AEM Study of thin and Thick Film Metallization on AIN Substrates

1987 ◽  
Vol 108 ◽  
Author(s):  
Alistair D. Westwood ◽  
Michael R. Notis
Keyword(s):  
Electron Microscopy ◽  
Thick Film ◽  
Analytical Electron Microscopy ◽  
Microstructural Characterization ◽  
Convergent Beam Electron Diffraction ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Convergent Beam ◽  
Boundary Penetration

ABSTRACTMicrostructural characterization of thin film (Au-Pt-Ti) and thick film (Mo-Mn) metallization on AIN substrates has been performed using Transmission Electron Microscopy (TEM), Analytical Electron Microscopy (AEM), Convergent Beam Electron Diffraction (CBED) and Auger Electron Spectroscopy (AES). The reaction mechanisms for both types of metallization methods are proposed. In particular, the microchemical and morphological nature of grain boundary penetration and precipitation within the AIN near the metallization interface has been examined.

Processing and Microstructural Characterization of TiB2 Liquid Phase Sintered with Ni and Ni3Al

1983 ◽  
Vol 24 ◽  
Author(s):  
P. Angelini ◽  
P. F. Becher ◽  
J. Bentley ◽  
C. B. Finch ◽  
P. S. Sklad
Keyword(s):  
Analytical Electron Microscopy ◽  
Phase Diagram Data ◽  
Microstructural Characterization ◽  
Convergent Beam Electron Diffraction ◽  
Intergranular Phase ◽  
X Ray ◽  
Analytical Electron ◽  
Convergent Beam ◽  
Electron Energy Loss

ABSTRACTAn Analytical Electron Microscopy investigation of TiB2 hot-pressed and pressureless sintered with Ni revealed the presence of Ni3B and tau intergranular phase, respectively. Convergent Beam Electron Diffraction (CBED) was used for crystal structure determination and compositions were determined by quantitative x-ray Energy Dispersive Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS). The phase analyses were compared with phase diagram data. An evaluation was also made of TiB2 hot pressed with Ni3Al. Quantitative EDS and EELS microanalysis indicated a Ni,Al type boride tau (Cr23C6 type) intergranular phase.

Characterization Of APB's In GaP

1996 ◽  
Vol 442 ◽  
Author(s):  
Dov Cohen ◽  
C. Barry Carter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Antiphase Boundaries ◽  
Beam Electron ◽  
Transmission Electron ◽  
Convergent Beam ◽  
Crystallographic Orientations

AbstractAntiphase boundaries in GaP crystals epitactically grown on Si (001) have been characterized using transmission electron microscopy. Convergent-beam electron diffraction was used to identify the antiphase-related grains. The antiphase boundaries were observed to adopt facets parallel to specific crystallographic orientations. Furthermore, stacking-fault-like contrast was observed along the interface suggesting that the domains may be offset from one another by a rigid-body lattice translation.

scholarly journals Microstructural characterization of the tool–chip interface enabled by focused ion beam and analytical electron microscopy

Wear ◽  
2009 ◽  
Vol 266 (11-12) ◽  
pp. 1237-1240 ◽  
Author(s):  
A. Flink ◽  
R. M'Saoubi ◽  
F. Giuliani ◽  
J. Sjölén ◽  
T. Larsson ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Analytical Electron Microscopy ◽  
Microstructural Characterization ◽  
Analytical Electron

Analytical Electron Microscopy of Solid Catalysts

1982 ◽  
Vol 40 ◽  
pp. 660-663
Author(s):  
F. Delannay
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Supported Metal Catalysts ◽  
X Ray ◽  
Solid Catalysts ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Conventional Transmission Electron Microscope ◽  
Electron Microdiffraction

Practical catalysts are usually intricate mixtures of phases which cannot be characterized separately unless looked at below the micron scale. For about two decades, electron microscopy has been a priviledged complement to selective chemisorption methods for the study of supported metal catalysts. Until recently, however, reliable tools allowing characterization of oxide and sulfide catalysts (e.g. for selective oxidation and hydrodesulfurization reactions) have been lacking. This contribution aims at illustrating the new insights into the understanding of these systems which have been provided by the combination of thin film X-ray microanalysis and electron microdiffraction within a conventional transmission electron microscope with STEM and EDS attachments.

Sign in / Sign up

Export Citation Format

Share Document