Study of superficial stress gradients by computer simulation and x-ray diffraction experiment

2008 ◽  
Author(s):  
Joaquim T. Assis ◽  
Vladimir I. Monin ◽  
Susana M. Iglesias
Keyword(s):  
Computer Simulation ◽  
Diffraction Experiment ◽  
X Ray Diffraction ◽  
X Ray ◽  
Stress Gradients

Silicate-germanate K2Y[(Si3Ge)O10(OH)] with unusual complex corrugated layer and its correlation to ring silicate gerenite and chain silicate chkalovite

2020 ◽  
Vol 235 (4-5) ◽  
pp. 167-172
Author(s):  
Anastasiia P. Topnikova ◽  
Elena L. Belokoneva ◽  
Olga V. Dimitrova ◽  
Anatoly S. Volkov ◽  
Leokadiya V. Zorina
Keyword(s):  
Low Temperature ◽  
Cross Section ◽  
Complex Anion ◽  
Diffraction Experiment ◽  
X Ray Diffraction ◽  
Unit Cell Parameters ◽  
X Ray ◽  
Cell Parameters ◽  
Chain Silicate ◽  
Novel Complex

AbstractA new silicate-germanate K2Y[(Si3Ge)O10(OH)] was synthesized hydrothermally in a system Y2O3:GeO2:SiO2 = 1:1:2 (T = 280 °C; P = 90–100 atm.); K2CO3 was added to the solution as a mineralizer. Single-crystal X-ray diffraction experiment was carried out at low temperature (150 K). The unit cell parameters are a = 10.4975(4), b = 6.9567(2), c = 15.4001(6) Å, β = 104.894(4)°; V = 1086.86(7) Å3; space group is P 21/c. A novel complex anion is presented by corrugated (Si,Ge) tetrahedral layers connected by couples of YO6 octahedra into the mixed microporous framework with the channels along b and a axes, the maximal size of cross-section is ~5.6 Å. This structure has similarity with the two minerals: ring silicate gerenite (Ca,Na)2(Y,REE)3Si6O18 · 2H2O and chain silicate chkalovite Na2BeSi2O6. Six-member rings with 1̅ symmetry as in gerenite are distinguished in the new layer. They are mutually perpendicular to each other and connected by additional tetrahedra. Straight crossing chains in chkalovite change to zigzag four-link chains in the new silicate-germanate layer.

Formalism for the determination of intermediate stress gradients using X-ray diffraction

2009 ◽  
Vol 42 (2) ◽  
pp. 192-197 ◽  
Author(s):  
Thomas Gnäupel-Herold
Keyword(s):  
Lattice Strain ◽  
Narrow Line ◽  
X Ray Diffraction ◽  
Beam Spot ◽  
Strain Measurements ◽  
One Dimensional ◽  
X Ray ◽  
Stress Gradients ◽  
Shaped Beam

A method is outlined that allows the determination of one-dimensional stress gradients at length scales greater than 0.2 mm. By using standard four-circle X-ray diffractometer equipment and simple aperture components, length resolutions down to 0.05 mm in one direction can be achieved through constant orientation of a narrow, line-shaped beam spot. Angle calculations are given for the adjustment of goniometer angles, and for the effective azimuth and tilt of the scattering vector for general angle settings in a four-circle goniometer. The latter is necessary for the computation of stresses from lattice strain measurements.

Revision and extension of the standard laboratory technique for X-ray diffraction measurement of residual stress gradients

2007 ◽  
Vol 40 (4) ◽  
pp. 675-683 ◽  
Author(s):  
Cristy L. Azanza Ricardo ◽  
Mirco D'Incau ◽  
Paolo Scardi
Keyword(s):  
Residual Stress ◽  
Hole Drilling ◽  
Al Alloy ◽  
Diffraction Measurement ◽  
X Ray Diffraction ◽  
Surface Residual Stress ◽  
X Ray ◽  
Stress Gradients ◽  
Layer Removal ◽  
Removal Technique

