In Situ Investigations of Chemical Reactions on Surfaces by X-Ray Diffraction at Atomospheric Pressures

MRS Bulletin ◽  
2007 ◽  
Vol 32 (12) ◽  
pp. 1010-1014 ◽  
Author(s):  
S. Ferrer ◽  
M. D. Ackermann ◽  
E. Lundgren
Keyword(s):  
Research Field ◽  
Catalytic Reactions ◽  
Atomic Scale ◽  
Oxidation Reactions ◽  
X Ray Diffraction ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
X Ray ◽  
Adsorption Sites

AbstractCatalytic reactions occurring at metal surfaces and nanoparticles have been an established research field for decades, yielding information on adsorption sites and reaction pathways under ultrahigh-vacuum conditions. Recent experimental developments have made it possible to perform well-controlled in situ surface x-ray diffraction measurements from single-crystal surfaces and nanoparticles under industrially relevant conditions. In this way, a new understanding of atomic-scale processes at surfaces and nanoparticles occurring during catalytic reactions under realistic conditions has been gained. In particular, the identification of the formation of thin oxides on model catalysts and their role in oxidation reactions demonstrates the importance of in situ probes under relevant conditions.

scholarly journals Strain mapping on gold thin film buckling and silicon blistering

2005 ◽  
Vol 875 ◽  
Author(s):  
P. Goudeau ◽  
N. Tamura ◽  
G. Parry ◽  
J. Colin ◽  
C. Coupeau ◽  
...  
Keyword(s):  
Thin Film ◽  
X Ray Diffraction ◽  
Crystal Surfaces ◽  
Strain Mapping ◽  
Strain Fields ◽  
Single Crystal Surfaces ◽  
X Ray ◽  
Gold Thin Film ◽  
Compressive Stresses ◽  
Strain Stress

AbstractStress/Strain fields associated with thin film buckling induced by compressive stresses or blistering due to the presence of gas bubbles underneath single crystal surfaces are difficult to measure owing to the microscale dimensions of these structures. In this work, we show that micro Scanning X-ray diffraction is a well suited technique for mapping the strain/stress tensor of these damaged structures.

scholarly journals Ultrahigh vacuum chamber for synchrotron x‐ray diffraction from films adsorbed on single‐crystal surfaces

1992 ◽  
Vol 63 (8) ◽  
pp. 3835-3841 ◽  
Author(s):  
J. R. Dennison ◽  
S.‐K. Wang ◽  
P. Dai ◽  
T. Angot ◽  
H. Taub ◽  
...  
Keyword(s):  
Single Crystal ◽  
Vacuum Chamber ◽  
Ultrahigh Vacuum ◽  
X Ray Diffraction ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
X Ray

scholarly journals Application of maximum-entropy electrostatic potential in Materials Science.

2014 ◽  
Vol 70 (a1) ◽  
pp. C101-C101
Author(s):  
Eiji Nishibori
Keyword(s):  
Maximum Entropy ◽  
Electrostatic Potential ◽  
Diffraction Data ◽  
Materials Science ◽  
Structural Information ◽  
Entropy Method ◽  
Atomic Scale ◽  
X Ray Diffraction ◽  
X Ray ◽  
Adsorption Sites

