Phase formation and crystal growth of Sr–Bi–Ta–O thin films grown by metalorganic chemical vapor deposition

2001 ◽  
Vol 16 (10) ◽  
pp. 2966-2973 ◽  
Author(s):  
H. Bachhofer ◽  
H. von Philipsborn ◽  
W. Hartner ◽  
C. Dehm ◽  
B. Jobst ◽  
...  

The crystallization process of SrxBiyTa2O5+x+3y/2 thin films grown by metalorganic chemical vapor deposition was investigated. Phase formation and crystal growth is greatly affected by the film composition and crystallization temperature. Phase diagrams for varying Sr or Bi contents were determined as a function of the crystallization temperature. The higher the Sr or Bi content in the film, the lower the phase transition temperature from the amorphous to the fluorite-type phase and from the fluorite-type to the Bi-layered Aurivillius phase. Low Sr and Bi contents support pyrochlore-type phase formation as a second phase. During annealing, excess Bi is not lost due to evaporation, but due to migration to the bottom electrode. Contrary to the fluorite-type phase, the Aurivillius phase is not able to incorporate the excess of Bi atoms. Decreasing grain size and pyrochlore-type phase formation entail decreasing remanent polarization.

2000 ◽  
Vol 87 (10) ◽  
pp. 7430-7437 ◽  
Author(s):  
Y. Gao ◽  
C. L. Perkins ◽  
S. He ◽  
P. Alluri ◽  
T. Tran ◽  
...  

1994 ◽  
Vol 361 ◽  
Author(s):  
D.L. Kaiser ◽  
M.D. Vaudin ◽  
L.D. Rotter ◽  
Z.L. Wang ◽  
J.P. Cline ◽  
...  

ABSTRACTMetalorganic chemical vapor deposition (MOCVD) was used to deposit epitaxial BaTiO3 thin films on (100) MgO substrates at 600°C. The metalorganic precursors employed in the deposition experiments were hydrated Ba(thd)2 (thd = C11H19O2) and titanium isopropoxide. The films were analyzed by means of transmittance spectroscopy, wavelength dispersive x-ray spectrometry, secondary ion mass spectrometry depth profiling, x-ray diffraction, high resolution transmission electron microscopy, selected area electron diffraction, nanoscale energy dispersive x-ray spectrometry and second harmonic generation measurements. There was no evidence for interdiffusion between the film and substrate. The x-ray and electron diffraction studies showed that the films were oriented with the a-axis normal to the substrate surface, whereas second harmonic generation measurements showed that the films had some c-axis character.


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