Optical Micro- and Nanometrology VII
Latest Publications

TOTAL DOCUMENTS

34

(FIVE YEARS 0)

H-INDEX

2

(FIVE YEARS 0)

Published By SPIE

9781510618824, 9781510618831

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Front Matter: Volume 10678

Optical Micro- and Nanometrology VII ◽

10.1117/12.2503291 ◽

2018 ◽

Keyword(s):

Matter Volume

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Ultrastable metrology laser at 633 nm using an optical frequency comb

Optical Micro- and Nanometrology VII ◽

10.1117/12.2306907 ◽

2018 ◽

Cited By ~ 2

Author(s):

Paul Köchert ◽

Ulrike Blumröder ◽

Eberhard Manske

Keyword(s):

Frequency Comb ◽

Optical Frequency Comb ◽

Optical Frequency

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Optical challenging feature inline measurement system based on photometric stereo and HON feature extractor

Optical Micro- and Nanometrology VII ◽

10.1117/12.2309891 ◽

2018 ◽

Cited By ~ 1

Author(s):

Huiyu Liu ◽

Yunhui Yan ◽

Kechen Song ◽

Howard Chen

Keyword(s):

Measurement System ◽

Photometric Stereo ◽

Feature Extractor ◽

Inline Measurement

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Holographic characterization and laser structuring of a microphone membrane

Optical Micro- and Nanometrology VII ◽

10.1117/12.2307487 ◽

2018 ◽

Author(s):

Bryan L. Nelsen ◽

Christopher Taudt ◽

Florian Rudek ◽

Peter Hartmann ◽

Paul Jacobs

Keyword(s):

Laser Structuring

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Deriving forces in a single beam gradient force optical tweezers using the angular spectrum method

Optical Micro- and Nanometrology VII ◽

10.1117/12.2307537 ◽

2018 ◽

Author(s):

Qin Yu ◽

Bryan Hennelly ◽

John Healy

Keyword(s):

Optical Tweezers ◽

Angular Spectrum ◽

Gradient Force ◽

Single Beam ◽

Spectrum Method ◽

Angular Spectrum Method

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Perturbation resistant RGB-interferometry with pulsed LED illumination

Optical Micro- and Nanometrology VII ◽

10.1117/12.2306221 ◽

2018 ◽

Cited By ~ 1

Author(s):

Markus Schake ◽

Peter Lehmann

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Lithographic diffraction grating with a period failure

Optical Micro- and Nanometrology VII ◽

10.1117/12.2306811 ◽

2018 ◽

Cited By ~ 2

Author(s):

Maria Shishova ◽

Sergey B. Odinokov ◽

Dmitriy S. Lushnikov ◽

Alexander Y. Zherdev

Keyword(s):

Diffraction Grating

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The original application of hybrid lens in micromeasurements for optical coherence tomography

Optical Micro- and Nanometrology VII ◽

10.1117/12.2317066 ◽

2018 ◽

Author(s):

Dmitrii I. Egorov

Keyword(s):

Optical Coherence Tomography ◽

Optical Coherence ◽

Original Application

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Application of coherence scanning interferometry for local spectral characterization of transparent layers

Optical Micro- and Nanometrology VII ◽

10.1117/12.2314921 ◽

2018 ◽

Author(s):

Rémy Claveau ◽

Paul Montgomery ◽

Manuel Flury

Keyword(s):

Spectral Characterization

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Interferometric measuring systems of nanopositioning and nanomeasuring machines

Optical Micro- and Nanometrology VII ◽

10.1117/12.2318309 ◽

2018 ◽

Author(s):

Tino Hausotte

Keyword(s):

Measuring Systems

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