Combined AFM-SEM testing for mechanical property determination of graphene oxide paper

2012 ◽  
Vol 1407 ◽  
Author(s):  
Congwei Wang ◽  
Asa H. Barber
Keyword(s):  
Graphene Oxide ◽  
Ion Beam ◽  
Force Microscopy ◽  
Atomic Force ◽  
Focussed Ion Beam ◽  
Graphene Oxide Paper ◽  
Sample Width ◽  
Testing Condition ◽  
Vacuum Testing

ABSTRACTA novel technique combining both atomic force microscopy (AFM) and scanning electron microscopy (SEM) is used to test the mechanical properties of densely-packed graphene oxide (GO) paper. Individual beams of GO paper with variable widths were prepared using focussed ion beam (FIB) microscopy and tensile tested to failure using the AFM while observing with SEM. A variation in the tensile strength of the GO paper beams up to 64.8 MPa was recorded in the vacuum testing condition. An increase in breaking stress of GO paper with decreasing sample width was determined and proposed as being due to fewer defects present in GO beams of smaller width.

scholarly journals Mechanical Characterization of Torsional Micropaddles Using Atomic Force Microscopy

2018 ◽  
Vol 2018 ◽  
pp. 1-7 ◽  
Author(s):  
N. Mahmoodi ◽  
A. Sabouri ◽  
J. Bowen ◽  
C. J. Anthony ◽  
P. M. Mendes
Keyword(s):  
Atomic Force Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Spring Constant ◽  
Simple Method ◽  
Force Microscopy ◽  
Atomic Force ◽  
Torsional Spring

The reference cantilever method is shown to act as a direct and simple method for determination of torsional spring constant. It has been applied to the characterization of micropaddle structures similar to those proposed for resonant functionalized chemical sensors and resonant thermal detectors. It is shown that this method can be used as an effective procedure to characterize a key parameter of these devices and would be applicable to characterization of other similar MEMS/NEMS devices such as micromirrors. In this study, two sets of micropaddles are manufactured (beams at centre and offset by 2.5 μm) by using LPCVD silicon nitride as a substrate. The patterning is made by direct milling using focused ion beam. The torsional spring constant is achieved through micromechanical analysis via atomic force microscopy. To obtain the gradient of force curve, the area of the micropaddle is scanned and the behaviour of each pixel is investigated through an automated developed code. The experimental results are in a good agreement with theoretical results.

Failure of bone at the sub-lamellar level using in situ AFM-SEM investigations

2012 ◽  
Vol 1424 ◽  
Author(s):  
Ines Jimenez-Palomar ◽  
Asa H. Barber
Keyword(s):  
Electron Microscopy ◽  
Fracture Behavior ◽  
Failure Modes ◽  
Ion Beam ◽  
Bone Material ◽  
Force Microscopy ◽  
Atomic Force ◽  
Focussed Ion Beam ◽  
Scanning Electron

ABSTRACTIn this paper we examine the mechanical properties of individual lamellae from bone material using novel atomic force microscopy (AFM)-scanning electron microscopy (SEM) techniques. Individual lamellar beams were selected from bone using focussed ion beam (FIB) microscopy and mechanically deformed with the AFM while observing failure modes using SEM. Both the elastic and fracture behavior of the bone lamellae were determined using these techniques.

scholarly journals Molecular force transfer mechanisms in graphene oxide paper evaluated using atomic force microscopy and in situ synchrotron micro FT-IR spectroscopy

Nanoscale ◽  
2014 ◽  
Vol 6 (23) ◽  
pp. 14404-14411 ◽  
Author(s):  
Congwei Wang ◽  
Mark D. Frogley ◽  
Gianfelice Cinque ◽  
Lu-Qi Liu ◽  
Asa H. Barber
Keyword(s):  
Mechanical Properties ◽  
Graphene Oxide ◽  
Force Microscopy ◽  
Atomic Force ◽  
Molecular Force ◽  
Force Transfer ◽  
Ft Ir ◽  
Graphene Oxide Paper ◽  
Ft Ir Spectroscopy

The mechanical properties of graphene oxide (GO) paper are critically defined both by the mechanical properties of the constituent GO sheets and the interaction between these sheets.

