scholarly journals Quantitative Analysis of the Strain Field beneath the Si3N4/Si(001) Interface Formed by the Xe/NH3 Plasma Nitridation using a Multiple-Wave X-ray Diffraction Phenomenon

2009 ◽  
Vol 34 (4) ◽  
pp. 597-599
Author(s):  
Wataru Yashiro ◽  
Yoshitaka Yoda ◽  
Takashi Aratani ◽  
Akinobu Teramoto ◽  
Takeo Hattori ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Strain Field ◽  
X Ray Diffraction ◽  
Multiple Wave ◽  
X Ray ◽  
Plasma Nitridation ◽  
Diffraction Phenomenon

scholarly journals Strain Field under the SiO2/Si Interface Revealed by a Multiple-Wave X-ray Diffraction Phenomenon

2007 ◽  
Vol 32 (1) ◽  
pp. 227-229
Author(s):  
Wataru Yashiro ◽  
Shuji Kusano ◽  
Kazushi Miki ◽  
Yoshitaka Yoda ◽  
Kensuke Takahashi, ◽  
...  
Keyword(s):  
Strain Field ◽  
X Ray Diffraction ◽  
Multiple Wave ◽  
X Ray ◽  
Diffraction Phenomenon

A simple and low-cost solution for the automation of X-ray powder diffractometers with chart recorder output

2006 ◽  
Vol 39 (4) ◽  
pp. 626-629
Author(s):  
M. Jayaprakasan ◽  
V. Kannan ◽  
P. Ramasamy
Keyword(s):  
Quantitative Analysis ◽  
Low Cost ◽  
Hard Copy ◽  
X Ray Diffraction ◽  
Raw Data ◽  
Crystalline Materials ◽  
X Ray ◽  
Strip Chart ◽  
Controlled Systems ◽  
Chart Recorder

X-ray powder diffraction is an established method for the qualitative identification of crystalline materials and their quantitative analysis. The new generation of X-ray diffraction systems are based on expensive digital/embedded control technology and computer interfaces. Yet many laboratories use conventional manual-controlled systems withXYstrip-chart recorders. Since the output spectrum is a strip chart (hard copy), raw data, essential for structural and qualitative analysis, are not readily available for further analysis. Upgrading to modern computerized diffractometers is very expensive. The proposed automation design described here is intended to enable the conventional diffractometer user to collect, store and analyze data quickly. The design also improves the resolution by five times compared with the conventional setup. For the automation, a PC add-on card has been designed to control and collect the timing and intensity counts from the conventional X-ray diffractometer, and suitable software has been developed to collect, process and present the X-ray diffraction data for both qualitative and quantitative analysis. Moreover, a major advantage of this design is that it does not warrant any physical modification of the hardware of the conventional setup; it is simply an extension to enhance the performance of collecting raw data with a higher resolution at desired intervals/timings.

Crystallization of simonkolleite (Zn5Cl2(OH)8 ∙ H2O) in powder samples prepared for mineral composition analysis by quantitative X-ray diffraction (QXRD)

Nafta-Gaz ◽  
2021 ◽  
Vol 77 (5) ◽  
pp. 293-298
Author(s):  
Urszula Zagórska ◽  
◽  
Sylwia Kowalska ◽  
Keyword(s):  
Quantitative Analysis ◽  
Internal Standard ◽  
Mineralogical Composition ◽  
Hydrocarbon Exploration ◽  
Composition Analysis ◽  
Internal Standard Method ◽  
X Ray Diffraction ◽  
Method Error ◽  
X Ray ◽  
Significant Difference

