Surface Roughness and Correlation Length Determined from X-Ray Diffraction Line Shape Analysis on Germanium (111)

1988 ◽  
Vol 143 ◽  
Author(s):  
Q. Shen ◽  
J. M. Blakely ◽  
M. J. Bedzyk ◽  
K. D. Finkelstein
Keyword(s):  
Surface Roughness ◽  
Shape Analysis ◽  
Flat Surface ◽  
Polished Surface ◽  
Diffraction Experiment ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis ◽  
Crystal Truncation Rod ◽  
Lateral Scale

AbstractIn an x-ray diffraction experiment performed on a germanium (111) crystal, both the rod-like and the diffuse-like scattering from the surface have been observed on a nonspecular crystal truncation rod. These scattering contributions can be explained using existing theory on surface roughness. Two treatments to the Ge (111) surface have been used to provide examples with different roughness characteristics for this study. Quantitative analysis results in a surface roughness of 2.5+0.3Å for a clean surface passivated with iodine and 4.3+0.5Å for a Syton polished surface covered with a naturally grown oxide layer. A typical lateral scale of flat surface regions has also been obtained from the transverse width of the diffuse-like scattering peak, and found to be 200 A and 400 Å respectively.

Atomic structure and faulted boundaries in the GaAs(001)β(2×4)surface as derived from x-ray diffraction and line-shape analysis

1996 ◽  
Vol 54 (24) ◽  
pp. 17638-17646 ◽  
Author(s):  
Y. Garreau ◽  
M. Sauvage-Simkin ◽  
N. Jedrecy ◽  
R. Pinchaux ◽  
M. B. Veron
Keyword(s):  
Shape Analysis ◽  
Atomic Structure ◽  
Line Shape ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis

Silicate-germanate K2Y[(Si3Ge)O10(OH)] with unusual complex corrugated layer and its correlation to ring silicate gerenite and chain silicate chkalovite

2020 ◽  
Vol 235 (4-5) ◽  
pp. 167-172
Author(s):  
Anastasiia P. Topnikova ◽  
Elena L. Belokoneva ◽  
Olga V. Dimitrova ◽  
Anatoly S. Volkov ◽  
Leokadiya V. Zorina
Keyword(s):  
Low Temperature ◽  
Cross Section ◽  
Complex Anion ◽  
Diffraction Experiment ◽  
X Ray Diffraction ◽  
Unit Cell Parameters ◽  
X Ray ◽  
Cell Parameters ◽  
Chain Silicate ◽  
Novel Complex

AbstractA new silicate-germanate K2Y[(Si3Ge)O10(OH)] was synthesized hydrothermally in a system Y2O3:GeO2:SiO2 = 1:1:2 (T = 280 °C; P = 90–100 atm.); K2CO3 was added to the solution as a mineralizer. Single-crystal X-ray diffraction experiment was carried out at low temperature (150 K). The unit cell parameters are a = 10.4975(4), b = 6.9567(2), c = 15.4001(6) Å, β = 104.894(4)°; V = 1086.86(7) Å3; space group is P 21/c. A novel complex anion is presented by corrugated (Si,Ge) tetrahedral layers connected by couples of YO6 octahedra into the mixed microporous framework with the channels along b and a axes, the maximal size of cross-section is ~5.6 Å. This structure has similarity with the two minerals: ring silicate gerenite (Ca,Na)2(Y,REE)3Si6O18 · 2H2O and chain silicate chkalovite Na2BeSi2O6. Six-member rings with 1̅ symmetry as in gerenite are distinguished in the new layer. They are mutually perpendicular to each other and connected by additional tetrahedra. Straight crossing chains in chkalovite change to zigzag four-link chains in the new silicate-germanate layer.

scholarly journals Silica-Kaolin Mix Effect on Evaporative Pattern Castings Surface Roughness

2016 ◽  
Vol 16 (3) ◽  
pp. 83-88 ◽  
Author(s):  
B.V. Omidiji ◽  
R.H. Khan ◽  
M.S. Abolarin
Keyword(s):  
Thermal Analysis ◽  
Surface Roughness ◽  
Differential Thermal Analysis ◽  
Ratio Method ◽  
Gating System ◽  
X Ray Diffraction ◽  
Pouring Temperature ◽  
Material Loss ◽  
Refractory Coating ◽  
X Ray

Abstract The influence of the refractory coating which is a mixture of silica flour and kaolin on the surface roughness of the plate castings produced using evaporative patterns had been considered in this work. The kaolin was used as a binder and ratio method was employed to form basis for the factorial design of experiment which led to nine runs of experiments. Methyl alcohol at 99% concentration was used as the carrier for the transfer of the coating to the surface of the patterns. Pouring temperature was observed as a process parameter alongside the mix ratios of the coating. Attempts were made to characterize the refractory coating by using two methods; differential thermal analysis (DTA) and X-ray diffraction. Attempt was also made to characterize the casting material. Gating system design was done for the plate casting to determine the correct proportions of the gating parameters in order to construct the gating system properly to avoid turbulence during pouring of liquid metal. A digital profilometer was used to take the measurements of the surface roughness. It was observed that the mix ratio 90% silica flour-10% kaolin produced the lowest value of the surface roughness of the plate castings and had the lowest material loss in the DTA test. The pouring temperature of 650°C produced best casting.

Synthesis and Properties of Sb Layered Te/Cd Stack Prepared by Elemental Stack Method

2012 ◽  
Vol 488-489 ◽  
pp. 76-81 ◽  
Author(s):  
Subramani Shanmugan ◽  
Mutharasu Devarajan ◽  
Kamarulazizi Ibrahim
Keyword(s):  
Thin Films ◽  
Chemical Composition ◽  
Surface Morphology ◽  
Shape Analysis ◽  
Structural Parameters ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electrical Studies ◽  
Sb Doping ◽  
Elemental Layer

Sb layered Te/Cd thin films have been prepared by using Stacked Elemental Layer (SEL) method. The presence of mixed phases (CdTe and Sb2Te3) in the films was confirmed by the x-ray diffraction technique. The calculated structural parameters demonstrated the feasibility of Sb doping via SEL method. The topographical and electrical studies of the synthesized thin films depicted the influence of Sb on both surface morphology and conductivity. The values of conductivity of the annealed films were in between 2 x 10-3 and 175 x 10-2 Scm-2. A desired chemical composition of films was confirmed from spectrum shape analysis using energy dispersive x-ray.

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