Hardness and Elastic Modulus Measurements in CdTe and ZnTe Thin Film and Bulk Samples and ZnTe-CdTe Superlattices

1988 ◽  
Vol 130 ◽  
Author(s):  
L. J. Farthing ◽  
T. P. Weihs ◽  
D. W. Kisker ◽  
J. J. Krajewski ◽  
M. F. Tang ◽  
...  
Keyword(s):  
Thin Film ◽  
Elastic Modulus ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Superlattice Structure ◽  
Alloying Effects

AbstractHardness and modulus values of bulk and epilayer ZnTe and CdTe samples and of ZnTe-CdTe superlattices are reported. Both hardness and Young's modulus values increase with increasing ZnTe content in the ZnCdTe samples. Alloying effects and strains in the superlattice structure are proposed to explain the strengthening.

Measurement of Young's Modulus and Poisson's Ratio of Thin Film by Combination of Bulge Test and Nano-Indentation

2008 ◽  
Vol 33-37 ◽  
pp. 969-974 ◽  
Author(s):  
Bong Bu Jung ◽  
Seong Hyun Ko ◽  
Hun Kee Lee ◽  
Hyun Chul Park
Keyword(s):  
Thin Film ◽  
Mechanical Properties ◽  
Young’S Modulus ◽  
Poisson’S Ratio ◽  
Young's Modulus ◽  
Applied Pressure ◽  
Indentation Test ◽  
Poisson's Ratio ◽  
Bulge Test ◽  
Nano Indentation

This paper will discuss two different techniques to measure mechanical properties of thin film, bulge test and nano-indentation test. In the bulge test, uniform pressure applies to one side of thin film. Measurement of the membrane deflection as a function of the applied pressure allows one to determine the mechanical properties such as the elastic modulus and the residual stress. Nano-indentation measurements are accomplished by pushing the indenter tip into a sample and then withdrawing it, recording the force required as a function of position. . In this study, modified King’s model can be used to estimate the mechanical properties of the thin film in order to avoid the effect of substrates. Both techniques can be used to determine Young’s modulus or Poisson’s ratio, but in both cases knowledge of the other variables is needed. However, the mathematical relationship between the modulus and Poisson's ratio is different for the two experimental techniques. Hence, achieving agreement between the techniques means that the modulus and Poisson’s ratio and Young’s modulus of thin films can be determined with no a priori knowledge of either.

Determination of Mechanical Properties of Thin Film on Silicon Wafer

2003 ◽  
Author(s):  
Enboa Wu ◽  
Albert J. D. Yang ◽  
Ching-An Shao ◽  
C. S. Yen
Keyword(s):  
Thin Film ◽  
Mechanical Properties ◽  
Thermal Expansion ◽  
Young’S Modulus ◽  
Silicon Wafer ◽  
Coefficient Of Thermal Expansion ◽  
Young's Modulus ◽  
Poisson Ratio ◽  
Bulk State

Nondestructive determination of Young’s modulus, coefficient of thermal expansion, Poisson ratio, and thickness of a thin film has long been a difficult but important issue as the film of micrometer order thick might behave differently from that in the bulk state. In this paper, we have successfully demonstrated the capability of determining all these four parameters at one time. This novel method includes use of the digital phase-shifting reflection moire´ (DPRM) technique to record the slope of wafer warpage under temperature drop condition. In the experiment, 1-um thick aluminum was sputtered on a 6-in silicon wafer. The convolution relationship between the measured data and the mechanical properties was constructed numerically using the conventional 3D finite element code. The genetic algorithm (GA) was adopted as the searching tool for search of the optimal mechanical properties of the film. It was found that the determined data for Young’s modulus (E), Coefficient of Thermal Expansion (CTE), Poisson ratio (ν), and thickness (h) of the 1.00 um thick aluminum film were 104.2Gpa, 38.0 ppm/°C, 0.38, and 0.98 um, respectively, whereas that in the bulk state were measured to be E=71.4 Gpa, CTE=23.0 ppm/°C, and ν=0.34. The significantly larger values on the Young’s modulus and the coefficient of thermal expansion determined by this method might be attributed to the smaller dislocation density due to the thin dimension and formation of the 5-nm layer of Al2O3 formed on top of the 1-um thick sputtered film. The Young’s Modulus and the Poisson ratio of this nano-scale Al2O3 film were then determined. Their values are consistent with the physical intuition of the microstructure.

