scholarly journals Development of electron energy-loss spectroscopy in the biological sciences

MRS Bulletin ◽  
2012 ◽  
Vol 37 (1) ◽  
pp. 53-62 ◽  
Author(s):  
M.A. Aronova ◽  
R.D. Leapman
Keyword(s):  
Biological Sciences ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Image Position ◽  
Electron Energy Loss

Abstract

A Poor Man’s Approach to Semi-Quantitative Analysis with Electron Energy Loss Spectroscopy

1980 ◽  
Vol 38 ◽  
pp. 110-111
Author(s):  
M. Isaacson
Keyword(s):  
Quantitative Analysis ◽  
Energy Loss ◽  
Electron Energy ◽  
Cross Section ◽  
Electron Energy Loss Spectroscopy ◽  
Excitation Cross Section ◽  
Incident Electron ◽  
Integral Cross Section ◽  
Image Position ◽  
Electron Energy Loss

In an earlier paper1 it was found that to a good approximation, the efficiency of collection of electrons that had lost energy due to an inner shell excitation could be written as where σE was the total excitation cross-section and σE(θ, Δ) was the integral cross-section for scattering within an angle θ and with an energy loss up to an energy Δ from the excitation edge, EE. We then obtained: where , with P being the momentum of the incident electron of velocity v. The parameter r was due to the assumption that d2σ/dEdΩ∞E−r for energy loss E. In reference 1 it was assumed that r was a constant.

Annealing-induced lattice recovery in room-temperature xenon irradiated CeO2: X-ray diffraction and electron energy loss spectroscopy experiments

2015 ◽  
Vol 30 (9) ◽  
pp. 1555-1562 ◽  
Author(s):  
Janne Pakarinen ◽  
Lingfeng He ◽  
Abdel-Rahman Hassan ◽  
Yongqiang Wang ◽  
Mahima Gupta ◽  
...  
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Room Temperature ◽  
X Ray Diffraction ◽  
X Ray ◽  
Image Position ◽  
Electron Energy Loss

Abstract

Measuring optical properties of individual SnO2 nanowires via valence electron energy-loss spectroscopy

2017 ◽  
Vol 32 (13) ◽  
pp. 2479-2486 ◽  
Author(s):  
Derek R. Miller ◽  
Robert E. Williams ◽  
Sheikh A. Akbar ◽  
Pat A. Morris ◽  
David W. McComb
Keyword(s):  
Optical Properties ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Valence Electron ◽  
Sno2 Nanowires ◽  
Image Position ◽  
Electron Energy Loss

Abstract

scholarly journals Ultrafast electron energy-loss spectroscopy in transmission electron microscopy

MRS Bulletin ◽  
2018 ◽  
Vol 43 (7) ◽  
pp. 497-503 ◽  
Author(s):  
Enrico Pomarico ◽  
Ye-Jin Kim ◽  
F. Javier García de Abajo ◽  
Oh-Hoon Kwon ◽  
Fabrizio Carbone ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Transmission Electron ◽  
Image Position ◽  
Electron Energy Loss

Abstract

Absolute determination of surface atomic concentration by reflection electron energy-loss spectroscopy

1988 ◽  
Vol 46 ◽  
pp. 502-503
Author(s):  
Z. L. Wang ◽  
R.F. Egerton
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Crystal Surface ◽  
Resonance Condition ◽  
Atomic Concentration ◽  
Transmission Electron ◽  
Reflection Electron Microscopy ◽  
Image Position ◽  
Electron Energy Loss

Reflection electron energy-loss spectroscopy (REELS) has been demonstrated as a useful technique for analyzing the structure of crystal surfaces. It is a combination of EELS with reflection electron microscopy (REM) performed in a transmission electron microscope. Here, we suggest a basic theory and experiment which enable REELS to determine absolutely the atomic concentration (atoms per unit volume) at a crystal surface.In the RHEED case, not all the incident electrons will travel an equal distance within the sample (fig. 1A). Under the surface-resonance condition, the incident electrons are propagating parallel or nearly parallel to the crystal surface. Then a mean travelling distance (MTD) D can be defined, along which the excitation of atomic inner shells is equivalent to the total excitation of the atomic inner shells in the dynamical scattering (fig. IB). It can be found from the analysis of experimental data as:(1)

