Stress engineering using AlN/GaN superlattices for epitaxy of GaN on 200 mm Si wafers

2014 ◽  
Vol 1736 ◽  
Author(s):  
Jie Su ◽  
Eric A. Armour ◽  
Balakrishnan Krishnan ◽  
Soo Min Lee ◽  
George D. Papasouliotis
Keyword(s):  
Growth Rate ◽  
Tensile Stress ◽  
Growth Temperature ◽  
Growth Conditions ◽  
Stress Control ◽  
Stress Engineering ◽  
Constant Period

ABSTRACTStress control using AlN/GaN superlattices (SLs) for epitaxy of GaN on 200 mm Si (111) substrates is reported. Crack-free 2 μm GaN layers were grown over structures containing 50 to 100 pairs of 3-5 nm AlN/10-30 nm GaN SLs. Compressive and tensile stress can be precisely adjusted by changing the thickness of the AlN and GaN layers in the SLs. For a constant period thickness, the effects of growth conditions, such as growth rate of GaN, V/III ratio during AlN growth, and growth temperature, on wafer stress were investigated.

Effect of Substrate Misonrentation on Ordering in Ga0.5In0.5P

1994 ◽  
Vol 340 ◽  
Author(s):  
L.C. Su ◽  
I.H. Ho ◽  
G.B. Stringfellow ◽  
Y. Leng ◽  
C.C. Williams
Keyword(s):  
Growth Rate ◽  
Misorientation Angle ◽  
Growth Temperature ◽  
Electrostatic Force ◽  
Surface States ◽  
Energy Difference ◽  
Growth Conditions ◽  
Disordered Materials ◽  
Transmission Electron ◽  
Degree Of Order

ABSTRACTOrdering produced in Ga0.5ln0.5P epitaxial layers grown by OMVPE can be controlled by variations in the substrate misorientation as well as the growth temperature and the growth rate. The ordering produced at a growth temperature of 620°C and a relatively low growth rate of 0.5 μm/hr is found to depend strongly on both the direction and angle of substrate misorientation. Transmission electron microscope images and transmission electron diffraction (TED) patterns as well as electrostatic force microscopy (EFM) and photoluminescence (PL) has been studied for misorientation angles of 0, 3, 6, and 9° from (001) toward the (111)B, (111)A, and [010] directions in the lattice. Misorientation in the (111)B direction (to produce [110] steps) increases ordering for angles of up to approximately 4°. Increasing the misorientation angle in the (111)A direction actually leads to a decrease in the degree of order observed. Misorientation in the [010] direction also decreases the degree of order, although the effect is much less than observed for misorientation in the (111)A direction. The most highly ordered material produced under these growth conditions is for a misorientation angle of 3° in the (111)A direction. Increasing the growth temperature to 720°C produces completely disordered material. This wide variation in ordering behavior has allowed the growth of an order/disorder heterostructure for a substrate misorientation of 3° in the (111)A direction. The heterostructure consists of a Ga0.52In0.48P layer grown at 740°C followed by an ordered layer grown at 620°C. The x-ray diffraction results show that both layers are precisely lattice-matched to the GaAs substrate. TED patterns show that the first layer is completely disordered and the top layer is highly ordered, with only a single variant. EFM images of the order/disorder heterostructure show a pronounced contrast at the interface, attributed to the large difference in the nature of the surface states in the ordered and disordered materials. The 10 K PL spectrum consists of two sharp and distinct peaks at 1.995 and 1.830 eV from the disordered and ordered materials, respectively. The peak separation represents the largest energy difference between ordered and disordered materials reported to date. Such heterostructures may be useful for photonic devices.

Selective Epitaxy of AlxGa1−x as and AlxGal−x as Based Structures

1989 ◽  
Vol 158 ◽  
Author(s):  
M.S. Goorsky ◽  
T.F. Kuech ◽  
R. Potemski
Keyword(s):  
Growth Rate ◽  
Phase Composition ◽  
Quantum Wells ◽  
Gas Phase ◽  
Growth Temperature ◽  
Alloy Composition ◽  
Growth Conditions ◽  
Selective Epitaxy ◽  
Strong Function ◽  
Growth Temperature Range

ABSTRACTSelective epitaxy of AlxGa1−x As by MOVPE was accomplished using diethyl gallium chloride and diethyl aluminum chloride as the metalorganic precursors. Selective epitaxy was achieved for Al containing compounds under certain growth conditions, but AlAs growth was not selective. Quantum wells were selectively grown on masked substrates and unpatterned GaAs wafers; QW luminescence was observed from all samples. Additionally, near gap luminescence was observed from AlxGa1−x, As heterostructures over the entire 550 °C - 850 °C growth temperature range. The ternary alloy composition was found to be a strong function of the gas phase composition and growth temperature. A simple thermodynamic model explained the dependence of growth rate and composition on these parameters.

scholarly journals Effects of MOVPE Growth Conditions on GaN Layers Doped with Germanium

