Ray optics analysis of optical forces on a microsphere in a (2 + 1)D Airy beam

Shuhe Zhang; Jinhua Zhou; Yu-Xuan Ren

doi:10.1364/osac.2.000378

Ray optics analysis of optical forces on a microsphere in a (2 + 1)D Airy beam

OSA Continuum ◽

10.1364/osac.2.000378 ◽

2019 ◽

Vol 2 (2) ◽

pp. 378 ◽

Cited By ~ 2

Author(s):

Shuhe Zhang ◽

Jinhua Zhou ◽

Yu-Xuan Ren

Keyword(s):

Optical Forces ◽

Ray Optics ◽

Airy Beam

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Circularly symmetric frozen waves and their optical forces in optical tweezers using a ray optics approach

2017 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC) ◽

10.1109/imoc.2017.8121168 ◽

2017 ◽

Author(s):

Amelia Moreira Santos ◽

Pedro Paulo Justino da Silva Arantes ◽

Leonardo Andre Ambrosio

Keyword(s):

Optical Tweezers ◽

Optical Forces ◽

Ray Optics

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Rigorous full-wave calculation of optical forces on dielectric and metallic microparticles immersed in a vector Airy beam

Optics Express ◽

10.1364/oe.25.023238 ◽

2017 ◽

Vol 25 (19) ◽

pp. 23238 ◽

Cited By ~ 18

Author(s):

Wanli Lu ◽

Huajin Chen ◽

Shiyang Liu ◽

Zhifang Lin

Keyword(s):

Optical Forces ◽

Airy Beam ◽

Full Wave ◽

Wave Calculation

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Morphology-dependent resonance of the optical forces on Mie particles in an Airy beam

Optics Express ◽

10.1364/oe.21.006186 ◽

2013 ◽

Vol 21 (5) ◽

pp. 6186 ◽

Cited By ~ 10

Author(s):

Yang Yang ◽

Wei-Ping Zang ◽

Zi-Yu Zhao ◽

Jian-Guo Tian

Keyword(s):

Optical Forces ◽

Airy Beam

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X-ray microprobe for materials science

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100168013 ◽

1994 ◽

Vol 52 ◽

pp. 56-57

Author(s):

G.E. Ice

Keyword(s):

Crystallographic Orientation ◽

Local Structure ◽

Materials Science ◽

Chemical Information ◽

X Ray Diffraction ◽

Ray Optics ◽

X Ray ◽

Novel Materials ◽

New Information ◽

Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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