Evaluation and Data Analysis of Biological Samples and Biomolecules by Means of Time-of-flight Secondary Ion Mass Spectrometry with Cluster Ion Beam

Satoka AOYAGI

doi:10.1380/vss.61.458

Evaluation and Data Analysis of Biological Samples and Biomolecules by Means of Time-of-flight Secondary Ion Mass Spectrometry with Cluster Ion Beam

Vacuum and Surface Science ◽

10.1380/vss.61.458 ◽

2018 ◽

Vol 61 (7) ◽

pp. 458-462

Author(s):

Satoka AOYAGI

Keyword(s):

Mass Spectrometry ◽

Data Analysis ◽

Biological Samples ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Secondary Ion

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Three-Dimensional Image of Cleavage Bodies in Nuclei Is Configured Using Gas Cluster Ion Beam with Time-of-Flight Secondary Ion Mass Spectrometry

Scientific Reports ◽

10.1038/srep10000 ◽

2015 ◽

Vol 5 (1) ◽

Cited By ~ 4

Author(s):

Noritaka Masaki ◽

Itsuko Ishizaki ◽

Takahiro Hayasaka ◽

Gregory L. Fisher ◽

Noriaki Sanada ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Three Dimensional ◽

Time Of Flight ◽

Dimensional Image ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Secondary Ion

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Exploiting the Semidestructive Nature of Gas Cluster Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Imaging for Simultaneous Localization and Confident Lipid Annotations

Analytical Chemistry ◽

10.1021/acs.analchem.9b03763 ◽

2019 ◽

Vol 91 (23) ◽

pp. 15073-15080 ◽

Cited By ~ 6

Author(s):

Tina B. Angerer ◽

Dusan Velickovic ◽

Carrie D. Nicora ◽

Jennifer E. Kyle ◽

Daniel J. Graham ◽

...

Keyword(s):

Mass Spectrometry ◽

Mass Spectrometry Imaging ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Secondary Ion

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Characteristics of a mixed-gas cluster ion beam for time-of-flight secondary ion mass spectrometry

Applied Surface Science ◽

10.1016/j.apsusc.2021.151467 ◽

2022 ◽

Vol 572 ◽

pp. 151467

Author(s):

Sang Ju Lee ◽

Aram Hong ◽

Jinwan Cho ◽

Chang Min Choi ◽

Ji Young Baek ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Mixed Gas ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Secondary Ion

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Are cluster ion analysis beams good choices for hydrogen depth profiling using time-of-flight secondary ion mass spectrometry?

Surface and Interface Analysis ◽

10.1002/sia.3776 ◽

2011 ◽

Vol 44 (1) ◽

pp. 89-93 ◽

Cited By ~ 10

Author(s):

Zihua Zhu ◽

Vaithiyalingam Shutthanandan

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Secondary Ion ◽

Ion Analysis

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Particle-based chemical oscillation as a function of depth in latex films using gas cluster ion beam secondary ion mass spectrometry profiling

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.5024044 ◽

2018 ◽

Vol 36 (3) ◽

pp. 03E105

Author(s):

Michaeleen L. Pacholski ◽

Zhaohui Qu ◽

Wuye Ouyang ◽

Zhibo Zheng ◽

Rong Wang

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Latex Films ◽

Chemical Oscillation ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Secondary Ion

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Application of Chemometrics into Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Data Analysis

Journal of the Vacuum Society of Japan ◽

10.3131/jvsj2.55.139 ◽

2012 ◽

Vol 55 (4) ◽

pp. 139-143

Author(s):

Satoka AOYAGI

Keyword(s):

Mass Spectrometry ◽

Data Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Comparison of the Spectra of LiCoO2, CoO, and Co3O4 by Time-of-Flight Secondary Ion Mass Spectrometry with Focused Ion Beam (FIB-TOF-SIMS)

Journal of the Vacuum Society of Japan ◽

10.3131/jvsj2.56.122 ◽

2013 ◽

Vol 56 (4) ◽

pp. 122-124 ◽

Cited By ~ 2

Author(s):

Miwa OHNISHI ◽

Osamu MATSUOKA ◽

Hidenobu NOGI ◽

Tetsuo SAKAMOTO

Keyword(s):

Mass Spectrometry ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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A New Focused Ion Beam Optical System for a Time-of-flight-Secondary Ion Mass Spectrometry Instrument

Rapid Communications in Mass Spectrometry ◽

10.1002/(sici)1097-0231(19970131)11:2<175::aid-rcm725>3.0.co;2-k ◽

1997 ◽

Vol 11 (2) ◽

pp. 175-178 ◽

Cited By ~ 4

Author(s):

H. Shichi ◽

S. Osabe ◽

K. Kanehori

Keyword(s):

Mass Spectrometry ◽

Optical System ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Mass Spectrometry Instrument ◽

Ion Mass Spectrometry ◽

Secondary Ion

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A C60Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics

Analytical Chemistry ◽

10.1021/ac026338o ◽

2003 ◽

Vol 75 (7) ◽

pp. 1754-1764 ◽

Cited By ~ 420

Author(s):

Daniel Weibel ◽

Steve Wong ◽

Nicholas Lockyer ◽

Paul Blenkinsopp ◽

Rowland Hill ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Beam System ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Quantitative analysis of lipids with argon gas cluster ion beam secondary ion mass spectrometry

Surface and Interface Analysis ◽

10.1002/sia.5518 ◽

2014 ◽

Vol 46 (12-13) ◽

pp. 1129-1132

Author(s):

Makiko Fujii ◽

Shunichirou Nakagawa ◽

Toshio Seki ◽

Takaaki Aoki ◽

Jiro Matsuo

Keyword(s):

Mass Spectrometry ◽

Quantitative Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Argon Gas ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Secondary Ion

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