The analysis of mineralogical composition by quantitative X-ray diffraction (QXRD) is one of the standard research methods used in hydrocarbon exploration. In order to improve it and to obtain better results, the methodology of quantitative analysis used at Well Logging Department is being periodically (more or less) modified. After the introduction of the improvements, comparative analyses were performed on archival samples. Reflections from an unidentified phase which did not occur in the tested Rotliegend sandstone samples were noticed on X-ray diffractograms of archival samples. Reflections of a mineral called simonkolleite were identified in the X-ray diffraction database. Chemically it is a hydrated zinc chloride of the formula: Zn5Cl2(OH)8 × H2O. Analysis of the composition of samples in which simonkolleite crystallised, indicated that the mineral is being formed in the result of the slow reaction of zinc oxide with halite (NaCl) and water vapour. An attempt was made to determine the influence of the presence of this mineral on the results of the quantitative analysis of mineralogical composition. The above methodology was applied on a group of ten samples. The results of the quantitative analysis conducted for archival samples stored with added zincite standard containing simonkolleite and for new, freshly grinded (without artifact) samples were compared. The comparison of the obtained results showed a slight influence of this mineral on the quantitative composition of the remaining components. The difference between the results usually did not exceed the method error. At the same time a significant difference in the calculated content of the internal standard was noted – on average 1% less in archival than in new samples. This shows that the reaction occurring in the archival samples will affect the evaluation of the quality of the obtained quantitative analysis, at the same time excluding the possibility of determining the rock’s amorphous substance content with the internal standard method.

The application of the in situ high-temperature X-ray diffraction quantitative analysis

2008 ◽  
Vol 452 (2) ◽  
pp. 446-450 ◽  
Author(s):  
Qiuguo Xiao ◽  
Ling Huang ◽  
Hui Ma ◽  
Xinhua Zhao
Keyword(s):  
High Temperature ◽  
Quantitative Analysis ◽  
X Ray Diffraction ◽  
X Ray

Grazing-angle Incidence X-ray Diffraction by the Si1-α(x)-β(x)Geβ(x)Cβ(x)/Si Heterojunction where the Germanium and the Carbon Concentrations are Periodically Varying along the Flat Layer Surface

2002 ◽  
Vol 716 ◽  
Author(s):  
Hayk H. Bezirganyan ◽  
Siranush E. Bezirganyan ◽  
Hakob P. Bezirganyan ◽  
Petros H. Bezirganyan
Keyword(s):  
Strain Field ◽  
Grazing Angle ◽  
Layer Surface ◽  
X Ray Diffraction ◽  
X Ray ◽  
Intermediate Transformation ◽  
Long Period ◽  
Theoretical Paper ◽  
Carbon Concentrations ◽  
Coherent Part

AbstractPresented theoretical paper concerns the investigation of SiGeC/Si heterojunction by the Grazing-angle Incidence X-ray Diffraction (GIXD) method. We consider a possibility in principal of the GIXD by the specific long-range harmonic variations of the germanium and carbon compositions in the thin SiGeC layer. Evaluation of the theoretically calculated coherent part of x-radiation scattered by the SiGeC layer points the way to the experimental direct investigations of the long-period structured intermediate transformation states of SiGeC layer that emerge owing to inhomogeneity of the strain field along the heterojunction surface.

scholarly journals PHYSICOCHEMICAL STUDY AND QUANTITATIVE ANALYSIS SWARNA MAKSHIKA BHASMA.

2021 ◽  
Vol 9 (1) ◽  
Author(s):  
Rajni Bhardwaj ◽  
Smita Johar ◽  
Amit Kapila ◽  
Amandeep Sharma
Keyword(s):  
Particle Size ◽  
Quantitative Analysis ◽  
Iron Oxide ◽  
Major Element ◽  
X Ray Diffraction ◽  
X Ray ◽  
Minor Elements ◽  
Rhombohedral Crystal ◽  
Main Component ◽  
Reddish Brown Color

Swarnamakshika is grouped under Updhatu of Swarna and is composed of Copper, Iron and Sulphur. In this study Swarnamakshika was subjected to Shodhana by Bharjana with Nimbuka swarasa and Shudha Swarnamakshika was given Bhavana with Nimbuka swarasa and subjected to Varahaputa. With ten Varahaputa Bhasma Siddhi Lakshanas were attained swarnamakshika Marana was done by using Nimbuka swarasa until bhasma siddi lakshanas found and it took 10 puta till it attained reddish brown color. The X-ray diffraction analysis showed that d-identified peaks after 10th puta Swarnamakshika bhasma composition is of Iron oxide with rhombohedral crystal system as main component. EDX analysis of Swarna makshika bhasma shows that it contains Iron and Oxygen, as major element and Copper, Sulphur, Carbon, Aluminium, Calcium etc. as minor elements. FESEM study revealed that the particle size of Ashudha and Shudha Swarnamakshika was in the range of 500 nm-3nm. Keywords: Swarnamakshika Bhasma, Nimbuka swarasa, puta

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