Cobalt-Germanium Contacts to n-Type GaAs Electrical and Metallurgical Aspects

1988 ◽  
Vol 144 ◽  
Author(s):  
M. Genut ◽  
M. Eizenberg

ABSTRACTThe correlation between the microstructure and phase formation, and the electrical properties for the Co/GaAs, Co/Ge/GaAs and Ge/Co/GaAs systems have been studied. The microstructural analysis was carried out by transmission electron microscopy, and the component redistribution was determined by Auger electron spectroscopy. The electrical properties (Schottky barrier height and contact resistivity) were studied by means of current-voltage and capacitance-voltage measurements.

1992 ◽  
Vol 7 (10) ◽  
pp. 2765-2773 ◽  
Author(s):  
T.C. Chou ◽  
T.G. Nieh ◽  
T.Y. Tsui ◽  
G.M. Pharr ◽  
W.C. Oliver

Artificial multilayers, or microlaminates, composed of alternating layers of Nb and MoSi2 of equal thickness were synthesized by d.c., magnetron sputtering. Four different modulation wavelengths, λ, were studied: 7, 11, 20, and 100 nm. The compositions, periodicities, and microstructures of the microlaminates were characterized by Auger electron spectroscopy and transmission electron microscopy. Structural characterization revealed that the as-deposited Nb layers are polycrystalline, while the MoSi2 layers are amorphous. The hardnesses and elastic moduli of the films were measured using nanoindentation techniques. Neither a supermodulus nor a superhardness effect could be identified in the range of wavelengths investigated; for each of the microlaminates, both the hardness and modulus were found to fall between the bounds set by the properties of the monolithic Nb and MoSi2 films. Nevertheless, a modest but a measurable increase in both hardness and modulus with decreasing wavelength was observed, thus indicating that behavior cannot be entirely described by a simple rule-of-mixtures. The hardness was found to vary linearly with Δ−1/2 in a manner similar to the Hall–Petch relationship. Annealing the microlaminates at 800 °C for 90 min produces significant increases in hardness and modulus due to chemical interaction of the layers.


2000 ◽  
Vol 649 ◽  
Author(s):  
M. Kunert ◽  
B. Baretzky ◽  
S. P. Baker ◽  
E. J. Mittemeijer

ABSTRACTThe variations of hardness, composition, and microstructure within a carbon implanted region – about 350 nm thick – of a Ti-6Al-4V alloy were measured using nanoindentation, Auger electron spectroscopy and transmission electron microscopy, respectively. Correlations among hardness, composition, and microstructure were made with a spatial resolution of about ±20 nm. The variation in hardness within the implanted regions was quantitatively explained as due to the formation of an almost continuous TiC layer and precipitate hardening. The problems that may arise in measuring and correlating spatial variations in such a complex material on this scale are outlined and a successful method to solve them is proposed. The need for highly spatially resolved measurement techniques is emphasized.


RSC Advances ◽  
2016 ◽  
Vol 6 (86) ◽  
pp. 82459-82466 ◽  
Author(s):  
Mohamad Saufi Rosmi ◽  
Yazid Yaakob ◽  
Mohd Zamri Mohd Yusop ◽  
Subash Sharma ◽  
Ritesh Vishwakarma ◽  
...  

Herein, we present a direct observation of the formation of graphene from a single copper–carbon nanoneedle (Cu–CNN) during the measurement of current–voltage (I–V) and direct heating via in situ transmission electron microscopy (TEM).


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