Modulation electron energy loss spectroscopy and its application of quantitative analysis

1993 ◽  
Vol 51 ◽  
pp. 454-455
Author(s):  
Suichu Luo ◽  
John R Dunlap ◽  
David C Joy
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Bound State ◽  
Quantitative Information ◽  
Modulation Scheme ◽  
Free Electrons ◽  
Image Position ◽  
Deconvolution Techniques ◽  
Electron Energy Loss

Electron energy loss spectroscopy (EELS) gives an inportant insight into the variety of excitations a sample may undergo when irradiated by an electron beam. The focus of this work was to simulate electronic excitations within the energy range from a few to several hundred eV. Our recently developed modulation scheme, combines both convolution and deconvolution techniques, to provide quantitative information about elementary inelastic scattering processes without knowledge of sample parameters such as thickness or optical constants.In the low energy loss region of the spectrum the primary excitation mechanisms include interband transitions, and surface and bulk plasmons. In general these individual excitation events overlap in the spectrum. A FFT convolution procedure was developed where the basic inelastic processes may be represented by the dielectric theory . The dielectric function ε is used to describe both single excitations and collective excitations, where Here ωp2=4πNe2/m is the bulk plasmon frequency, N is number of free electrons per unit volume, e and m are the charge and mass of the electron respectively and ω0 is a constant which is finite for a bound state but zero for a free electron.

Data Acquisition and Handling Unit for a Quantitative Use of Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 232-233 ◽  
Author(s):  
P. Trebbia ◽  
P. Ballongue ◽  
C. Colliex
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Single Channel ◽  
Detection System ◽  
Surface Barrier ◽  
Solid State Detector ◽  
Electrostatic Mirror ◽  
Electron Energy Loss

An effective use of electron energy loss spectroscopy for chemical characterization of selected areas in the electron microscope can only be achieved with the development of quantitative measurements capabilities.The experimental assembly, which is sketched in Fig.l, has therefore been carried out. It comprises four main elements.The analytical transmission electron microscope is a conventional microscope fitted with a Castaing and Henry dispersive unit (magnetic prism and electrostatic mirror). Recent modifications include the improvement of the vacuum in the specimen chamber (below 10-6 torr) and the adaptation of a new electrostatic mirror.The detection system, similar to the one described by Hermann et al (1), is located in a separate chamber below the fluorescent screen which visualizes the energy loss spectrum. Variable apertures select the electrons, which have lost an energy AE within an energy window smaller than 1 eV, in front of a surface barrier solid state detector RTC BPY 52 100 S.Q. The saw tooth signal delivered by a charge sensitive preamplifier (decay time of 5.10-5 S) is amplified, shaped into a gaussian profile through an active filter and counted by a single channel analyser.

Trends in Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 228-229
Author(s):  
C. Colliex ◽  
P. Trebbia
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Materials Science ◽  
Analytical Technique ◽  
Recent Developments ◽  
Quantitative Results ◽  
Electron Microscopes ◽  
Electron Energy Loss ◽  
Primary Electrons

The physical foundations for the use of electron energy loss spectroscopy towards analytical purposes, seem now rather well established and have been extensively discussed through recent publications. In this brief review we intend only to mention most recent developments in this field, which became available to our knowledge. We derive also some lines of discussion to define more clearly the limits of this analytical technique in materials science problems.The spectral information carried in both low ( 0<ΔE<100eV ) and high ( >100eV ) energy regions of the loss spectrum, is capable to provide quantitative results. Spectrometers have therefore been designed to work with all kinds of electron microscopes and to cover large energy ranges for the detection of inelastically scattered electrons (for instance the L-edge of molybdenum at 2500eV has been measured by van Zuylen with primary electrons of 80 kV). It is rather easy to fix a post-specimen magnetic optics on a STEM, but Crewe has recently underlined that great care should be devoted to optimize the collecting power and the energy resolution of the whole system.

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