scholarly journals Electrical characterization of thin silicon films produced by metal-induced crystallization on insulating substrates by conductive AFM

2011 ◽  
Vol 17 (3) ◽  
pp. 260-263 ◽  
Author(s):  
Oxana Shamiryan ◽  
Ivan Maidanchuk ◽  
Nari Ahn ◽  
Ilsang Choi ◽  
Chung Ho Kyoon
Keyword(s):  
Electrical Characterization ◽  
Silicon Films ◽  
Conductive Afm ◽  
Metal Induced Crystallization ◽  
Thin Silicon ◽  
Induced Crystallization ◽  
Insulating Substrates

Synthesis of Lithography Free Micro-Nano Electron Field Emitters Using Pulsed KrF Laser Assisted Metal Induced Crystallization of Thin Silicon Films

2020 ◽  
Vol 204 (1) ◽  
pp. 121-132
Author(s):  
Mohammed Zubair Mohammed Shamim ◽  
Saydulla Persheyev ◽  
Monji Zaidi ◽  
Mohammed Usman ◽  
Mohammad Shiblee ◽  
...  
Keyword(s):  
Silicon Films ◽  
Metal Induced Crystallization ◽  
Field Emitters ◽  
Krf Laser ◽  
Electron Field ◽  
Thin Silicon ◽  
Induced Crystallization

A simple quality factor for characterization of thin silicon films

2008 ◽  
Vol 354 (19-25) ◽  
pp. 2227-2230 ◽  
Author(s):  
J. Kočka ◽  
T. Mates ◽  
M. Ledinský ◽  
H. Stuchlíková ◽  
J. Stuchlík ◽  
...  
Keyword(s):  
Quality Factor ◽  
Silicon Films ◽  
Thin Silicon

Scalable Approach for Amorphous Thin Silicon Films Near‐IR Laser‐Induced Crystallization Using Nickel Absorption Layer

2019 ◽  
Vol 216 (11) ◽  
pp. 1800964
Author(s):  
Alexey A. Serdobintsev ◽  
Ilya O. Kozhevnikov ◽  
Andrey V. Starodubov ◽  
Peter V. Ryabukho ◽  
Victor V. Galushka ◽  
...  
Keyword(s):  
Silicon Films ◽  
Absorption Layer ◽  
Near Ir ◽  
Ir Laser ◽  
Thin Silicon ◽  
Induced Crystallization

Electrical characterization of self-assembled single- and double-stranded DNA monolayers using conductive AFM

2006 ◽  
Vol 131 ◽  
pp. 367-376 ◽  
Author(s):  
Hezy Cohen ◽  
Claude Nogues ◽  
Daniela Ullien ◽  
Shirley Daube ◽  
Ron Naaman ◽  
...  
Keyword(s):  
Electrical Characterization ◽  
Conductive Afm ◽  
Dna Monolayers ◽  
Double Stranded Dna ◽  
Self Assembled

Structural, optical and electrical characterization of porous silicon prepared on thin silicon epitaxial layer

2009 ◽  
Vol 924-926 ◽  
pp. 285-290 ◽  
Author(s):  
M. Balarin ◽  
O. Gamulin ◽  
M. Ivanda ◽  
M. Kosović ◽  
D. Ristić ◽  
...  
Keyword(s):  
Porous Silicon ◽  
Epitaxial Layer ◽  
Electrical Characterization ◽  
Silicon Epitaxial Layer ◽  
Thin Silicon
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