Effects of Deliberate Metal Contamination on CCD Imagers

1992 ◽  
Vol 262 ◽  
Author(s):  
William C. McColgin ◽  
J. P. Lavine ◽  
J. Kyan ◽  
D. N. Nichols ◽  
J. B. Russell ◽  
...  

ABSTRACTThe effects of intentional metal contamination on silicon charge-coupled device imagers are reported. Such imagers are both sensitive to and provide sensitive measures of the presence of metals in the fabrication process. High-purity iron, cobalt, nickel, copper, palladium, and gold were deliberately introduced into the device wafers just before the last high temperature step. Metals were found to cause both electrical defects and distinctive imaging defects.We find that transition metals can be effectively removed from device regions by internal gettering, but that this gettering can be defeated by a fast cool-down. Gold, however, is poorly gettered.

2021 ◽  
Vol 2 (1) ◽  
pp. 63-73
Author(s):  
Jéssica D. S. Vicente ◽  
Domingas C. Miguel ◽  
Afonso M. P. Gonçalves ◽  
Diogo M. Cabrita ◽  
José M. Carretas ◽  
...  

Ionic liquids are critical reagents for science and technical processes nowadays. Metals are the most used reagents in the industry. It is crucial to have a deeper understanding of how ionic liquids and metals could interact. In this article the interaction of those two families of compounds is accessed. The dissolution (reaction) of metals with ionic liquids is studied, namely the influence of temperature, redox potential, and availability of an oxidant in the process. The final state achieved by the iron metal samples was also addressed by Mössbauer spectroscopy.


1971 ◽  
Vol 15 ◽  
pp. 407-423 ◽  
Author(s):  
Jerome L. Duggan ◽  
William L. Beck ◽  
Larry Albrecht ◽  
Lee Munz ◽  
James D. Spaulding

Characteristic x rays have been produced for a variety of samples by bombardment with protons in the energy range from 75 keV to 5 MeV. The experiments were performed with two accelerators. For the low-energy studies (less than 150 keV), a Cockcroft-Walton accelerator was used. The higher-energy studies were done with a 5 MV Van de Graaff. The x rays were measured with high-resolution Si(Li) and Ge(Li) detectors. Yields for the cross section of characteristic K- and L-shell ionizations were measured for titanium, vanadium, chromium, manganeses iron, cobalt, nickel, copper, silver, gold, bismuth, and uranium. The experimental cross-sections have been compared to the theoretical predictions of the Born approximation for an interaction of this type.Trace element analysis by 4-MeV proton bombardment of samples in the 10-12 gm range has also been performed. Some comments with regard to analysis with these sensitivities will be made.


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