A C60Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

2003 ◽  
Vol 75 (7) ◽  
pp. 1754-1764 ◽  
Author(s):  
Daniel Weibel ◽  
Steve Wong ◽  
Nicholas Lockyer ◽  
Paul Blenkinsopp ◽  
Rowland Hill ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Time Of Flight ◽  
Beam System ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Detection of ZrO2 Nanoparticles in Lung Tissue Sections by Time-of-Flight Secondary Ion Mass Spectrometry and Ion Beam Microscopy

Nanomaterials ◽  
2018 ◽  
Vol 8 (1) ◽  
pp. 44 ◽  
Author(s):  
Lothar Veith ◽  
Julia Böttner ◽  
Antje Vennemann ◽  
Daniel Breitenstein ◽  
Carsten Engelhard ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Lung Tissue ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Time Of Flight ◽  
Zro2 Nanoparticles ◽  
Tissue Sections ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

An ion beam system for ion scattering, bombardment induced light emission and secondary ion mass spectrometry

Vacuum ◽  
1984 ◽  
Vol 34 (1-2) ◽  
pp. 217-221
Author(s):  
DG Armour ◽  
JJ Jimenez-Rodriguez ◽  
CH Barber ◽  
K Snowdon ◽  
P Hedbavny
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Light Emission ◽  
Ion Beam ◽  
Ion Scattering ◽  
Beam System ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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