Deep ultraviolet photodetector based on pulsed laser deposited Cs3Cu2I5 films/n-Si heterojunction

2021 ◽  
Author(s):  
Li Xiaoxuan ◽  
Lichun Zhang ◽  
Zhou Xiaoyu ◽  
Cheng Wang ◽  
Zhou Zhiying ◽  
...  
2000 ◽  
Author(s):  
D. H. Chen ◽  
Z. M. Zhang

Abstract A simplified finite element model is built to study the thermal response of the 193-nm pulsed-laser calorimeter. The nonequivalence between pulsed-laser heating and electrical heating is estimated to be 0.46% at the thermocouple locations by comparing the calibration factors for average-power laser heating and electrical heating. This study should help the development of calibration and measurement standards in pulsed energy measurements for deep ultraviolet excimer lasers that are important for photolithographic and materials processing applications.


2014 ◽  
Vol 35 (11) ◽  
pp. 1291-1296
Author(s):  
郑剑 ZHENG Jian ◽  
乔倩 QIAO Qian ◽  
张振中 ZHANG Zhen-zhong ◽  
王立昆 WANG Li-kun ◽  
韩舜 HAN Shun ◽  
...  

2019 ◽  
Vol 11 (6) ◽  
pp. 1-8 ◽  
Author(s):  
Hui Li ◽  
Po-Wei Chen ◽  
Shuo-Huang Yuan ◽  
Tsun-Min Huang ◽  
Sam Zhang ◽  
...  

2020 ◽  
Vol 29 (12) ◽  
pp. 128502
Author(s):  
Jinhui Gao ◽  
Yehao Li ◽  
Yuxuan Hu ◽  
Zhitong Wang ◽  
Anqi Hu ◽  
...  

2020 ◽  
Vol 12 (4) ◽  
pp. 1-8 ◽  
Author(s):  
Shu-Bai Liu ◽  
Shoou-Jinn Chang ◽  
Sheng-Po Chang ◽  
Chia-Hsun Chen

Crystals ◽  
2021 ◽  
Vol 11 (9) ◽  
pp. 1046
Author(s):  
Bhera Ram Tak ◽  
Ming-Min Yang ◽  
Marin Alexe ◽  
Rajendra Singh

Gallium oxide (β-Ga2O3) is emerging as a promising wide-bandgap semiconductor for optoelectronic and high-power electronic devices. In this study, deep-level defects were investigated in pulsed-laser-deposited epitaxial films of β-Ga2O3. A deep ultraviolet photodetector (DUV) fabricated on β-Ga2O3 film showed a slow decay time of 1.58 s after switching off 250 nm wavelength illumination. Generally, β-Ga2O3 possesses various intentional and unintentional trap levels. Herein, these traps were investigated using the fractional emptying thermally stimulated current (TSC) method in the temperature range of 85 to 473 K. Broad peaks in the net TSC curve were observed and further resolved to identify the characteristic peak temperature of individual traps using the fractional emptying method. Several deep-level traps having activation energies in the range of 0.16 to 1.03 eV were identified. Among them, the trap with activation energy of 1.03 eV was found to be the most dominant trap level and it was possibly responsible for the persistent photocurrent in PLD-grown β-Ga2O3 thin films. The findings of this current work could pave the way for fabrication of high-performance DUV photodetectors.


AIP Advances ◽  
2016 ◽  
Vol 6 (4) ◽  
pp. 045009 ◽  
Author(s):  
L. X. Qian ◽  
X. Z. Liu ◽  
T. Sheng ◽  
W. L. Zhang ◽  
Y. R. Li ◽  
...  

Nano Research ◽  
2018 ◽  
Vol 12 (1) ◽  
pp. 183-189 ◽  
Author(s):  
Ranran Zhuo ◽  
Longhui Zeng ◽  
Huiyu Yuan ◽  
Di Wu ◽  
Yuange Wang ◽  
...  

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