Infrared Photoconductivity and Photoluminescence from InAs/Ga1–xInxSb Strained-Layer Superlattices

1990 ◽  
Vol 198 ◽  
Author(s):  
R. H. Miles ◽  
D. H. Chow ◽  
T. C. Mcgill

ABSTRACTWe have examined spectrally resolved photoconductivity and photoluminescence from InAs/Ga1–xInxSb strained-layer superlattices, which have been proposed as infrared detectors in the 8-14 μm region. Our measurements indicate that the energy gaps of the strained–layer superlattices are substantially smaller than those of InAs/GaSb superlattices with similar layer thicknesses, in agreement with previous theoretical predictions. Measurements on InAs/Ga1–xInxSb superlattices with x=0 and 0.25 and layer thicknesses of 25 – 45 A indicate superlattice band gaps of 3 – 15 μm, in excellent agreement with gaps calculated by a two band k · p model. Our results demonstrate that far-infrared energy gaps are compatible with the thin layers necessary for strong optical absorption in type-IT superlattices, and suggest that InAs/Ga1–xInxSb superlattices are promising candidates for far-infrared detection.

2013 ◽  
Vol 59 ◽  
pp. 72-77 ◽  
Author(s):  
Nutan Gautam ◽  
Stephen Myers ◽  
Ajit V. Barve ◽  
Brianna Klein ◽  
E.P. Smith ◽  
...  

1983 ◽  
Vol 43 (8) ◽  
pp. 759-761 ◽  
Author(s):  
R. M. Biefeld ◽  
P. L. Gourley ◽  
I. J. Fritz ◽  
G. C. Osbourn

1990 ◽  
Vol 216 ◽  
Author(s):  
Steven R. Kurtz

ABSTRACTAn overview is provided of long wavelength, photovoltaic detectors constructed with type II (also known as “staggered”), III-V superlattices. Specifically, the electronic properties of InAsSb strained-layer superlattices and prototype detectors utilizing these structures are described.


1985 ◽  
Vol 56 ◽  
Author(s):  
P. L. GOURLEY ◽  
R. M. BIEFELD ◽  
L. R. DAWSON

AbstractWe have developed a convenient photoluminescence microimaging technique to probe misfit dislocations in epitaxially grown semiconductor alloys and multilayers. Using this technique, we have examined the microscopic optical quality of thick (~ 1 μm ) III-V semiconductor epitaxial layers, mismatched to their substrates. The layers includeseveral kinds of [100] strained-layer superlattices (GaP/GaAsxP1-x on GaP and GaAs/GaAs. P on GaAs grown by MOCVD, and GaAs/In Ga1-x As on GaAs grown by MBE) and associated alloys. For each type of superlalti e, we have studied a large number of samples corresponding to different compositions and layer thicknesses. The results show that misfit dislocations can be completely eliminated in the uppermost layers of the strained-layer superlattices if these structures have thin layers, less than the critical thickness for elastic accommodation, and sufficient numbers of interfaces to block threading dislocations.


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