scholarly journals Atomic Structures of SiO2/Si and Ge/Si Interfaces Studied by Using Medium-Energy Ion Scattering.

Hyomen Kagaku ◽  
1993 ◽  
Vol 14 (7) ◽  
pp. 397-403
Author(s):  
Takashi NISHIOKA ◽  
Koji SUMITOMO
Keyword(s):  
Medium Energy ◽  
Ion Scattering ◽  
Atomic Structures ◽  
Medium Energy Ion Scattering

A compact vacuum-ultraviolet beamline for synchrotron radiation photoelectron spectroscopy combined with an ion-scattering spectrometer, SORIS

1998 ◽  
Vol 5 (3) ◽  
pp. 557-558 ◽  
Author(s):  
Hidetoshi Namba ◽  
Makoto Obara ◽  
Daisuke Kawakami ◽  
Tomoaki Nishimura ◽  
Yonglian Yan ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Storage Ring ◽  
Photoelectron Spectroscopy ◽  
Vacuum Ultraviolet ◽  
Beam Size ◽  
Medium Energy ◽  
Ion Scattering ◽  
Atomic Structures ◽  
Medium Energy Ion Scattering

Apparatus for high-resolution synchrotron radiation photoelectron spectroscopy combined with high-resolution medium-energy ion scattering, named `SORIS', has been developed for simultaneous investigations of electronic states and atomic structures on surfaces. For this purpose, a compact vacuum-ultraviolet beamline of photon energy from 5 to 700 eV has been designed for the small storage ring `Aurora' installed at Ritsumeikan University. Owing to the small electron-beam size in the storage ring, an energy resolution E/dE of >5000 can be obtained.

Structure Determination of the Nisi2(111) Surface Using Medium Energy Ion Scattering with Monolayer Resolution

1990 ◽  
Vol 202 ◽  
Author(s):  
J. Vrijmoeth ◽  
P.M. Zagwijn ◽  
J.W.M. Frenken ◽  
J.F. van der Veen
Keyword(s):  
Surface Structure ◽  
Structure Determination ◽  
New Method ◽  
Medium Energy ◽  
Ion Scattering ◽  
Triple Layer ◽  
Medium Energy Ion Scattering

ABSTRACTThe surface structure of epitaxial NiSi2 films grown on Si (111) has been determined using a new method. The backscattering signals from subsequent Ni layers in the NiSi2 (111) surface are resolved.The topology of the NiSi2 (111) surface is concluded to be bulklike, i.e., it is terminated by a Si – Ni – Si triple layer.

Depth-profiling the composition of bimetallic nanoparticles using medium energy ion scattering

2011 ◽  
Vol 605 (1-2) ◽  
pp. 220-224 ◽  
Author(s):  
Johan Gustafson ◽  
Andrew R. Haire ◽  
Christopher J. Baddeley
Keyword(s):  
Bimetallic Nanoparticles ◽  
Depth Profiling ◽  
Medium Energy ◽  
Ion Scattering ◽  
Medium Energy Ion Scattering

Surface structure of sphalerite studied by medium energy ion scattering and XPS

2007 ◽  
Vol 601 (2) ◽  
pp. 352-361 ◽  
Author(s):  
S.L. Harmer ◽  
L.V. Goncharova ◽  
R. Kolarova ◽  
W.N. Lennard ◽  
M.A. Muñoz-Márquez ◽  
...  
Keyword(s):  
Surface Structure ◽  
Medium Energy ◽  
Ion Scattering ◽  
Medium Energy Ion Scattering

Film growth arising from the deposition of Au onto ani-Al–Pd–Mn quasicrystal: a medium energy ion scattering study

2006 ◽  
Vol 18 (22) ◽  
pp. 5017-5027 ◽  
Author(s):  
T C Q Noakes ◽  
P Bailey ◽  
M Draxler ◽  
C F McConville ◽  
A R Ross ◽  
...  
Keyword(s):  
Film Growth ◽  
Medium Energy ◽  
Ion Scattering ◽  
Scattering Study ◽  
Medium Energy Ion Scattering
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