Light Emitting Diode Growth on Curved Gallium Nitride Surfaces

2011 ◽  
Vol 1288 ◽  
Author(s):  
L. E. Rodak ◽  
K. Lee ◽  
V. Kumbham ◽  
V. Narang ◽  
L. A. Hornak ◽  
...  

ABSTRACTIII-Nitride based Light Emitting Diodes (LEDs) are heavily pursued for various lighting applications due to the ability to engineer the emission through the visible wavelengths by controlling the alloy composition in the multi quantum well. Planar structures are characterized by a Lambertian emission pattern, however, depending on the applications in which the LED is employed, including but not limited to, general lighting, displays, and sensors, the emission profile may need to be more or less directional. As a result, there is significant interest in both improving the efficiency and controlling the emission profile of nitride based devices. Various components such as lenses and photonic crystals are used to improve light extraction and alter the emission profile while growth on semi-polar substrates is being pursued to minimize inherent polarization effects. In this work, curved Gallium Nitride (GaN) structures have been grown utilizing growth kinetics. These as-grown features do not require the extensive additional fabrication and allow for three-dimensional substrates to be employed for LED fabrication. The details of the fabrication and the optical and electrical characterization of Indium Gallium Nitride based LEDs grown on these structures is discussed.

Author(s):  
J. Zimmer ◽  
D. Nielsen ◽  
T.A. Anderson ◽  
M. Schade ◽  
N. Saha ◽  
...  

Abstract The p-n junction of a GaAs light emitting diode is fabricated using liquid phase epitaxy (LPE). The junction is grown on a Si doped (~1018/cm3) GaAs substrate. Intermittent yield loss due to forward voltage snapback was observed. Historically, out of specification forward voltage (Vf) parameters have been correlated to abnormalities in the junction formation. Scanning electron (SEM) and optical microscopy of cleaved and stained samples revealed a continuous layer of material approximately 2.5 to 3.0 urn thick at the n-epi/substrate interface. Characterization of a defective wafer via secondary ion mass spectroscopy (SIMS) revealed an elevated concentration of O throughout the region containing the defect. X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) data taken from a wafer prior to growth of the epi layers did not reveal any unusual oxidation or contamination. Extensive review of the processing data suggested LPE furnace pressure was the obvious source of variability. Processing wafers through the LPE furnace with a slight positive H2 gas pressure has greatly reduced the occurrence of this defect.


Micromachines ◽  
2021 ◽  
Vol 12 (6) ◽  
pp. 725
Author(s):  
Saeyeong Jeon ◽  
Youjin Lee ◽  
Daeho Ryu ◽  
Yoon Kyung Cho ◽  
Yena Lee ◽  
...  

During the last decade, optogenetics has become an essential tool for neuroscience research due to its unrivaled feature of cell-type-specific neuromodulation. There have been several technological advances in light delivery devices. Among them, the combination of optogenetics and electrophysiology provides an opportunity for facilitating optogenetic approaches. In this study, a novel design of an optrode array was proposed for realizing optical modulation and electrophysiological recording. A 4 × 4 optrode array and five-channel recording electrodes were assembled as a disposable part, while a reusable part comprised an LED (light-emitting diode) source and a power line. After the characterization of the intensity of the light delivered at the fiber tips, in vivo animal experiment was performed with transgenic mice expressing channelrhodopsin, showing the effectiveness of optical activation and neural recording.


2008 ◽  
Vol 93 (8) ◽  
pp. 083505 ◽  
Author(s):  
Meng-Huan Ho ◽  
Ming-Ta Hsieh ◽  
Teng-Ming Chen ◽  
Jenn-Fang Chen ◽  
Shiao-Wen Hwang ◽  
...  

2002 ◽  
Vol 91 (1) ◽  
pp. 178 ◽  
Author(s):  
A. Krtschil ◽  
A. Kielburg ◽  
H. Witte ◽  
J. Christen ◽  
A. Krost ◽  
...  

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