scholarly journals Ultrahigh vacuum chamber for synchrotron x‐ray diffraction from films adsorbed on single‐crystal surfaces

1992 ◽  
Vol 63 (8) ◽  
pp. 3835-3841 ◽  
Author(s):  
J. R. Dennison ◽  
S.‐K. Wang ◽  
P. Dai ◽  
T. Angot ◽  
H. Taub ◽  
...  
Keyword(s):  
Single Crystal ◽  
Vacuum Chamber ◽  
Ultrahigh Vacuum ◽  
X Ray Diffraction ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
X Ray

ON THE X-RAY DIFFRACTION ON PARATELLURITE SINGLE CRYSTAL SURFACES

2007 ◽  
Vol 21 (0) ◽  
pp. 220-224
Author(s):  
О. М. Юрійчук ◽  
Л. А. Проц ◽  
І. І. Чичура ◽  
К. П. Попович
Keyword(s):  
Single Crystal ◽  
X Ray Diffraction ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
X Ray

scholarly journals Strain mapping on gold thin film buckling and silicon blistering

2005 ◽  
Vol 875 ◽  
Author(s):  
P. Goudeau ◽  
N. Tamura ◽  
G. Parry ◽  
J. Colin ◽  
C. Coupeau ◽  
...  
Keyword(s):  
Thin Film ◽  
X Ray Diffraction ◽  
Crystal Surfaces ◽  
Strain Mapping ◽  
Strain Fields ◽  
Single Crystal Surfaces ◽  
X Ray ◽  
Gold Thin Film ◽  
Compressive Stresses ◽  
Strain Stress

AbstractStress/Strain fields associated with thin film buckling induced by compressive stresses or blistering due to the presence of gas bubbles underneath single crystal surfaces are difficult to measure owing to the microscale dimensions of these structures. In this work, we show that micro Scanning X-ray diffraction is a well suited technique for mapping the strain/stress tensor of these damaged structures.

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