Light Scattering & Complex Optical Components: Modelization and Characterization

Author(s):  
Myriam Zerrad ◽  
Michel Lequime ◽  
Claude Amra
Author(s):  
S. Schröder ◽  
T. Herffurth ◽  
M. Trost ◽  
T. Weigel ◽  
M. Hauptvogel ◽  
...  

Author(s):  
S. Schröder ◽  
M. Hauptvogel ◽  
M. Trost ◽  
A. Costille ◽  
D. Penka ◽  
...  

Author(s):  
Sven Schröder ◽  
Marcus Trost ◽  
Tobias Herffurth ◽  
Matthias Hauptvogel ◽  
Mikhail E. Sachkov ◽  
...  

2014 ◽  
Vol 3 (1) ◽  
Author(s):  
Sven Schröder ◽  
Marcus Trost ◽  
Tobias Herffurth ◽  
Alexander von Finck ◽  
Angela Duparré

AbstractLight scattering of optical components caused by residual imperfections can be a critical factor for their practical application. In particular, the scattering properties of optical interference coatings are rather complex. Yet, simple theoretical models and comparisons with experimental results provide valuable insight into the main impact factors and mechanisms. The magnitude of scattering and the dominating factors strongly depend on the wavelength of application in connection with the types of coatings used in the corresponding ranges. The paper, therefore, gives an overview of the scattering properties of coatings in different spectral regions including the visible, deep ultraviolet, and extreme ultraviolet and discusses strong in-band variations of the scattering characteristics that have been neglected so far.


2015 ◽  
Vol 4 (5-6) ◽  
Author(s):  
Sven Schröder ◽  
Alexander von Finck ◽  
Angela Duparré

AbstractIn every advanced optical system, light scattering caused by the imperfections of optical components sooner or later becomes an issue that needs to be addressed. Light scattering can be a critical factor for both the throughput and the imaging quality of optical systems. On a component level, the quantities to describe these effects are the scatter loss or total scattering (TS) and the scattering distribution function or angle-resolved light scattering (ARS). In the last decades, a number of instruments have been developed worldwide for the measurement of TS and ARS. However, numerous pitfalls have to be avoided to obtain objective, reliable, and reproducible measurement results. This is, in particular, true for low scatter levels of high-end optical components. Standard procedures that have to be both concise and easy to implement are thus of crucial importance for the optics community. This paper tries to give an overview on existing standards as well as an outlook on new standards that are still being developed. Special emphasis is put on ISO standards jointly developed, reviewed, and revised by the international experts in the field.


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