Failure of bone at the sub-lamellar level using in situ AFM-SEM investigations
Keyword(s):
Ion Beam
◽
ABSTRACTIn this paper we examine the mechanical properties of individual lamellae from bone material using novel atomic force microscopy (AFM)-scanning electron microscopy (SEM) techniques. Individual lamellar beams were selected from bone using focussed ion beam (FIB) microscopy and mechanically deformed with the AFM while observing failure modes using SEM. Both the elastic and fracture behavior of the bone lamellae were determined using these techniques.