Line-Shape Analysis of High Resolution X-Ray Diffraction Spectra of Finite Size Thue-Morse GaAs-AlAs Multilayer Heterostructures

1995 ◽  
Vol 5 (1) ◽  
pp. 111-127 ◽  
Author(s):  
Jacques Peyrière ◽  
Eric Cockayne ◽  
Françoise Axel
Keyword(s):  
High Resolution ◽  
Shape Analysis ◽  
Line Shape ◽  
Finite Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis ◽  
Multilayer Heterostructures

Atomic structure and faulted boundaries in the GaAs(001)β(2×4)surface as derived from x-ray diffraction and line-shape analysis

1996 ◽  
Vol 54 (24) ◽  
pp. 17638-17646 ◽  
Author(s):  
Y. Garreau ◽  
M. Sauvage-Simkin ◽  
N. Jedrecy ◽  
R. Pinchaux ◽  
M. B. Veron
Keyword(s):  
Shape Analysis ◽  
Atomic Structure ◽  
Line Shape ◽  
X Ray Diffraction ◽  
X Ray ◽  
Line Shape Analysis

On line shape analysis in X-ray photoelectron spectroscopy

2001 ◽  
Vol 470 (3) ◽  
pp. 325-336 ◽  
Author(s):  
Wolfgang S.M. Werner ◽  
Thomas Cabela ◽  
Josef Zemek ◽  
Petr Jiricek
Keyword(s):  
Shape Analysis ◽  
Photoelectron Spectroscopy ◽  
Line Shape ◽  
X Ray ◽  
Line Shape Analysis ◽  
On Line
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