Review—In-Situ Surface X-ray Diffraction Studies of Copper Electrodes: Atomic-Scale Interface Structure and Growth Behavior

2018 ◽  
Vol 166 (1) ◽  
pp. D3049-D3057 ◽  
Author(s):  
Y. Gründer ◽  
J. Stettner ◽  
O. M. Magnussen
Keyword(s):  
Interface Structure ◽  
Growth Behavior ◽  
Atomic Scale ◽  
X Ray Diffraction ◽  
X Ray ◽  
Copper Electrodes

In situ investigation of MnAs/GaAs(001) growth and interface structure using synchrotron x-ray diffraction

2004 ◽  
Vol 22 (4) ◽  
pp. 2079 ◽  
Author(s):  
D. K. Satapathy ◽  
B. Jenichen ◽  
V. M. Kaganer ◽  
W. Braun ◽  
L. Däweritz ◽  
...  
Keyword(s):  
Interface Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Investigation

Inhomogeneous thermal expansion of metallic glasses in atomic-scale studied by in-situ synchrotron X-ray diffraction

2015 ◽  
Vol 117 (4) ◽  
pp. 044902 ◽  
Author(s):  
Amir Hossein Taghvaei ◽  
Hamed Shakur Shahabi ◽  
Jozef Bednarčik ◽  
Jürgen Eckert
Keyword(s):  
Thermal Expansion ◽  
Metallic Glasses ◽  
Atomic Scale ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals In Situ Scanning X-Ray Diffraction Reveals Strain Variations in Electrochemically Grown Nanowires

2020 ◽  
Author(s):  
Alfred Larsson ◽  
Giuseppe abbondanza ◽  
lisa rämisch ◽  
weronica linpe ◽  
Dmitri Novikov ◽  
...  
Keyword(s):  
Tensile Strain ◽  
Growth Process ◽  
Spatial Information ◽  
Atomic Scale ◽  
Ex Situ ◽  
Magnetic Storage ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanoporous Templates

<p><a>Templated electrochemical growth in nanoporous alumina can be used to fabricate nanowires with applications in magnetic storage devices, hydrogen sensors, and electrocatalysis. It is known that nanowires, grown in such templates, are strained. The strain in nanoscale materials can influence their performance in applications such as catalysts and electronic devices. However, it is not well established how the nanoporous template affects the lattice strain in the nanowires and how this develops during the growth process due to the lack of non-destructive <i>in situ </i>studies with spatial resolution. Here we have measured the strain and grain size of palladium nanowires in nanoporous templates during the growth process. For this we performed <i>in situ</i> scanning x-ray diffraction with a submicron focused x-ray beam. We found that there is a tensile strain in the nanowires and that it is more pronounced along the growth direction than in the confined direction of the templates. The tensile strain measured <i>in situ</i> is higher than previous <i>ex situ </i>reports, possibly due to hydrogen absorption during the growth. With the spatial information made possible with the focused synchrotron x-ray beam we could observe local variations in strain as a function of height. A region of local strain variation is found near the bottom of the nanowires where growth is initiated in branches at the pore bottoms. Knowledge of how nanoporous templates influence the strain of the nanowires may allow for atomic scale tailoring of the catalytic activity of such nanowires or minimizing strain to optimize electronic device performance. </a></p>

scholarly journals Structural aspects of displacive transformations: what can optical microscopy contribute? Dehydration of Sm2(C2O4)3·10H2O as a case study

IUCrJ ◽  
2017 ◽  
Vol 4 (5) ◽  
pp. 588-597 ◽  
Author(s):  
Alexander A. Matvienko ◽  
Daniel V. Maslennikov ◽  
Boris A. Zakharov ◽  
Anatoly A. Sidelnikov ◽  
Stanislav A. Chizhik ◽  
...  
Keyword(s):  
Single Crystal ◽  
Optical Microscopy ◽  
Martensitic Transformations ◽  
Structural Rearrangement ◽  
Atomic Scale ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural Aspects

