scholarly journals Study of thin-film thickness and density by high-resolution Rutherford backscattering spectrometry and X-ray reflectivity

2009 ◽  
Vol 34 (4) ◽  
pp. 613-615 ◽  
Author(s):  
Amane Kitahara ◽  
Satoshi Yasuno ◽  
Kazuhisa Fujikawa
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Film Thickness ◽  
Rutherford Backscattering Spectrometry ◽  
Rutherford Backscattering ◽  
Thin Film Thickness ◽  
X Ray

Ultra-High Resolution Thin Film Thickness Delineation Using Reflection Phase-Sensitive Acoustic Microscopy

2011 ◽  
pp. 125-134 ◽  
Author(s):  
E. A. Mohamed ◽  
A. Kamanyi ◽  
M. von Buttlar ◽  
R. Wannemacher ◽  
K. Hillmann ◽  
...  
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Film Thickness ◽  
Acoustic Microscopy ◽  
Thin Film Thickness ◽  
Reflection Phase ◽  
Phase Sensitive

Determination of the polymeric thin film thickness by energy dispersive X-ray fluorescence and multivariate analysis

2020 ◽  
Vol 167 ◽  
pp. 105818 ◽  
Author(s):  
Eduardo de Almeida ◽  
Fábio L. Melquiades ◽  
João P.R. Marques ◽  
Eva Marguí ◽  
Hudson W.P. de Carvalho
Keyword(s):  
Thin Film ◽  
Multivariate Analysis ◽  
Film Thickness ◽  
Energy Dispersive ◽  
Thin Film Thickness ◽  
X Ray ◽  
Polymeric Thin Film
Sign in / Sign up

Export Citation Format

Share Document