2020 ◽  
Author(s):  
Dario Schiavon ◽  
Elżbieta Litwin-Staszewska ◽  
Rafał Jakieła ◽  
Szymon Grzanka ◽  
Piotr Perlin
Keyword(s):  
Growth Rate ◽  
High Temperature ◽  
Low Temperature ◽  
Surface Morphology ◽  
Growth Temperature ◽  
High Growth ◽  
Growth Conditions ◽  
High Growth Rate ◽  
Pit Formation ◽  
Movpe Growth

The effect of growth temperature and precursor flows on the doping level and surface morphology of Ge-doped GaN layers was researched. The results show that germanium is more readily incorporated at low temperature, high growth rate and high V/III ratio, thus revealing a similar behavior to what was previously observed for indium. V-pit formation can be blocked at high temperature but also at low V/III ratio, the latter of which however causing step bunching.

Effect of the Growth Conditions on the Crystal Quality in Solution Growth of SiC Using Cr Solvent without Molten Si

2018 ◽  
Vol 924 ◽  
pp. 35-38 ◽  
Author(s):  
Koki Suzuki ◽  
Koang Yong Hyun ◽  
Toshinori Taishi
Keyword(s):  
Growth Rate ◽  
Growth Temperature ◽  
Growth Conditions ◽  
Solution Growth ◽  
Crystal Quality ◽  
Liquid Height

We have succeeded in solution growth of SiC from Cr solvent without Si using ceramic SiC as the SiC source. The effect of the growth conditions, such as the liquid height in the crucible, on the crystal quality in solution growth of SiC from Cr solvent was investigated. For a liquid height in the crucible of up to 10 mm, the growth rate increases with increasing liquid height and the SiC crystals are a single polytype, while the growth rate decreases and the crystals are polycrystalline for a liquid height above 10 mm. In the former case, the balance between dissolution and transportation of the solute are comparable. The latter case is expected to be transportation limited because transportation of free C and Si atoms is inhibited by excrescent crystals in solution and the increase in the distance for solute transportation. In addition, a higher growth temperature leads to growth of only 4H-SiC.

Dependence of the Growth of Al2O3 Films on the Growth Conditions in the ALE-Like Process

1992 ◽  
Vol 284 ◽  
Author(s):  
Jia-Fa Fan ◽  
Koichi Toyoda
Keyword(s):  
Thin Films ◽  
Growth Rate ◽  
Electrical Properties ◽  
Growth Temperature ◽  
Chemical Bonding ◽  
Bonding Strength ◽  
Molecular Beams ◽  
Growth Conditions ◽  
Al2o3 Films

ABSTRACTEffects of the growth conditions on the growth and the quality of thin films of Al2O3 were investigated in the ALE-like process. It has been found that the growth rate remains nearly independent of the growth conditions when the pulse heights are 80–120 mTorr and 20–160 mTorr for H2O2 and TMA respectively, the pulse duration longer than 0.3 s, the base pressure below 1 mTorr, and the growth temperature higher than 150°C. Also, we found that the density, the chemical bonding strength, and the electrical properties improved markedly with raising the growth temperature although the growth rate remained nearly constant. In addition, area-selective growth and partly polycrystalline films were favorably obtained by using pulsed molecular beams of TMA and H2O2 in the growth.

scholarly journals Effects of MOVPE Growth Conditions on GaN Layers Doped with Germanium

Materials ◽  
2021 ◽  
Vol 14 (2) ◽  
pp. 354
Author(s):  
Dario Schiavon ◽  
Elżbieta Litwin-Staszewska ◽  
Rafał Jakieła ◽  
Szymon Grzanka ◽  
Piotr Perlin
Keyword(s):  
Growth Rate ◽  
High Temperature ◽  
Low Temperature ◽  
Surface Morphology ◽  
Growth Temperature ◽  
High Growth ◽  
Growth Conditions ◽  
High Growth Rate ◽  
Pit Formation ◽  
Movpe Growth

The effect of growth temperature and precursor flow on the doping level and surface morphology of Ge-doped GaN layers was researched. The results show that germanium is more readily incorporated at low temperature, high growth rate and high V/III ratio, thus revealing a similar behavior to what was previously observed for indium. V-pit formation can be blocked at high temperature but also at low V/III ratio, the latter of which however causing step bunching.

Preparation and characterization of epitaxial iron oxide films

1998 ◽  
Vol 13 (7) ◽  
pp. 2003-2014 ◽  
Author(s):  
Y. Gao ◽  
Y. J. Kim ◽  
S. A. Chambers
Keyword(s):  
Growth Rate ◽  
Iron Oxide ◽  
Oxygen Plasma ◽  
Film Surface ◽  
Surface Region ◽  
Growth Conditions ◽  
Epitaxial Films ◽  
Pure Phase ◽  
Iron Oxide Films

Well-ordered, pure-phase epitaxial films of FeO, Fe3O4, and γ–Fe2O3 were prepared on MgO(001) by oxygen-plasma-assisted MBE. The stoichiometries of these thin films were controlled by varying the growth rate and oxygen partial pressure. Selective growth of γ–Fe2O3 and α–Fe2O3 was achieved by controlling the growth conditions in conjunction with the choice of appropriate substrates. Growth of the iron oxide epitaxial films on MgO at ≥350 °C is accompanied by significant Mg outdiffusion. The FeO(001) film surface exhibits a (2 × 2) reconstruction, which is accompanied by a significant amount of Fe3+ in the surface region. Fe3O4 (001) has been found to reconstruct to a structure. γ–Fe23 (001) film surface is unreconstructed.