For martensitic transformations the macroscopic crystal strain is directly related to the corresponding structural rearrangement at the microscopic level.In situoptical microscopy observations of the interface migration and the change in crystal shape during a displacive single crystal to single crystal transformation can contribute significantly to understanding the mechanism of the process at the atomic scale. This is illustrated for the dehydration of samarium oxalate decahydrate in a study combining optical microscopy and single-crystal X-ray diffraction.

scholarly journals In Situ Scanning X-Ray Diffraction Reveals Strain Variations in Electrochemically Grown Nanowires

2020 ◽  
Author(s):  
Alfred Larsson ◽  
Giuseppe abbondanza ◽  
lisa rämisch ◽  
weronica linpe ◽  
Dmitri Novikov ◽  
...  
Keyword(s):  
Tensile Strain ◽  
Growth Process ◽  
Spatial Information ◽  
Atomic Scale ◽  
Ex Situ ◽  
Magnetic Storage ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanoporous Templates

<p><a>Templated electrochemical growth in nanoporous alumina can be used to fabricate nanowires with applications in magnetic storage devices, hydrogen sensors, and electrocatalysis. It is known that nanowires, grown in such templates, are strained. The strain in nanoscale materials can influence their performance in applications such as catalysts and electronic devices. However, it is not well established how the nanoporous template affects the lattice strain in the nanowires and how this develops during the growth process due to the lack of non-destructive <i>in situ </i>studies with spatial resolution. Here we have measured the strain and grain size of palladium nanowires in nanoporous templates during the growth process. For this we performed <i>in situ</i> scanning x-ray diffraction with a submicron focused x-ray beam. We found that there is a tensile strain in the nanowires and that it is more pronounced along the growth direction than in the confined direction of the templates. The tensile strain measured <i>in situ</i> is higher than previous <i>ex situ </i>reports, possibly due to hydrogen absorption during the growth. With the spatial information made possible with the focused synchrotron x-ray beam we could observe local variations in strain as a function of height. A region of local strain variation is found near the bottom of the nanowires where growth is initiated in branches at the pore bottoms. Knowledge of how nanoporous templates influence the strain of the nanowires may allow for atomic scale tailoring of the catalytic activity of such nanowires or minimizing strain to optimize electronic device performance. </a></p>

Real-time x-ray scattering study of growth behavior of sputter-deposited LaNiO3 thin films on Si substrates

2000 ◽  
Vol 15 (12) ◽  
pp. 2606-2611 ◽  
Author(s):  
Hsin-Yi Lee ◽  
K. S. Liang ◽  
Chih-Hao Lee ◽  
Tai-Bor Wu
Keyword(s):  
Thin Films ◽  
Real Time ◽  
Transition Layer ◽  
Growth Behavior ◽  
X Ray Diffraction ◽  
Random Orientation ◽  
X Ray ◽  
Si Substrates ◽  
Diffraction Patterns

Real-time x-ray reflectivity and diffraction measurements under in situ sputtering conditions were employed to study the growth behavior of LaNiO3 thin films on a Si substrate. Our results clearly show there is a transition layer of 60 Å, which grew in the first 6 min of deposition. The in situ x-ray-diffraction patterns indicated that this transition layer is amorphous. Subsequently, a polycrystalline overlayer grew as observed from the in situ x-ray reflectivity curves and diffraction patterns. Nucleation and growth took place on this transition layer with random orientation and then the polycrystalline columnar textures of (100) and (110) grew on the top of this random orientation layer. By comparing the integrated intensities of two Bragg peaks in the plane normal of x-ray diffraction, it was found that a crossover of the growth orientation from the ⟨110⟩ to the ⟨100ߩ direction occurred and the ability of (100) texturization enhanced with increasing film thickness beyond a certain critical value.

scholarly journals Single-crystal diffraction at the high-pressure Indo-Italian beamline Xpress at Elettra, Trieste

2020 ◽  
Vol 27 (1) ◽  
pp. 222-229 ◽  
Author(s):  
Paolo Lotti ◽  
Sula Milani ◽  
Marco Merlini ◽  
Boby Joseph ◽  
Frederico Alabarse ◽  
...  
Keyword(s):  
High Pressure ◽  
Single Crystal ◽  
Structural Features ◽  
Atomic Scale ◽  
Experimental Setup ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diamond Anvil ◽  
Synthetic Crystal

