Combined SEM (secondary electrons, backscatter, cathodoluminescence) and atomic force microscope investigation of fracture surfaces in Martian meteorite ALH84001: preliminary results

1998 ◽  
Author(s):  
Frances Westall ◽  
Pier Giorgio Gobbi ◽  
Giovanni Mazzoti ◽  
Dane Gerneke ◽  
Robert W. Stark ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Secondary Electrons ◽  
Microscope Investigation ◽  
Preliminary Results ◽  
Fracture Surfaces ◽  
Martian Meteorite ◽  
Atomic Force

Atomic force microscope investigation of large-circle DNA molecules

2004 ◽  
Vol 325 (2) ◽  
pp. 293-300 ◽  
Author(s):  
Aiguo Wu ◽  
Lihua Yu ◽  
Zhuang Li ◽  
Huanming Yang ◽  
Erkang Wang
Keyword(s):  
Atomic Force Microscope ◽  
Dna Molecules ◽  
Large Circle ◽  
Microscope Investigation ◽  
Atomic Force

Atomic force microscope investigation of C60adsorbed on silicon and mica

1993 ◽  
Vol 63 (7) ◽  
pp. 891-893 ◽  
Author(s):  
T. Thundat ◽  
R. J. Warmack ◽  
D. Ding ◽  
R. N. Compton
Keyword(s):  
Atomic Force Microscope ◽  
Microscope Investigation ◽  
Atomic Force

Using fractal dimensions to characterize atomic force microscope images of epoxy resin fracture surfaces

Scanning ◽  
2006 ◽  
Vol 20 (2) ◽  
pp. 99-103 ◽  
Author(s):  
Tom Joseph ◽  
Zheng Chen ◽  
J. J. Mecholsky ◽  
Charles Beatty
Keyword(s):  
Atomic Force Microscope ◽  
Epoxy Resin ◽  
Fractal Dimensions ◽  
Fracture Surfaces ◽  
Atomic Force ◽  
Microscope Images

Glass fracture surfaces seen with an atomic force microscope

1997 ◽  
Vol 358 (1-2) ◽  
pp. 349-351 ◽  
Author(s):  
C. Wünsche ◽  
Edda Rädlein ◽  
Günther Heinz Frischat
Keyword(s):  
Atomic Force Microscope ◽  
Fracture Surfaces ◽  
Atomic Force ◽  
Glass Fracture

scholarly journals Atomic force microscope investigation of the boundary-lubricant layer in articular cartilage

2010 ◽  
Vol 18 (7) ◽  
pp. 956-963 ◽  
Author(s):  
S.M.T. Chan ◽  
C.P. Neu ◽  
G. DuRaine ◽  
K. Komvopoulos ◽  
A.H. Reddi
Keyword(s):  
Articular Cartilage ◽  
Atomic Force Microscope ◽  
Lubricant Layer ◽  
Microscope Investigation ◽  
Atomic Force ◽  
Boundary Lubricant

Measurement of Micromechanical Properties Using Atomic Force Microscope with Capacitative

1989 ◽  
Vol 153 ◽  
Author(s):  
Gabi Neubauer ◽  
Sidney R. Cohen ◽  
Gary M. McClelland
Keyword(s):  
Atomic Force Microscope ◽  
Simultaneous Measurement ◽  
Low Noise ◽  
Preliminary Results ◽  
Micromechanical Properties ◽  
Atomic Force ◽  
New Instrument

AbstractA new UHV atomic force microscope for the study of micromechanical properties is described. A capacitance technique is used, which enables simultaneous measurement of forces perpendicular and parallel to the surface (i.e., load and friction), and has low noise down to frequencies below 0.1 Hz. Preliminary results for Ir- and W-tips sliding on graphite and silicon, respectively, demonstrate the capabilities of this new instrument.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

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