Three dimensional characterization of GaN-based light emitting diode grown on patterned sapphire substrate by confocal Raman and photoluminescence spectromicroscopy
2011 ◽
Vol 50
◽
pp. 01AD06
◽
2009 ◽
Vol 48
(12)
◽
pp. 122103
◽
Keyword(s):
2013 ◽
Vol 52
(9R)
◽
pp. 092101
◽
2020 ◽
Vol 12
(5)
◽
pp. 647-651
◽
2016 ◽
Vol 31
(8)
◽
pp. 085010
◽
Keyword(s):