Threshold for Single Excimer Laser Pulse Backside Removal of Thin Metal Films from Optical Quartz

1988 ◽  
Vol 100 ◽  
Author(s):  
R. J. Baseman ◽  
J. C. Andreshak

ABSTRACTThe minimum energy in a 248 nm, 25 ns long excimer laser pulse required to remove thin Au and Cr films from optical quartz has been measured. Heating of the films by the laser has been modelled with a finite element calculation. Assuming that at threshold, all of the laser energy contributes to film removal, the calculations show that the gold films are removed when the heated gold surface reaches the atmospheric boiling point, and that temperatures well in excess of the atmospheric boiling point are required to remove the Cr films, with the required temperatures increasing with film thickness.

1988 ◽  
Vol 129 ◽  
Author(s):  
Paul F. Marella ◽  
David B. Tuckerman ◽  
R. Fabian Pease

ABSTRACTThe fundamental differences between excimer (≈ 30 ns pulse duration) and flashlamp-pumped dye (≈ 500 ns pulse duration) laser planarization are examined for 1.5-2 µm thick gold films over SiO2 layers. Test structures containing bar patterns (square waves) of 5000 Å peak-to-trough amplitude with spatial periods ranging from 10 µm to 100 µm were prepared and laser-irradiated. A linear model is presented which describes the time-evolution of the film's surface topography when melted with a dye laser pulse. Excimer laser planarization is found to be susceptible to evaporative recoil effects which may cause undesired pattern amplification.


1997 ◽  
Vol 42 (21) ◽  
pp. 1787-1792
Author(s):  
Guipeng Luo ◽  
Haiming Wu ◽  
Mu Wang ◽  
Shining Zhu ◽  
Yanqing Lu ◽  
...  

1991 ◽  
Vol 01 (C5) ◽  
pp. C5-297-C5-301
Author(s):  
M. G. DE BACKER ◽  
J. F. LACARRIERE ◽  
F. X. SAUVAGE

1996 ◽  
Vol 69 (7) ◽  
pp. 884-886 ◽  
Author(s):  
N. S. Kim ◽  
A. Djaoui ◽  
M. H. Key ◽  
D. Neely ◽  
S. G. Preston ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document