A new procedure is proposed to determine sub-surface residual stress gradients by laboratory X-ray diffraction measurements at different depths using a chemical layer-removal technique. The standard correction algorithm for stress relaxation due to layer removal is improved by including corrections for X-ray absorption, and by the addition of constraints imposed by the mechanical equilibrium conditions. Besides correcting the data,i.e.providing more reliable through-thickness residual stress trends, the proposed procedure also provides an elastically compatible and plausible estimate of the residual stress inside the component, well beyond the measured region. The application of the model is illustrated for a set of Al-alloy components shot-peened at different Almen intensities. Results are compared with those given by `blind hole drilling', which is an independent and partly destructive method.

scholarly journals COMPUTER SIMULATION OF X-RAY DIFFRACTION PROFILES AND TEM DIFFRACTION PATTERNS ON ORDERING FOR Cu-4wt%Ti ALLOY

2000 ◽  
Vol 49 (5) ◽  
pp. 926
Author(s):  
WANG LIU-DING ◽  
CHEN CHANG-LE ◽  
LIU LIN ◽  
KANG MO-KUANG ◽  
JI BANG-JIE ◽  
...  
Keyword(s):  
Computer Simulation ◽  
Ti Alloy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Patterns

Disordered misfit [Ca2CoO3][CoO2]1.62 structure revisited via a new intrinsic modulation

2008 ◽  
Vol 64 (2) ◽  
pp. 144-153 ◽  
Author(s):  
Hervé Muguerra ◽  
Dominique Grebille ◽  
Françoise Bourée
Keyword(s):  
Electronic Structure ◽  
Single Crystal ◽  
Diffraction Experiment ◽  
X Ray Diffraction ◽  
Neutron Diffraction Experiment ◽  
X Ray ◽  
Structural Modifications ◽  
Local Ordering ◽  
Powder Neutron Diffraction ◽  
Modulation Vector

The structure of the thermoelectric lamellar misfit cobalt oxide [Ca2CoO3][CoO2]1.62 was refined again using single-crystal X-ray diffraction data. A new commensurate intrinsic modulation was observed involving a modulation vector orthogonal to the misfit direction (⅔,0,−⅓). The five-dimensional superspace group is C2/m(1δ0)(α0γ)gm and the structure was solved using a commensurate approximation. A new model is given involving an occupation modulation of the split sites of the [CoO] layer. This [CoO] layer can be described by triple chains running along b. The residual disorder along b can then be explained by the assumption of a local ordering with two types of clusters: CoO2 and Co5O4. A powder neutron diffraction experiment confirmed the ordering evidenced by the single-crystal X-ray diffraction study, but was not sufficient by itself to deal with this double modulated scheme. The new intrinsic modulation is destroyed by partial metal substitutions in the [CoO] layer. The structural modifications of this layer directly influence the physical properties which are related to the electronic structure of the [CoO2] layers.

On the atomic interdiffusion in Co/Pt superlattices

1992 ◽  
Vol 7 (6) ◽  
pp. 1309-1312 ◽  
Author(s):  
X. Yan ◽  
T. Egami ◽  
E.E. Marinero ◽  
R.F.C. Farrow ◽  
C.H. Lee
Keyword(s):  
Minor Component ◽  
Diffraction Experiment ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Peaks ◽  
Large Width ◽  
A Minor ◽  
Component Parallel

We have performed x-ray diffraction experiments on MBE grown 〈111〉 and 〈001〉 oriented Co (3 Å)/Pt (18 Å) superlattices with the scattering vector Q covering a plane that includes a major component perpendicular and a minor component parallel to the plane of the sample. The superlattice diffraction peaks were found to have a large width parallel to the plane of the film, indicating that there is strong in-plane disorder. These broad peaks were integrated to evaluate more accurately the amount of interdiffusion at the interface, which was found to be similar in both films, contrary to what the conventional x-ray diffraction experiment suggests.

Sign in / Sign up

Export Citation Format

Share Document