Residual Properties of the Drawn Steel Wires for Damage-Based Fretting Fatigue Models of the Wire Ropes

2020 ◽  
Vol 1010 ◽  
pp. 71-78
Author(s):  
Maslinda Kamarudin ◽  
Zaini Ahmad ◽  
Mohd Nasir Tamin
Keyword(s):  
Elastic Modulus ◽  
Fatigue Life ◽  
Young’S Modulus ◽  
Prediction Models ◽  
Young's Modulus ◽  
Steel Wire ◽  
Fretting Fatigue ◽  
Wire Ropes ◽  
Residual Properties ◽  
Steel Wires

This paper presents the residual properties and parameters of the damage-based fatigue life prediction models of the steel wire ropes under fretting fatigue conditions. The damage mechanics-based approach is employed to develop the predictive method for the reliability of the steel wire ropes. The elastic modulus is dependent on the fatigue load condition and the accumulated number of the load cycles. The characteristic degradation of the Young’s modulus of drawn steel wires is established through the phenomenological presentation of the interrupted fatigue test data. The samples are given a quasi-static loading followed by a block cyclic loading with various stress amplitudes and ratios. The residual Young’s modulus is calculated after each block of cycles. The effect of the different loading condition with the amplitude and mean stress on the measured fatigue life of a single wire is presented using the life parameter, χ. The residual Young’s modulus data are presented in terms of normalized quantities. Significant reduction in the elastic modulus due to fatigue is exhibited after enduring 70% of the fatigue life of the material. The fitting constants are obtained, and the fitted equation is used to describe the degradation of Young’s modulus at N number of cycles. Subsequently, the data can be applied to predict the fatigue-life of steel wire ropes and assess its reliability through fretting-induced damage models.

Changes in the Microhardness and Young's Modulus in 2 MeV C+ Ion-Irradiated IG-110 Nuclear Graphite

2005 ◽  
Vol 475-479 ◽  
pp. 1471-1474 ◽  
Author(s):  
Se Hwan Chi ◽  
Gen-Chan Kim ◽  
Jun Hwa Hong ◽  
Sang Chul Kwon ◽  
Jong Hwa Chang
Keyword(s):  
Elastic Modulus ◽  
Young’S Modulus ◽  
Indentation Depth ◽  
Young's Modulus ◽  
Microhardness Test ◽  
Surface Distortion ◽  
Nuclear Graphite

The changes in the microhardness and Young’s modulus of the 2 MeV C+ ion–irradiated IG-110 isotropic nuclear graphite were evaluated by a dynamic ultra-microhardness test. Indentation depth and load dependency of the hardness and elastic modulus were observed possibly due to the formation of a range. Both the hardness and Young’s modulus (E) – dpa curves have shown an incubation dose for about ı 0.3 mdpa. After the incubation dose, both the hardness and E showed a rapid increase with the dose. The doses that corresponds to these rapid increases in the hardness and E coincides with the dose that corresponds to the beginning of the irradiationinduced surface distortion, and the loss of the graphite crystallinity (amorphization).

Influence of annealing on microstructure & molecular orientation, thermal behaviour, mechanical properties and their correlations of uniaxially drawn iPP thin film

e-Polymers ◽  
2008 ◽  
Vol 8 (1) ◽  
Author(s):  
Sayant Saengsuwan
Keyword(s):  
Thin Film ◽  
Mechanical Properties ◽  
Tensile Strength ◽  
Young’S Modulus ◽  
Thermal Behaviour ◽  
Annealing Time ◽  
Molecular Orientation ◽  
Young's Modulus ◽  
Crystal Thickness ◽  
Scanning Calorimetry

AbstractThe influence of annealing on the microstructure and molecular orientation, thermal behaviour and mechanical properties of uniaxially drawn iPP thin film was studied by wide-angle X-ray diffraction, differential scanning calorimetry and tensile testing, respectively. The correlations of mechanical and microstructural properties of annealed films were also examined. The transformation of smectic phase of iPP to the α-form was more pronounced with increasing annealing time and temperature. The true and apparent crystallinities and crystal thickness were strongly enhanced with annealing time and temperature. The relative molecular orientation tended to increase with annealing time. These results caused the significant improvement of modulus and tensile strength of the annealed films in both machine (MD) and transverse (TD) directions. The increases in MD-Young’s modulus and MD-tensile strength were well correlated with the increase in true crystallinity obtained in equatorial scans. Some relationship between the increase in crystal thickness and the increase in Young’s modulus in both MD and TD directions was also found.

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