Aspects of Silicon Contamination Control by Lifetime Measurements

2009 ◽  
pp. 30-30-15 ◽  
Author(s):  
G Zoth
Keyword(s):  
Lifetime Measurements ◽  
Contamination Control ◽  
Silicon Contamination

Angular correlation and lifetime measurements in Ne

1968 ◽  
Vol 111 (1) ◽  
pp. 529-550
Author(s):  
W KUTSCHERA ◽  
D PELTE ◽  
G SCHRIEDER
Keyword(s):  
Angular Correlation ◽  
Lifetime Measurements

DELAYED COINCIDENCE AUGER ELECTRON LIFETIME MEASUREMENTS

1979 ◽  
Vol 40 (C1) ◽  
pp. C1-221-C1-222
Author(s):  
S. Schumann ◽  
I. A. Sellin ◽  
R. Mann ◽  
H. J. Frischkorn ◽  
D. Rosich ◽  
...  
Keyword(s):  
Auger Electron ◽  
Electron Lifetime ◽  
Lifetime Measurements

Validity-Study of Commercial Semiconductor with TO-18 Package for Space Application by PIND Test

2013 ◽  
Author(s):  
Yusuke Nakatake ◽  
Makoto Okabe ◽  
Shota Sato
Keyword(s):  
Industrial Applications ◽  
Validity Study ◽  
Space Application ◽  
Noise Detection ◽  
Foreign Material ◽  
Contamination Control ◽  
X Ray ◽  
Impact Noise ◽  
Report Analysis ◽  
Foreign Materials

Abstract In this paper, we carried out PIND (Particle Impact Noise Detection) test and X-ray inspection of a transistor in a TO-18 package for commercial and industrial applications. From our evaluation results, we explain the validity of the PIND test by comparing PIND test and X-ray inspection results. We make clear that PIND test is able to detect internal foreign material that may be transparent to X-ray inspection. In addition, we report analysis results of internal foreign materials from defective devices. This matter suggests that a problem is contamination control in the manufacturing process, most likely the sealing process.

Seeking the Good Fitting Procedure of PALS Polymer Spectra

2008 ◽  
Vol 607 ◽  
pp. 64-66
Author(s):  
Nicolas Laforest ◽  
Jérémie De Baerdemaeker ◽  
Corine Bas ◽  
Charles Dauwe
Keyword(s):  
Experimental Data ◽  
Low Temperature ◽  
Positron Annihilation ◽  
Physical Meaning ◽  
Lifetime Measurements ◽  
Positron Annihilation Lifetime ◽  
Fitting Procedure ◽  
Fitting Procedures ◽  
Blob Model

Positron annihilation lifetime measurements on polymethylmethacrylate (PMMA) at low temperature were performed. Different discrete fitting procedures have been used to analyze the experimental data. It shows that the extracted parameters depend strongly on the fitting procedure. The physical meaning of the results is discussed. The blob model seems to give the best annihilation parameters.

scholarly journals Bacterial contamination control mats: a comparative study

1977 ◽  
Vol 79 (1) ◽  
pp. 133-140 ◽  
Author(s):  
H. M. Meddick
Keyword(s):  
Comparative Study ◽  
Working Conditions ◽  
Bacterial Contamination ◽  
Contamination Control ◽  
Different Types

SUMMARYThe ability of six different types of contamination control mats currently in use at the entrances to theatre suites and other clean areas to remove bacteria-carrying particles from theatre trolley wheels was compared. Marked differences in the effectiveness of this property were obtained; and all mats showed some disadvantages. Modification of one of the mats has resulted in improved efficiency under working conditions.

Collective properties of neutron-deficient Nd isotopes: Lifetime measurements of the yrast states in Nd136

2021 ◽  
Vol 103 (4) ◽  
Author(s):  
A. Turturică ◽  
C. Costache ◽  
P. Petkov ◽  
J.-P. Delaroche ◽  
M. Girod ◽  
...  
Keyword(s):  
Nd Isotopes ◽  
Lifetime Measurements

scholarly journals Decoupling bulk and surface recombination properties in silicon by depth-dependent carrier lifetime measurements

2021 ◽  
Vol 118 (25) ◽  
pp. 252105
Author(s):  
K. Yokoyama ◽  
J. S. Lord ◽  
J. Miao ◽  
P. Murahari ◽  
A. J. Drew
Keyword(s):  
Carrier Lifetime ◽  
Surface Recombination ◽  
Lifetime Measurements
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