In this study the first in situ high-pressure single-crystal X-ray diffraction experiments at Xpress, the Indo-Italian beamline of the Elettra synchrotron, Trieste (Italy), are reported. A description of the beamline experimental setup and of the procedures for single-crystal centring, data collection and processing, using diamond anvil cells, are provided. High-pressure experiments on a synthetic crystal of clinoenstatite (MgSiO3), CaCO3 polymorphs and a natural sample of leucophoenicite [Mn7Si3O12(OH)2] validated the suitability of the beamline experimental setup to: (i) locate and characterize pressure-induced phase transitions; (ii) solve ab initio the crystal structure of high-pressure polymorphs; (iii) perform fine structural analyses at the atomic scale as a function of pressure; (iv) disclose complex symmetry and structural features undetected using conventional X-ray sources.

scholarly journals Revealing the atomic ordering of binary intermetallics using in situ heating techniques at multilength scales

2019 ◽  
Vol 116 (6) ◽  
pp. 1974-1983 ◽  
Author(s):  
Yin Xiong ◽  
Yao Yang ◽  
Howie Joress ◽  
Elliot Padgett ◽  
Unmukt Gupta ◽  
...  
Keyword(s):  
Proton Exchange ◽  
Atomic Scale ◽  
Membrane Electrode ◽  
X Ray Diffraction ◽  
X Ray ◽  
Disorder Phase Transition ◽  
In Situ Heating ◽  
Co Nanoparticles ◽  
The Impact

Ordered intermetallic nanoparticles are promising electrocatalysts with enhanced activity and durability for the oxygen-reduction reaction (ORR) in proton-exchange membrane fuel cells (PEMFCs). The ordered phase is generally identified based on the existence of superlattice ordering peaks in powder X-ray diffraction (PXRD). However, after employing a widely used postsynthesis annealing treatment, we have found that claims of “ordered” catalysts were possibly/likely mixed phases of ordered intermetallics and disordered solid solutions. Here, we employed in situ heating, synchrotron-based, X-ray diffraction to quantitatively investigate the impact of a variety of annealing conditions on the degree of ordering of large ensembles of Pt3Co nanoparticles. Monte Carlo simulations suggest that Pt3Co nanoparticles have a lower order–disorder phase transition (ODPT) temperature relative to the bulk counterpart. Furthermore, we employed microscopic-level in situ heating electron microscopy to directly visualize the morphological changes and the formation of both fully and partially ordered nanoparticles at the atomic scale. In general, a higher degree of ordering leads to more active and durable electrocatalysts. The annealed Pt3Co/C with an optimal degree of ordering exhibited significantly enhanced durability, relative to the disordered counterpart, in practical membrane electrode assembly (MEA) measurements. The results highlight the importance of understanding the annealing process to maximize the degree of ordering in intermetallics to optimize electrocatalytic activity.

In Situ Investigations of Chemical Reactions on Surfaces by X-Ray Diffraction at Atomospheric Pressures

MRS Bulletin ◽  
2007 ◽  
Vol 32 (12) ◽  
pp. 1010-1014 ◽  
Author(s):  
S. Ferrer ◽  
M. D. Ackermann ◽  
E. Lundgren
Keyword(s):  
Research Field ◽  
Catalytic Reactions ◽  
Atomic Scale ◽  
Oxidation Reactions ◽  
X Ray Diffraction ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
X Ray ◽  
Adsorption Sites

AbstractCatalytic reactions occurring at metal surfaces and nanoparticles have been an established research field for decades, yielding information on adsorption sites and reaction pathways under ultrahigh-vacuum conditions. Recent experimental developments have made it possible to perform well-controlled in situ surface x-ray diffraction measurements from single-crystal surfaces and nanoparticles under industrially relevant conditions. In this way, a new understanding of atomic-scale processes at surfaces and nanoparticles occurring during catalytic reactions under realistic conditions has been gained. In particular, the identification of the formation of thin oxides on model catalysts and their role in oxidation reactions demonstrates the importance of in situ probes under relevant conditions.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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