Strain in 3C–SiC Heteroepitaxial Layers Grown on (100) and (111) Oriented Silicon Substrates

2008 ◽  
Vol 600-603 ◽  
pp. 207-210 ◽  
Author(s):  
Marcin Zielinski ◽  
Marc Portail ◽  
Thierry Chassagne ◽  
Yvon Cordier
Keyword(s):  
Gaseous Phase ◽  
Growth Temperature ◽  
Growth Conditions ◽  
Silicon Substrates ◽  
Phase Growth ◽  
Growth Duration ◽  
Strain Control ◽  
Heteroepitaxial Layers ◽  
Oriented Layers ◽  
Sic Films

We discuss the influence of the growth conditions (composition of the gaseous phase, growth duration, growth temperature) and wafer properties (orientation, miscut, thickness) on the residual strain of 3C-SiC films grown on silicon substrates. We show that the strain related effects are observed for both studied orientations however some of them (namely the creep effects) were up to now stated only for (100) oriented layers. We also point out the main difference in strain control between the (111) and (100) orientations.

Emission characteristics of GaInN/GaN multiple quantum shell nanowire-based LEDs with different p-GaN growth conditions

Nanophotonics ◽  
2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Sae Katsuro ◽  
Weifang Lu ◽  
Kazuma Ito ◽  
Nanami Nakayama ◽  
Naoki Sone ◽  
...  
Keyword(s):  
Growth Rate ◽  
Shell Growth ◽  
Light Output ◽  
High Growth ◽  
Growth Conditions ◽  
High Growth Rate ◽  
Current Injection ◽  
Emission Characteristics ◽  
Multiple Quantum ◽  
Plane Region

Abstract Improving current injection into r- and m-planes of nanowires (NWs) is essential to realizing efficient GaInN/GaN multiple quantum shell (MQS) NW-based light-emitting diodes (LEDs). Here, we present the effects of different p-GaN shell growth conditions on the emission characteristics of MQS NW-LEDs. Firstly, a comparison between cathodoluminescence (CL) and electroluminescence (EL) spectra indicates that the emission in NW-LEDs originates from the top region of the NWs. By growing thick p-GaN shells, the variable emission peak at around 600 nm and degradation of the light output of the NW-LEDs are elaborated, which is attributable to the localization of current in the c-plane region with various In-rich clusters and deep-level defects. Utilizing a high growth rate of p-GaN shell, an increased r-plane and a reduced c-plane region promote the deposition of indium tin oxide layer over the entire NW. Therefore, the current is effectively injected into both the r- and m-planes of the NW structures. Consequently, the light output and EL peak intensity of the NW-LEDs are enhanced by factors of 4.3 and 13.8, respectively, under an injection current of 100 mA. Furthermore, scanning transmission electron microscope images demonstrate the suppression of dislocations, triangular defects, and stacking faults at the apex of the p-GaN shell with a high growth rate. Therefore, localization of current injection in nonradiative recombination centers near the c-plane was also inhibited. Our results emphasize the possibility of realizing high efficacy in NW-LEDs via optimal p-GaN shell growth conditions, which is quite promising for application in the long-wavelength region.

scholarly journals Characterisation of III?V Multilayers Grown by Low-pressure Metal Organic Vapour-phase Epitaxy

1993 ◽  
Vol 46 (3) ◽  
pp. 435
Author(s):  
C Jagadish ◽  
A Clark ◽  
G Li ◽  
CA Larson ◽  
N Hauser ◽  
...  
Keyword(s):  
Gallium Arsenide ◽  
Growth Temperature ◽  
Deep Level ◽  
Growth Parameters ◽  
Low Pressure ◽  
Vapour Phase ◽  
Growth Conditions ◽  
Vapour Phase Epitaxy ◽  
Metal Organic ◽  
Organic Vapour

Undoped and doped layers of gallium arsenide and aluminium gallium arsenide have been grown on gallium arsenide by low-pressure metal organic vapour-phase epitaxy (MOVPE). Delta doping and growth on silicon substrates have also been attempted. Of particular interest in the present study has been the influence of growth parameters, such as growth temperature, group III mole fraction and dopant flow, on the electrical and physical properties of gallium arsenide layers. An increase in growth temperature leads to increased doping efficiency in the case of silicon, whereas the opposite is true in the case of zinc. Deep level transient spectroscopy (DTLS) studies on undoped GaAs layers showed two levels, the expected EL2 level and a carbon-related level. The determination of optimum growth conditions has allowed good quality GaAs and AlGaAs epitaxial layers to be produced for a range of applications.`

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