Measurement of Micromechanical Properties Using Atomic Force Microscope with Capacitative

1989 ◽  
Vol 153 ◽  
Author(s):  
Gabi Neubauer ◽  
Sidney R. Cohen ◽  
Gary M. McClelland
Keyword(s):  
Atomic Force Microscope ◽  
Simultaneous Measurement ◽  
Low Noise ◽  
Preliminary Results ◽  
Micromechanical Properties ◽  
Atomic Force ◽  
New Instrument

AbstractA new UHV atomic force microscope for the study of micromechanical properties is described. A capacitance technique is used, which enables simultaneous measurement of forces perpendicular and parallel to the surface (i.e., load and friction), and has low noise down to frequencies below 0.1 Hz. Preliminary results for Ir- and W-tips sliding on graphite and silicon, respectively, demonstrate the capabilities of this new instrument.

Ergonomics for the Invisible

2012 ◽  
Vol 20 (2) ◽  
pp. 18-23
Author(s):  
Vadim Val-Khvalabov ◽  
Mike Nelson
Keyword(s):  
Economic Development ◽  
Research And Development ◽  
Atomic Force Microscope ◽  
Major Area ◽  
Initial Product ◽  
Research Education ◽  
Nanotechnology Research ◽  
Atomic Force ◽  
New Instrument ◽  
Potential Customers

Nanotechnology represents a major area for research and development and has already led to the introduction of hundreds of products that incorporate nanotechnology-based materials, components, or methods. It is an area of significant investment and economic development globally. NanoInk, Inc. designs and develops instrument systems used for nanotechnology research, education, and manufacturing. Our initial product was built to support sophisticated research programs in academic and government labs. It was based on a complex instrument that was difficult to learn and use: the atomic force microscope (AFM). In order to make our technology accessible and useful to a broader range of potential customers and markets, NanoInk developed a new instrument platform, NLP 2000, that is simpler to learn and operate by users who are not university-trained PhDs. This article will discuss several of the challenges, design goals, and approaches taken in developing this instrument platform.

Determination of micromechanical properties of thin films by beam bending measurements with an atomic force microscope

1999 ◽  
Vol 74 (1-3) ◽  
pp. 134-138 ◽  
Author(s):  
C. Serre ◽  
A. Pérez-Rodrı́guez ◽  
J.R. Morante ◽  
P. Gorostiza ◽  
J. Esteve
Keyword(s):  
Thin Films ◽  
Atomic Force Microscope ◽  
Micromechanical Properties ◽  
Atomic Force ◽  
Beam Bending

Measurement of micromechanical properties of polysilicon microstructures with an atomic force microscope

1998 ◽  
Vol 67 (1-3) ◽  
pp. 215-219 ◽  
Author(s):  
C. Serre ◽  
P. Gorostiza ◽  
A. Pérez-Rodríguez ◽  
F. Sanz ◽  
J.R. Morante
Keyword(s):  
Atomic Force Microscope ◽  
Micromechanical Properties ◽  
Atomic Force

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

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