The mathematical description of an X-ray peak, diffracted from a powder or polycrystalline material, using physically meaningful parameters has been of interest for many years. With the popularity of computers, this need to characterize a diffraction peak has intensified.A key problem which persists is how to describe the instrumental diffracted profile and therefore the observed diffracted characteristic peak with subsequent combinations of Kα doublets and mixed overlapping peaks. Many attempts have been made at finding a “true“ function to fit the observed diffracted peak; however, a practical solution has yet to be found.
Experimental evaluation of OFDM-PWM-based X-ray communication system