Charge density (CD) studies by Maximum Entropy Method (MEM) (Sakata & Sato, 1990) from x-ray diffraction data have been widely applied to solve problems and questions in materials science during past two decades. Encapsulations of metal atoms (Takata et al, 1995), gas molecules, as well as protein molecules in the materials have been visualized as MEM CDs. The MEM CD technique is now regarded as a sophisticated technique for visualization in atomic scale. Electrostatic potential (EP) and electric field (EF) from x-ray diffraction data using MEM have been developed in 2006 (Tanaka et al, 2006). The EP & EF successfully applied to ferroelectric material PbTiO3 and a charge ordered manganite system. The method has huge potential in materials science since interaction in the non-atomic region can be visualized experimentally. One of the promising target for EP & EF analysis is host-guest systems, such as porous coordination polymers (PCPs), zeolites, clathrates as well as endohedral metallofullerenes[3]. In the case of host-guest systems, the guest atom(s) or molecule(s) are located in spatially wider sites in comparison to other type of materials. Therefore the detailed structural information in the spatially wider sites is one of the most important issues. In the present study, I present an application of MEM EP & EF analysis to host-guest related system, icosahedral B12 cluster materials and hydrogen adsorbed PCP. The EP studies clearly visualize doping sites in B12 based superconductor and adsorption sites in PCP. The EF enables us to estimate quantitative interaction from host to guest. The quantitative evaluation really bridges between experiment and theory in materials science.

Inhomogeneous thermal expansion of metallic glasses in atomic-scale studied by in-situ synchrotron X-ray diffraction

2015 ◽  
Vol 117 (4) ◽  
pp. 044902 ◽  
Author(s):  
Amir Hossein Taghvaei ◽  
Hamed Shakur Shahabi ◽  
Jozef Bednarčik ◽  
Jürgen Eckert
Keyword(s):  
Thermal Expansion ◽  
Metallic Glasses ◽  
Atomic Scale ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals In Situ Scanning X-Ray Diffraction Reveals Strain Variations in Electrochemically Grown Nanowires

2020 ◽  
Author(s):  
Alfred Larsson ◽  
Giuseppe abbondanza ◽  
lisa rämisch ◽  
weronica linpe ◽  
Dmitri Novikov ◽  
...  
Keyword(s):  
Tensile Strain ◽  
Growth Process ◽  
Spatial Information ◽  
Atomic Scale ◽  
Ex Situ ◽  
Magnetic Storage ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanoporous Templates

<p><a>Templated electrochemical growth in nanoporous alumina can be used to fabricate nanowires with applications in magnetic storage devices, hydrogen sensors, and electrocatalysis. It is known that nanowires, grown in such templates, are strained. The strain in nanoscale materials can influence their performance in applications such as catalysts and electronic devices. However, it is not well established how the nanoporous template affects the lattice strain in the nanowires and how this develops during the growth process due to the lack of non-destructive <i>in situ </i>studies with spatial resolution. Here we have measured the strain and grain size of palladium nanowires in nanoporous templates during the growth process. For this we performed <i>in situ</i> scanning x-ray diffraction with a submicron focused x-ray beam. We found that there is a tensile strain in the nanowires and that it is more pronounced along the growth direction than in the confined direction of the templates. The tensile strain measured <i>in situ</i> is higher than previous <i>ex situ </i>reports, possibly due to hydrogen absorption during the growth. With the spatial information made possible with the focused synchrotron x-ray beam we could observe local variations in strain as a function of height. A region of local strain variation is found near the bottom of the nanowires where growth is initiated in branches at the pore bottoms. Knowledge of how nanoporous templates influence the strain of the nanowires may allow for atomic scale tailoring of the catalytic activity of such nanowires or minimizing strain to optimize electronic device performance. </a></p>

In-situ STM and NC-AFM Observations of Atoms, Molecules and Catalytic Reactions on TiO2(110) and CeO2(111) Single Crystal Surfaces

2004 ◽  
Vol 10 (S02) ◽  
pp. 36-37
Author(s):  
Yasuhiro Iwasawa
Keyword(s):  
Single Crystal ◽  
Catalytic Reactions ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
In Situ Stm

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

ON THE X-RAY DIFFRACTION ON PARATELLURITE SINGLE CRYSTAL SURFACES

2007 ◽  
Vol 21 (0) ◽  
pp. 220-224
Author(s):  
О. М. Юрійчук ◽  
Л. А. Проц ◽  
І. І. Чичура ◽  
К. П. Попович
Keyword(s):  
Single Crystal ◽  
X Ray Diffraction ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
X Ray
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