rapid Thermal Processing for Strained-Layer Semiconductor Devices

1993 ◽  
Vol 303 ◽  
Author(s):  
John C. Zolper ◽  
David R. Myers

ABSTRACTStrained-layer semiconductors have revolutionized modern heterostructure devices by exploiting the modification of semiconductor band structure associated with the coherent strain of lattice-mismatched heteroepitaxy. The modified band structure improves transport of holes in heterostructures and enhances the operation of semiconductor lasers. Strainedlayer epitaxy also can create materials whose band gaps match wavelengths (e. g. 1.06 μm and 1.32 μm) not attainable in ternary epitaxial systems lattice matched to binary substrates. Other benefits arise from metallurgical effects of modulated strain fields on dislocations.Lattice mismatched epitaxial layers that exceed the limits of equilibrium thermodynamics will degrade under sufficient thermal processing by converting the as-grown coherent epitaxy into a network of strain-relieving dislocations. After presenting the effects of strain on band structure, we describe the stability criterion for rapid-thermal processing of strained-layer structures and the effects of exceeding the thermodynamic limits. Finally, device results are reviewed for structures that benefit from high temperature processing of strained-layer superlattices.

1993 ◽  
Vol 300 ◽  
Author(s):  
John C. Zolper ◽  
David R. Myers

ABSTRACTStrained-layer semiconductors have revolutionized modern heterostructure devices by exploiting the modification of semiconductor band structure associated with the coherent strain of lattice-mismatched heteroepitaxy. The modified band structure improves transport of holes in heterostructures and enhances the operation of semiconductor lasers. Strainedlayer epitaxy also can create materials whose band gaps match wavelengths (e. g. 1.06 μm and 1.32 μm) not attainable in ternary epitaxial systems lattice matched to binary substrates. Other benefits arise from metallurgical effects of modulated strain fields on dislocations.Lattice mismatched epitaxial layers that exceed the limits of equilibrium thermodynamics will degrade under sufficient thermal processing by converting the as-grown coherent epitaxy into a network of strain-relieving dislocations. After presenting the effects of strain on band structure, we describe the stability criterion for rapid-thermal processing of strained-layer structures and the effects of exceeding the thermodynamic limits. Finally, device results are reviewed for structures that benefit from high temperature processing of strained-layer superlattices.


1992 ◽  
Vol 71 (4) ◽  
pp. 1842-1845 ◽  
Author(s):  
Lifeng Liu ◽  
G. S. Lee ◽  
A. H. Marshak

1988 ◽  
Vol 130 ◽  
Author(s):  
D. C. Houghton ◽  
J-M. Baribeau ◽  
K. Song ◽  
D. D. Perovic

AbstractThe structural stability of strained layer superlattices (SLS's) is addressed using an equilibrium model and then compared to the stability of single strained layers. Relaxation mechanisms are described for various superlattice geometries. The application of a critical thickness/strain criterion to define stability limits was found to be very useful in predicting the detailed relaxation process. The competition between relaxation by misfit accommodation at the base of the SLS and at individual strained interfaces is considered for the initial condition of full coherency and after partial relaxation. Experimental data for the Si-Ge strained layer system are presented; as-grown by MBE and after annealing in the temperature range 500°C – 900°C. The extent of relaxation and the detailed dislocation structure within the SLS's were determined by X-ray rocking curve analysis, Nomarski interference microscopy and transmission electron microscopy. The abrupt changes in relaxation behaviour indicate that rigid boundaries between stable and metastable structures do exist, as predicted by the equilibrium models.


1988 ◽  
Vol 53 (3) ◽  
pp. 216-218 ◽  
Author(s):  
S. R. Kurtz ◽  
G. C. Osbourn ◽  
R. M. Biefeld ◽  
S. R. Lee

1990 ◽  
Vol 7 (4) ◽  
pp. 359-361 ◽  
Author(s):  
K.P. Homewood ◽  
W.P. Gillin ◽  
R.E. Pritchard ◽  
W.S. Truscott ◽  
K.E. Singer

1989 ◽  
Vol 146 ◽  
Author(s):  
K. H. Jung ◽  
Y. M. Kim ◽  
H. G. Chun ◽  
D. L. Kwong ◽  
L. Rabenberg

ABSTRACTRapid thermal processing chemical vapor deposition was used to grow single and multilaye repitaxial GexSil-x/Si structures on (100)Si substrates using GeH4 and SiH2Cl2 at 900°C and 1000°C with SiH2Cl2:GeH4 ratios of 14:1 to 95:1 at 5 Torr. Misfit dislocation free layers with few threading dislocations were grown for Ge concentrations of up to 13%. Misfit dislocation networks aligned along <110> were formed at the interface of films with higher Ge concentrations. Dislocation loops were also found at the interface. GexSil-x layers grown at 1000°C were highly crystalline, but relaxed. In multi-layer structures, AES depth profiles showed Ge pile-up at the GexSi1-x/Si interface of layers with higher Ge concentrations.


1987 ◽  
Vol 48 (C5) ◽  
pp. C5-321-C5-327 ◽  
Author(s):  
H. BRUGGER ◽  
G. ABSTREITER

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