Influence of Crystal Defects on the Reflectivity of the Aluminum

2015 ◽  
Vol 756 ◽  
pp. 164-168
Author(s):  
S.P. Umnov ◽  
O.Kh. Asainov ◽  
A.N. Lemachko
Keyword(s):  
Ion Beam ◽  
Xrd Analysis ◽  
Crystal Defects ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Uv Reflectance ◽  
Argon Ion

The effect of ion-assisted deposition of the Al films on their UV reflectance is investigated in this paper. The films' reflectance is measured by a spectrophotometer. The obtained films are examined by using transmission electron microscopy (TEM), X-ray diffraction analysis (XRD), and atomic force microscopy (AFM). The TEM and AFM measurements allow the determination of the size of crystallites in a film and its microstructure. The XRD analysis reveals that the films deposited with argon ion-beam assist are characterized by much higher microstress levels compared to the films deposited without ion assist. The comparison of the Al films’ reflectance measurements indicate that the films with a higher microstress level (hence, higher defect concentration) are characterized by the enhanced reflectance in the UV region. The conducted investigation shows that the defects of the Al films’ crystalline structure affect its optical properties.

scholarly journals Toxicity of Graphene Shells, Graphene Oxide, and Graphene Oxide Paper Evaluated withEscherichia coliBiotests

2015 ◽  
Vol 2015 ◽  
pp. 1-10 ◽  
Author(s):  
Ludmila V. Efremova ◽  
Alexey S. Vasilchenko ◽  
Eduard G. Rakov ◽  
Dmitry G. Deryabin
Keyword(s):  
Escherichia Coli ◽  
Graphene Oxide ◽  
Aqueous Suspension ◽  
Cell Membrane Permeability ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mechanism Of Toxicity ◽  
Bioluminescence Inhibition ◽  
Graphene Oxide Paper ◽  
Microscopy Data

The plate-like graphene shells (GS) produced by an original methane pyrolysis method and their derivatives graphene oxide (GO) and graphene oxide paper (GO-P) were evaluated with luminescentEscherichia colibiotests and additional bacterial-based assays which together revealed the graphene-family nanomaterials’ toxicity and bioactivity mechanisms. Bioluminescence inhibition assay, fluorescent two-component staining to evaluate cell membrane permeability, and atomic force microscopy data showed GO expressed bioactivity in aqueous suspension, whereas GS suspensions and the GO-P surface were assessed as nontoxic materials. The mechanism of toxicity of GO was shown not to be associated with oxidative stress in the targetedsoxS::luxandkatG::luxreporter cells; also, GO did not lead to significant mechanical disruption of treated bacteria with the release of intracellular DNA contents into the environment. The well-coordinated time- and dose-dependent surface charge neutralization and transport and energetic disorders in theEscherichia colicells suggest direct membrane interaction, internalization, and perturbation (i.e., “membrane stress”) as a clue to graphene oxide’s mechanism of toxicity.

scholarly journals Photocatalytic reduction of graphene oxide with cuprous oxide film under UV-vis irradiation

2020 ◽  
Vol 59 (1) ◽  
pp. 207-214 ◽  
Author(s):  
Yao Wang ◽  
Jianqing Feng ◽  
Lihua Jin ◽  
Chengshan Li
Keyword(s):  
Graphene Oxide ◽  
Photoelectron Spectroscopy ◽  
Low Cost ◽  
Photocatalytic Reduction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Reduced Graphene ◽  
Reduction Efficiency ◽  
Metal Organic ◽  
Reduction Effect

AbstractWe have grown Cu2O films by different routes including self-oxidation and metal-organic deposition (MOD). The reduction efficiency of Cu2O films on graphene oxide (GO) synthesized by modified Hummer’s method has been studied. Surface morphology and chemical state of as-prepared Cu2O film and GO sheets reduced at different conditions have also been investigated using atomic force microscopy (AFM) and x-ray photoelectron spectroscopy (XPS). Results show that self-oxidation Cu2O film is more effective on phtocatalytic reduction of GO than MOD-Cu2O film. Moreover, reduction effect of self-oxidation Cu2O film to GO is comparable to that of environmental-friendly reducing agent of vitamin C. The present results offer a potentially eco-friendly and low-cost approach for the manufacture of reduced graphene oxide (RGO) by photocatalytic reduction.

Extending AFM Phase Image of Nanocomposite Structures to 3D using FIB

2012 ◽  
Vol 1421 ◽  
Author(s):  
Russell J. Bailey ◽  
Remco Geurts ◽  
Debbie J. Stokes ◽  
Frank de Jong ◽  
Asa H. Barber
Keyword(s):  
Phase Contrast ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polymer Nanocomposite ◽  
Three Dimensions ◽  
Phase Image ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mechanical Information ◽  
Nanocomposite Structures

ABSTRACTThe mechanical behavior of nanocomposites is critically dependent on their structural composition. In this paper we use Focused Ion Beam (FIB) microscopy to prepare surfaces from a layered polymer nanocomposite for investigation using phase contrast atomic force microscopy (AFM). Phase contrast AFM provides mechanical information on the surface examined and, by combining with the sequential cross-sectioning of FIB, can extend the phase contract AFM into three dimensions.

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